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2011 IEEE International Symposium on Electromagnetic Compatibility最新文献

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A novel and cost-effective method to suppress GHz common-mode radiation for slot-crossing differential lines 一种新型的、经济有效的跨槽差分线抑制GHz共模辐射的方法
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038403
Hao-Hsiang Chuang, Tzong-Lin Wu
{"title":"A novel and cost-effective method to suppress GHz common-mode radiation for slot-crossing differential lines","authors":"Hao-Hsiang Chuang, Tzong-Lin Wu","doi":"10.1109/ISEMC.2011.6038403","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038403","url":null,"abstract":"By placing two asymmetrical open-stubs (ground resonators) beside the slot-crossing differential line, the radiated emission induced by common-mode noise is greatly reduced around the interested frequency. According to the proposed equivalent circuit model and the design formulas, these ground resonators can provide a shorting path for the common-mode return current around the resonant frequency and prevent the noise from exciting the antenna-like slotline. Based on the proposed concept, the solution board and the reference board are both fabricated by typical PCB process. The experimental results demonstrate that the normalized total loss of the common-mode is effectively reduced by the connected ground resonators around the designed frequency range. Also, the simulated results indicate that the radiated emission caused by the slot-crossing common-mode noise is greatly reduced more than 5 dB from 2.34 GHz to 3.55 GHz. It is a cost-effective solution to reduce the radiated emission from the slot-crossing common-mode noise around GHz frequency range on high-density package or PCB.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127721449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe 使用实验室制造的低成本电流探头，通过散装去耦电容器测量多个开关电流元件
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038347
L. Li, Jingook Kim, Hanfeng Wang, Songping Wu, Y. Takita, H. Takeuchi, K. Araki, J. Fan
{"title":"Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe","authors":"L. Li, Jingook Kim, Hanfeng Wang, Songping Wu, Y. Takita, H. Takeuchi, K. Araki, J. Fan","doi":"10.1109/ISEMC.2011.6038347","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038347","url":null,"abstract":"This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current. Then, a post data-processing procedure is introduced to separate and obtain the parameters of multiple current components. The results obtained by the proposed method are validated with other approaches.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130477419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Automated dielectric constant and loss tangent characterization using cavity resonators 使用腔谐振器的自动介电常数和损耗正切特性
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038365
P. Pasunoori, A. Engin
{"title":"Automated dielectric constant and loss tangent characterization using cavity resonators","authors":"P. Pasunoori, A. Engin","doi":"10.1109/ISEMC.2011.6038365","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038365","url":null,"abstract":"A simple method for dielectric constant characterization is the full sheet resonance method. In this technique, the dielectric constant is extracted from the resonance frequencies of a parallel-plate waveguide resonator. The standard method cannot be applied to extract the loss tangent. Recently, the full-sheet resonance method has been extended to extract the loss tangent as well. The new method makes use of a new rapid plane solver and resonators with shorted boundaries. The materials properties are extracted by fitting the simulations to measurements. In this paper, we will demonstrate how the fitting process can be automated. In order to extract the dielectric constant and loss tangent, many simulations need to be run to find the parameters that provide the best match with the measurements. This is a computationally expensive approach. We will present a new method based on tracking sensitivity, which provides a parameterized macromodel for the resonators. Using this approach, the simulation data can be expressed as a low-order rational function of the complex permittivity. Hence, varying the complex permittivity to find the best fit can be done in negligible time after the macromodel has been generated. This new method will be applied to extract the dielectric constant and loss tangent of FR-4.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"45 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120924925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Analysis of via impedance variations with a Polynomial Chaos method 用多项式混沌方法分析通孔阻抗变化
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038436
Jianxiang Shen, Hanfeng Wang, Ji Chen, J. Fan
{"title":"Analysis of via impedance variations with a Polynomial Chaos method","authors":"Jianxiang Shen, Hanfeng Wang, Ji Chen, J. Fan","doi":"10.1109/ISEMC.2011.6038436","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038436","url":null,"abstract":"In this paper, we propose a systematic framework for the optimization and analysis of the equivalent characteristic impedance of practical via structures. The framework consists of (a) optimizing via structures for impedance matching using a Genetic algorithm, and (b) numerically characterize, by Polynomial Chaos (PC) method, the sensitivity of the equivalent characteristic impedance to the manufacturing uncertainties in the various geometrical parameters of a via structure. The PC method can be effectively used to compute important statistical information, such as moments, probabilities and sensitivities with respect to the design variables. The PC method is straightforward to implement, and can be orders of magnitude faster than the traditional Monte Carlo (MC) method. The proposed framework naturally leads to a rigorous methodology for EM design/control in the presence of multiple sources of uncertainty.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121186421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Experimental measurement of the response of a twisted-wire pair exposed to a plane-wave field 双绞线对平面波场响应的实验测量
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038423
G. Spadacini, S. Pignari, F. Marliani
