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Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022最新文献

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FUNDAMENTAL ASPECTS IN DATA ANALYSIS FOR SENSOR NETWORK METROLOGY 传感器网络计量数据分析的基本方面
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.030
S. Eichstädt, A. Vedurmudi, M. Gruber, D. Hutzschenreuter
{"title":"FUNDAMENTAL ASPECTS IN DATA ANALYSIS FOR SENSOR NETWORK METROLOGY","authors":"S. Eichstädt, A. Vedurmudi, M. Gruber, D. Hutzschenreuter","doi":"10.21014/tc6-2022.030","DOIUrl":"https://doi.org/10.21014/tc6-2022.030","url":null,"abstract":"− Sensor networks underpin many developments in digital transformation, with applications ranging from regulated utility networks to low-cost Internet of Things (IoT). The metrological assessment of sensor networks necessitates a fundamental revision of calibration, uncertainty propagation and performance assessment and new approaches for information and data handling regarding the individual sensors and their interactions in the network to allow a systems metrology approach to be established. This contribution summarizes initial findings from three research projects and gives an outlook into future developments.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126011985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
THE DIGITAL NIST: CHALLENGES AND OPPORTUNITIES IN THE DIGITAL TRANSFORMATION OF NIST’S REFERENCE MATERIALS 数字化nist: nist参考资料数字化转型的挑战与机遇
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.031
William Dinis Camara, S. Choquette, Katya Delak, Robert Hanisch, Benjamin Long, Melissa Phillips, Jared M Ragland, Catherine Rimmer
{"title":"THE DIGITAL NIST: CHALLENGES AND OPPORTUNITIES IN THE DIGITAL TRANSFORMATION OF NIST’S REFERENCE MATERIALS","authors":"William Dinis Camara, S. Choquette, Katya Delak, Robert Hanisch, Benjamin Long, Melissa Phillips, Jared M Ragland, Catherine Rimmer","doi":"10.21014/tc6-2022.031","DOIUrl":"https://doi.org/10.21014/tc6-2022.031","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123297189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
UNCERTAINTY CALCULATION-AS-A-SERVICE: AN IIOT APPLICATION FOR AUTOMATED RF POWER SENSOR CALIBRATION 不确定性计算即服务:用于自动射频功率传感器校准的工业物联网应用
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.043
Anil Çetinkaya, M. Cagri Kaya, Erkan Danaci, H. Oguztuzun
{"title":"UNCERTAINTY CALCULATION-AS-A-SERVICE: AN IIOT APPLICATION FOR AUTOMATED RF POWER SENSOR CALIBRATION","authors":"Anil Çetinkaya, M. Cagri Kaya, Erkan Danaci, H. Oguztuzun","doi":"10.21014/tc6-2022.043","DOIUrl":"https://doi.org/10.21014/tc6-2022.043","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"235 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115503368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DEVELOPING AND TESTING DIGITAL CALIBRATION CERTIFICATE IN AN INDUSTRIAL APPLICATION 在工业应用中开发和测试数字校准证书
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.026
Juho Nummiluikki, S. Saxholm, A. Kärkkäinen, Sami Koskinen
{"title":"DEVELOPING AND TESTING DIGITAL CALIBRATION CERTIFICATE IN AN INDUSTRIAL APPLICATION","authors":"Juho Nummiluikki, S. Saxholm, A. Kärkkäinen, Sami Koskinen","doi":"10.21014/tc6-2022.026","DOIUrl":"https://doi.org/10.21014/tc6-2022.026","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122382627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
MEASURING AND COMPUTING MODELS OF CEREBRAL AUTOREGULATION FOR DIGITAL PERSONALIZED MEDICINE 数字化个性化医疗中大脑自动调节的测量与计算模型
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.008
V. I. Antonov, G. Malykhina, V. Semenyutin
{"title":"MEASURING AND COMPUTING MODELS OF CEREBRAL AUTOREGULATION FOR DIGITAL PERSONALIZED MEDICINE","authors":"V. I. Antonov, G. Malykhina, V. Semenyutin","doi":"10.21014/tc6-2022.008","DOIUrl":"https://doi.org/10.21014/tc6-2022.008","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129697813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SMART INFRASTRUCTURE FOR DEVELOPING DIGITAL CALIBRATION CERTIFICATES AT SASO-NMCC 在saso-nmcc开发数字校准证书的智能基础设施
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.044
Khaled Ahmed, A. Alosaimi, Khalid M. Amin
