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Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022最新文献

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IMPLEMENTING AN M-LAYER DATA MODEL 实现m层数据模型
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.018
M. Kuster
{"title":"IMPLEMENTING AN M-LAYER DATA MODEL","authors":"M. Kuster","doi":"10.21014/tc6-2022.018","DOIUrl":"https://doi.org/10.21014/tc6-2022.018","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116360141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SPECIFICATION FOR AUDIT TRAIL IN OIML D31: TOWARD RUNTIME VERIFICATION oil d31中审计跟踪规范:面向运行时验证
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.019
Hirosh Watanabe
{"title":"SPECIFICATION FOR AUDIT TRAIL IN OIML D31: TOWARD RUNTIME VERIFICATION","authors":"Hirosh Watanabe","doi":"10.21014/tc6-2022.019","DOIUrl":"https://doi.org/10.21014/tc6-2022.019","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123250920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
STRATEGY SELECTION FOR DIGITAL TRANSFORMATION IN SME SIZE CALIBRATION LABORATORIES 中小型校准实验室数字化转型的策略选择
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.022
O. Purata-Sifuentes
{"title":"STRATEGY SELECTION FOR DIGITAL TRANSFORMATION IN SME SIZE CALIBRATION LABORATORIES","authors":"O. Purata-Sifuentes","doi":"10.21014/tc6-2022.022","DOIUrl":"https://doi.org/10.21014/tc6-2022.022","url":null,"abstract":"– Keeping pace with the leading countries on the path to digital transformation in metrology is difficult, especially for small or medium size calibration laboratories (other than the national metrology institutes) in less techno-logically developed economies. This work aims to illustrate the use of analogue tools to facilitate the selection of digital transformation strategies to follow or even to create one own one. As an example, the tools used to develop digital calibration certificate issuance are shown. These applications can help improve the comprehension of the pathway to digital transformation in metrology","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121114608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TOOLS FOR A SEARCHABLE AND TRACEABLE CURATED DATABASE 用于可搜索和可跟踪的策划数据库的工具
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.002
F. Brochu, Michael Chrubasik, S. Thomas
{"title":"TOOLS FOR A SEARCHABLE AND TRACEABLE CURATED DATABASE","authors":"F. Brochu, Michael Chrubasik, S. Thomas","doi":"10.21014/tc6-2022.002","DOIUrl":"https://doi.org/10.21014/tc6-2022.002","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125950056","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EXPRESSIVE TYPE SYSTEMS FOR METROLOGY 计量的表达型系统
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.036
Conor McBride, Georgi Nakov, Fredrik Nordvall Forsberg
{"title":"EXPRESSIVE TYPE SYSTEMS FOR METROLOGY","authors":"Conor McBride, Georgi Nakov, Fredrik Nordvall Forsberg","doi":"10.21014/tc6-2022.036","DOIUrl":"https://doi.org/10.21014/tc6-2022.036","url":null,"abstract":"– Modern programming language type systems help programmers write correct software, and the software they intended to write. We show how expressive types can be used to encode dimension and units of measure information, which can be used to avoid dimensional mistakes and guide software construction, and how types can even help to generate code automatically, which eliminates a whole class of bugs.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132681547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FROM DIGITAL DEVICE UNDER TEST TO DIGITAL CALIBRATION CERTIFICATE. CHALLENGES AND SOLUTIONS FOR THE CALIBRATION OF MEASURING INSTRUMENTS AND SENSORS IN THE DIGITAL FUTURE 从被测数字设备到数字校准证书。在数字化的未来，测量仪器和传感器校准的挑战和解决方案
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.020
Martin Nicklich, M. Mende
{"title":"FROM DIGITAL DEVICE UNDER TEST TO DIGITAL CALIBRATION CERTIFICATE. CHALLENGES AND SOLUTIONS FOR THE CALIBRATION OF MEASURING INSTRUMENTS AND SENSORS IN THE DIGITAL FUTURE","authors":"Martin Nicklich, M. Mende","doi":"10.21014/tc6-2022.020","DOIUrl":"https://doi.org/10.21014/tc6-2022.020","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134255068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A HUMAN READABLE FORM OF THE DCC 一种人类可读的DCC形式
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.035
Muhammed-Ali Demir, Moritz Jordan, T. Krah, S. Schönhals, Siegfried Hackel, F. Härtig, T. Schrader, J. Loewe, Lutz Doering, Benjamin Gloger, J. Jagieniak, Gamze Söylev-Öktem
{"title":"A HUMAN READABLE FORM OF THE DCC","authors":"Muhammed-Ali Demir, Moritz Jordan, T. Krah, S. Schönhals, Siegfried Hackel, F. Härtig, T. Schrader, J. Loewe, Lutz Doering, Benjamin Gloger, J. Jagieniak, Gamze Söylev-Öktem","doi":"10.21014/tc6-2022.035","DOIUrl":"https://doi.org/10.21014/tc6-2022.035","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115369854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A METROLOGICAL TEMPERATURE SENSOR NETWORK FOR OPTIMIZING LONG DISTANCE MEASUREMENTS 用于优化长距离测量的计量温度传感器网络
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.013
G. Kok, F. Gugole, Aaron Seymour, R. Koops
{"title":"A METROLOGICAL TEMPERATURE SENSOR NETWORK FOR OPTIMIZING LONG DISTANCE MEASUREMENTS","authors":"G. Kok, F. Gugole, Aaron Seymour, R. Koops","doi":"10.21014/tc6-2022.013","DOIUrl":"https://doi.org/10.21014/tc6-2022.013","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131313039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SEMANTIC INTEROPERABILITY IN METROLOGY THROUGH CONTROLLED VOCABULARY 通过受控词汇的计量语义互操作性
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.027
Julia Neumann
{"title":"SEMANTIC INTEROPERABILITY IN METROLOGY THROUGH CONTROLLED VOCABULARY","authors":"Julia Neumann","doi":"10.21014/tc6-2022.027","DOIUrl":"https://doi.org/10.21014/tc6-2022.027","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122041791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ONTOLOGY-BASED REST-APIS FOR MEASUREMENT TERMINOLOGY: GLOSSARIES AS A SERVICE 用于度量术语的基于本体的rest - api:作为服务的词汇表
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.023
Michael Chrubasik, Chris T.S. Lorch, P. M. Duncan
{"title":"ONTOLOGY-BASED REST-APIS FOR MEASUREMENT TERMINOLOGY: GLOSSARIES AS A SERVICE","authors":"Michael Chrubasik, Chris T.S. Lorch, P. M. Duncan","doi":"10.21014/tc6-2022.023","DOIUrl":"https://doi.org/10.21014/tc6-2022.023","url":null,"abstract":"− Even in today's connected world of measurement, organisations, NMIs and stakeholders across a multitude of disciplines employ their own specialised terminology to convey information relating to measurement, experimentation, and projects. While the terminology used is often governed by existing standards or industry norms, the overlaps between these standards and the breadth and depth of applied language frequently result in confusing terminology landscapes. This introduces significant difficulties for cross-disciplinary and cross-industry collaboration. We present a framework to record semantic information in discipline-specific parlance within a flat glossary-like ontology and make it accessible through a RESTful Application Programming Interface (API). This paper outlines the requirements to enable such operations: from vocabulary generation, transformation to ontology, and final exposure via an API. The methodology was exemplified using a pharmaceutical industry-aligned use case, whereby communication between several pharmaceutical industry partners and academic institutions was facilitated.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127412683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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