{"title":"Experimental measurement of the response of a twisted-wire pair exposed to a plane-wave field","authors":"G. Spadacini, S. Pignari, F. Marliani","doi":"10.1109/ISEMC.2011.6038423","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038423","url":null,"abstract":"A recent work has presented closed-form expressions for the response of a twisted-wire pair (TWP) above ground illuminated by an external plane wave. This work addresses the same topic from an experimental point of view, The proposed setup consists of a TWP terminated with passive networks equipped with radio-frequency detectors. The measurement procedure and its relevant technical issues are discussed. In particular, the following main aspects are covered: (a) generation of a controlled plane-wave electromagnetic field; (b) characterization of the non-ideal behavior of the TWP terminal networks; (c) need to develop a strategy to separate the common-mode (CM) from the differential-mode (DM) induced voltage, (d) sensitivity of the results to unknown/uncontrolled setup parameters. Measurements are compared with the outcome of the aforementioned radiated susceptibility (RS) model with the objective to ascertain model accuracy and to obtain physical insight in the field-to-wire coupling phenomenon.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121408738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Shielding performance of nanostructured transparent thin films loading apertures of metallic enclosures excited by dipole sources 偶极源激励下纳米结构透明薄膜加载金属外壳孔的屏蔽性能
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038312
R. Araneo, G. Lovat, S. Celozzi, M. D'amore
{"title":"Shielding performance of nanostructured transparent thin films loading apertures of metallic enclosures excited by dipole sources","authors":"R. Araneo, G. Lovat, S. Celozzi, M. D'amore","doi":"10.1109/ISEMC.2011.6038312","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038312","url":null,"abstract":"The electromagnetic effects of a nanostructured optically-transparent shield filling a thick aperture in shielding metallic enclosures with internal sources are investigated. The analysis is performed through an efficient Method-of-Moment technique and considers different shielding materials and source/aperture configurations; an effective numerical tool is thus offered for a fast determination of the best thin-film coating configurations. The investigation is also aimed at assessing the field distribution both inside and outside the metallic enclosure and at assessing whether the reduction of the electromagnetic field radiated outside the cavity in the presence of loaded apertures may determine dangerous effects on the interior components.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124444337","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Identification of information leakage spots on a cryptographic device with an RSA processor 用RSA处理器识别密码设备上的信息泄漏点
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038413
O. Meynard, Yu-ichi Hayashi, N. Homma, S. Guilley, J. Danger
{"title":"Identification of information leakage spots on a cryptographic device with an RSA processor","authors":"O. Meynard, Yu-ichi Hayashi, N. Homma, S. Guilley, J. Danger","doi":"10.1109/ISEMC.2011.6038413","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038413","url":null,"abstract":"This paper investigates a relationship between the intensity of EM radiation and that of EM information leakage on a cryptographic device. For this purpose, we first observe an EM-field map on a cryptographic device by an EM scanning system, and then perform simple electromagnetic analysis (SEMA) experiments at some distinct points on the device including over the module. The target device considered here is a Side-channel Attack Standard Evaluation Board (SASEBO) with an RSA hardware implemented in an FPGA. Through the experiment, we demonstrate which points are effective for EM information leakage. The result suggests that the position of greatest EM intensity is not always the most effective point in EM information leakage.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124449185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Fabrics SE measurements in a Reverberation Chamber by an apertured TEM cell and by a small nested Reverberation Chamber 在混响室中使用多孔透射电镜和小型嵌套混响室测量织物的SE
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038398
M. Pocai, I. Dotto, D. Festa
{"title":"Fabrics SE measurements in a Reverberation Chamber by an apertured TEM cell and by a small nested Reverberation Chamber","authors":"M. Pocai, I. Dotto, D. Festa","doi":"10.1109/ISEMC.2011.6038398","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038398","url":null,"abstract":"In this paper the Authors compare three methods to perform Shielding Effectiveness measurements on shielding materials: the Dual Tem Cell method, the apertured TEM cell in Reverberation Chamber (RC) method and the nested RCs method. The aim of the work is to compare the experimental results of the different measurement systems on the same samples of cotton canvas. The criteria adopted to make the comparison are briefly explained and the results achieved are presented. Moreover, the possibility that the tests performed using the nested RCs are “Near Field measurements” are discussed.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124456496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Common mode choke investigation for low pass filter application 低通滤波器应用的共模扼流圈研究
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038308
J. Shafii, H. Chai, R. Gadow
{"title":"Common mode choke investigation for low pass filter application","authors":"J. Shafii, H. Chai, R. Gadow","doi":"10.1109/ISEMC.2011.6038308","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038308","url":null,"abstract":"We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120940023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
On-board decoupling of cryptographic FPGA to improve tolerance to side-channel attacks 加密FPGA板上解耦以提高对侧信道攻击的容忍度
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038441
K. Iokibe, T. Amano, Y. Toyota
{"title":"On-board decoupling of cryptographic FPGA to improve tolerance to side-channel attacks","authors":"K. Iokibe, T. Amano, Y. Toyota","doi":"10.1109/ISEMC.2011.6038441","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038441","url":null,"abstract":"One of PI/EMC design techniques, on-board decoupling, was proved its possibility to be used as a countermeasure against cryptographic side-channel analysis attack. The on-board decoupling was applied to a side-channel attack standard evaluation board (SASEBO-G) involving a cryptographic FPGA that operated an AES-128 encryption process. Two decoupling conditions were examined. Radio frequency (RF) power current was detected with a current probe that was placed on a power cable connected to SASEBO-G for the cryptographic FPGA. Traces of the RF power current were recorded repeatedly with a digital oscilloscope until 30,000 traces were acquired in each decoupling condition. The traces were analyzed statistically by using the correlation power analysis (CPA). Results of CPA show that necessary number of traces to reveal the secret key significantly increased when the RF power current was attenuated by decoupling over the dominant frequency range in spectra of the RF power current. The decoupling technique can be useful as a countermeasure of side-channel analysis attacks to cryptographic modules.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122782268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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