{"title":"低通滤波器应用的共模扼流圈研究","authors":"J. Shafii, H. Chai, R. Gadow","doi":"10.1109/ISEMC.2011.6038308","DOIUrl":null,"url":null,"abstract":"We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Common mode choke investigation for low pass filter application\",\"authors\":\"J. Shafii, H. Chai, R. Gadow\",\"doi\":\"10.1109/ISEMC.2011.6038308\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.\",\"PeriodicalId\":440959,\"journal\":{\"name\":\"2011 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2011.6038308\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2011.6038308","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Common mode choke investigation for low pass filter application
We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.
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