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Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022最新文献

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THE UNCERTAIN NUMBER: A DATA MODEL FOR MEASUREMENT 不确定数:用于测量的数据模型
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.006
B. D. Hall
{"title":"THE UNCERTAIN NUMBER: A DATA MODEL FOR MEASUREMENT","authors":"B. D. Hall","doi":"10.21014/tc6-2022.006","DOIUrl":"https://doi.org/10.21014/tc6-2022.006","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129881043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
INPUT MANAGEMENT FOR THE DCC DCC的输入管理
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.034
Benjamin Gloger, Lutz Doering, Siegfried Hackel, J. Jagieniak, Gamze Söylev Öktem
{"title":"INPUT MANAGEMENT FOR THE DCC","authors":"Benjamin Gloger, Lutz Doering, Siegfried Hackel, J. Jagieniak, Gamze Söylev Öktem","doi":"10.21014/tc6-2022.034","DOIUrl":"https://doi.org/10.21014/tc6-2022.034","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134230781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
PROVIDING FAIR AND METROLOGICALLY TRACEABLE DATA SETS - A CASE STUDY 提供公平和计量可追溯的数据集-一个案例研究
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.003
T. Dorst, M. Gruber, A. Vedurmudi, D. Hutzschenreuter, S. Eichstädt, A. Schütze
{"title":"PROVIDING FAIR AND METROLOGICALLY TRACEABLE DATA SETS - A CASE STUDY","authors":"T. Dorst, M. Gruber, A. Vedurmudi, D. Hutzschenreuter, S. Eichstädt, A. Schütze","doi":"10.21014/tc6-2022.003","DOIUrl":"https://doi.org/10.21014/tc6-2022.003","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114767490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
THE GENERAL APPROACH OF SENSOR NETWORK 传感器网络的一般方法
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.010
M. Havlíček, Martin Koval, Jiří Tesař
{"title":"THE GENERAL APPROACH OF SENSOR NETWORK","authors":"M. Havlíček, Martin Koval, Jiří Tesař","doi":"10.21014/tc6-2022.010","DOIUrl":"https://doi.org/10.21014/tc6-2022.010","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116053912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
THE DIGITAL NIST: CHALLENGES AND OPPORTUNITIES IN THE DIGITAL TRANSFORMATION OF NIST’S CALIBRATION SERVICES 数字化nist: nist校准服务数字化转型中的挑战与机遇
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.039
Catherine A. Cooksey, J. Fedchak, R. Hanisch, John Quintavalle, M. Moondra, Greg Cala, Damian Lauria, Raymond Plante, Benjamin Long
{"title":"THE DIGITAL NIST: CHALLENGES AND OPPORTUNITIES IN THE DIGITAL TRANSFORMATION OF NIST’S CALIBRATION SERVICES","authors":"Catherine A. Cooksey, J. Fedchak, R. Hanisch, John Quintavalle, M. Moondra, Greg Cala, Damian Lauria, Raymond Plante, Benjamin Long","doi":"10.21014/tc6-2022.039","DOIUrl":"https://doi.org/10.21014/tc6-2022.039","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126797212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AUTOMATED DCC GENERATION USING LABVIEW AND BLOCKCHAIN TECHNOLOGY 使用labview和区块链技术自动生成DCC
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.029
C. Zet, Gabriel-Constantin Dumitriu, C. Fosalau, G. Sârbu
{"title":"AUTOMATED DCC GENERATION USING LABVIEW AND BLOCKCHAIN TECHNOLOGY","authors":"C. Zet, Gabriel-Constantin Dumitriu, C. Fosalau, G. Sârbu","doi":"10.21014/tc6-2022.029","DOIUrl":"https://doi.org/10.21014/tc6-2022.029","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"142 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134444277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DATA QUALITY AND AGGREGATION IN POWER SYSTEM DISTRIBUTED SENSOR NETWORKS 电力系统分布式传感器网络中的数据质量与聚合
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.012
G. Frigo, M. Agustoni, Federico Grasso Toro
{"title":"DATA QUALITY AND AGGREGATION IN POWER SYSTEM DISTRIBUTED SENSOR NETWORKS","authors":"G. Frigo, M. Agustoni, Federico Grasso Toro","doi":"10.21014/tc6-2022.012","DOIUrl":"https://doi.org/10.21014/tc6-2022.012","url":null,"abstract":" In modern power systems, the measurement infrastructure represents the backbone of any monitoring and control application. Indeed, the ever-increasing penetration of renewable energy sources and distributed generation has produced an operating scenario prone to instability and rapid variations. In order to address these challenges, current and voltage phasor measurements are typically acquired at each sensitive network node and then aggregated at local or central level in order to estimate the system state or to take control actions as the opening of a circuit breaker. From a normative point of view, the existing standards focus on the performance compliance of a single sensor, but they do not verify their actual interoperability. In this regard, this paper proposes a minor yet effective amendment to include in the digital format (Ethernet packet) of the measurement result a performance metric to be computed on-line. As proven by the numerical simulations, the proposed metric allows for an improved data aggregation and a more accurate state estimation.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127682384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DIGITAL TWIN CONCEPT FOR FORCE METROLOGY SERVICES 力计服务的数字孪生概念
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.032
O. Baer, C. Giusca, R. Kumme, Andrea Prato, Jonas Sander, Davood Mirian, F. Hauschild
{"title":"DIGITAL TWIN CONCEPT FOR FORCE METROLOGY SERVICES","authors":"O. Baer, C. Giusca, R. Kumme, Andrea Prato, Jonas Sander, Davood Mirian, F. Hauschild","doi":"10.21014/tc6-2022.032","DOIUrl":"https://doi.org/10.21014/tc6-2022.032","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128410726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DIGITAL TRANSFORMATION IN UAE METROLOGY 阿联酋计量的数字化转型
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.007
Maryam Alsenaidi, Samia Mohamed, Abdulla AlBlooshi, Munish Narang, Jon Bartholomew
{"title":"DIGITAL TRANSFORMATION IN UAE METROLOGY","authors":"Maryam Alsenaidi, Samia Mohamed, Abdulla AlBlooshi, Munish Narang, Jon Bartholomew","doi":"10.21014/tc6-2022.007","DOIUrl":"https://doi.org/10.21014/tc6-2022.007","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121814890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
THE QUALITY INFRASTRUCTURE IN THE DIGITAL AGE: BEYOND MACHINE-READABLE DOCUMENTS 数字时代的质量基础设施:超越机器可读文档
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.042
S. Eichstädt, D. Hutzschenreuter, J. Niederhausen, Julia Neumann
{"title":"THE QUALITY INFRASTRUCTURE IN THE DIGITAL AGE: BEYOND MACHINE-READABLE DOCUMENTS","authors":"S. Eichstädt, D. Hutzschenreuter, J. Niederhausen, Julia Neumann","doi":"10.21014/tc6-2022.042","DOIUrl":"https://doi.org/10.21014/tc6-2022.042","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"771 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122624838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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