{"title":"UNCERTAINTY-AWARE ROOM-TEMPERATURE PROFILE ESTIMATION USING ORDINARY KRIGING","authors":"A. Vedurmudi, K. Janzen, S. Eichstädt","doi":"10.21014/tc6-2022.017","DOIUrl":"https://doi.org/10.21014/tc6-2022.017","url":null,"abstract":"– Information leveraged from multiple sensors is generally more versatile than that from a single sensor. For instance, the value of a physical quantity at an unsampled location can be estimated by interpolating measurements from spatially separated sensors. In this contribution, kriging is used to spatially interpolate room temperatures from a limited number of sensors with different measurement uncertainties and a propagation of the sensor uncertainties to the interpolated values using a Monte Carlo simulation is demonstrated. A potential application of kriging to assess the quality of sensor measurements is also presented.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116635042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Schönhals, Lutz Doering, Benjamin Gloger, Siegfried Hackel, F. Härtig, D. Hutzschenreuter, J. Jagieniak, T. Krah, Jan Loewe, T. Schrader, Gamze Söylev Öktem
{"title":"RECENT ADVANCES OF THE LONG-TERM AVAILABLE DCC SCHEMA VERSION 3","authors":"S. Schönhals, Lutz Doering, Benjamin Gloger, Siegfried Hackel, F. Härtig, D. Hutzschenreuter, J. Jagieniak, T. Krah, Jan Loewe, T. Schrader, Gamze Söylev Öktem","doi":"10.21014/tc6-2022.033","DOIUrl":"https://doi.org/10.21014/tc6-2022.033","url":null,"abstract":"− The aim of this publication is to provide an overview of the recent advances of the XML schema for digital calibration certificates. The motivation and benefits of digital calibration certificates is explained and the basic requirements to which the DCC complies are stated in Section 1. A representative selection of changes is presented and explained in Section 2; and finally, conclusions are drawn, and an outlook on further work is given in Section 3.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"142 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133929726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IMPLEMENTATION OF A SCIENTIFIC METROLOGY CLOUD KERNEL AS A BYPRODUCT OF THE DIGITAL TWINS","authors":"Hugo Gasca Aragon","doi":"10.21014/tc6-2022.015","DOIUrl":"https://doi.org/10.21014/tc6-2022.015","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125563001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}