{"title":"SMART INFRASTRUCTURE FOR DEVELOPING DIGITAL CALIBRATION CERTIFICATES AT SASO-NMCC","authors":"Khaled Ahmed, A. Alosaimi, Khalid M. Amin","doi":"10.21014/tc6-2022.044","DOIUrl":"https://doi.org/10.21014/tc6-2022.044","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128788353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
ROLE OF DIGITAL TRANSFORMATION IN METROLOGY FOR INDUSTRIAL GROWTH OF COUNTRY 计量数字化转型对国家工业发展的作用
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.011
A. Varshney, N. Garg, S. Jaiswal, S. Yadav
{"title":"ROLE OF DIGITAL TRANSFORMATION IN METROLOGY FOR INDUSTRIAL GROWTH OF COUNTRY","authors":"A. Varshney, N. Garg, S. Jaiswal, S. Yadav","doi":"10.21014/tc6-2022.011","DOIUrl":"https://doi.org/10.21014/tc6-2022.011","url":null,"abstract":"− The digital transformation has emerged to be a novel concept in recent times with numerous innovative advantages and some associated unpredictable risks like cyber security, data encryption, data storage and secured communication etc. It is a multifaceted and emerging phenomenon that has significant impact and is this essentially required in the industrial sector for taking the advantages of cutting-edge technologies and internet of things so that the machine can communicate with the outer word in real-time mode. The main objective of this paper is to understand and analyze the effects of digital transformation in metrological sector and its relevance and suitability for the industrial and economic growth. There have been various innovative frameworks developed and reported in recent times employing the various novel tools like digital and smart sensing, rapid prototyping, risk analysis and mitigation, real time data analysis, cyber security, cloud development and Internet of Things etc. Machine learning, artificial intelligence and cybersecurity are the main support systems of developing digital transforming capabilities. The key benefits of digital transformation are the sustainable development and economic growth of any manufacturing unit which indirectly related to the improvement in the overall performance of the retail sector. It is thus the need of hour to focus and implement these aspects in developing a national digital quality infrastructure for augmenting the economic and industrial growth of India.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130365418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
DESIGN OF THE DIGITALIZED CONFORMITY ASSESSMENT FOR LABORATORY ACTIVITIES IN INDIVIDUAL CERTIFICATIONS 在个别认证中设计实验室活动的数字化合格评定
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.009
K. Shirono, Naoki Takegawa, Mahbuba Moni, D. Peters
{"title":"DESIGN OF THE DIGITALIZED CONFORMITY ASSESSMENT FOR LABORATORY ACTIVITIES IN INDIVIDUAL CERTIFICATIONS","authors":"K. Shirono, Naoki Takegawa, Mahbuba Moni, D. Peters","doi":"10.21014/tc6-2022.009","DOIUrl":"https://doi.org/10.21014/tc6-2022.009","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126971255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DIGITAL TRANSFORMATION: TOWARDS A CLOUD NATIVE ARCHITECTURE FOR HIGHLY AUTOMATED AND EVENT DRIVEN PROCESSES 数字化转型:面向高度自动化和事件驱动流程的云原生架构
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.021
A. Oppermann, S. Eickelberg, Paul Kruse
{"title":"DIGITAL TRANSFORMATION: TOWARDS A CLOUD NATIVE ARCHITECTURE FOR HIGHLY AUTOMATED AND EVENT DRIVEN PROCESSES","authors":"A. Oppermann, S. Eickelberg, Paul Kruse","doi":"10.21014/tc6-2022.021","DOIUrl":"https://doi.org/10.21014/tc6-2022.021","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124119042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
VERIFICATION OF INDUSTRIAL TEMPERATURE MEASUREMENTS USING A NON-INVASIVE APPROACH 使用非侵入性方法验证工业温度测量
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.041
Jörg Gebhardt, Guruprased Sosale, P. Ackermann
{"title":"VERIFICATION OF INDUSTRIAL TEMPERATURE MEASUREMENTS USING A NON-INVASIVE APPROACH","authors":"Jörg Gebhardt, Guruprased Sosale, P. Ackermann","doi":"10.21014/tc6-2022.041","DOIUrl":"https://doi.org/10.21014/tc6-2022.041","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125759682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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