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2011 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Effects of hostile space weather on satellite operations 恶劣空间天气对卫星运行的影响
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038327
D. Baker
{"title":"Effects of hostile space weather on satellite operations","authors":"D. Baker","doi":"10.1109/ISEMC.2011.6038327","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038327","url":null,"abstract":"We present a review of recent evidence for space environmental impacts on satellite operations. We note the effects of cosmic and solar energetic particle radiation as well as the effects of high-energy magnetospheric particles. Statistical as well as case-specific examples of severe oper-ational anomalies are examined. In addition to the obvious impacts of the most extreme space weather episodes, we note that there are important space environmental effects that are more subtle. These have been manifested in the recent (2007-2010) period of remarkable solar quiescence. We conclude with a description of possible space weather in the approaching solar activity maximum period.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116838301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Examining the effect of source type on the accuracy of inverse distance fall-off for radiated EMI measurements 研究辐射源类型对电磁干扰测量中反向距离衰减精度的影响
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038362
J. Maas, S. Connor, D. Hoolihan
{"title":"Examining the effect of source type on the accuracy of inverse distance fall-off for radiated EMI measurements","authors":"J. Maas, S. Connor, D. Hoolihan","doi":"10.1109/ISEMC.2011.6038362","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038362","url":null,"abstract":"Inverse distance fall-off theory is often used to project radiated emission measurements from one distance to another, such as 1, 3, 5 and 10 meters. This commonly-used technique can result in errors of up to 14 dB. Simulations are performed with six different source types to examine the effect of source type on the accuracy and suitability of the inverse distance fall-off technique. Results show that even for simple sources substantial errors can result from using inverse distance fall-off for correlation of measurements made at different test distances and any correction factor would be a very complex function of frequency.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116899169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Practical results of EM cartography on a FPGA-based RSA hardware implementation 基于fpga的RSA硬件实现电磁制图的实际效果
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038412
L. Sauvage, S. Guilley, J. Danger, N. Homma, Y. Hayashi
{"title":"Practical results of EM cartography on a FPGA-based RSA hardware implementation","authors":"L. Sauvage, S. Guilley, J. Danger, N. Homma, Y. Hayashi","doi":"10.1109/ISEMC.2011.6038412","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038412","url":null,"abstract":"Side channel attack is a powerful technique to extracting secret key from cryptographic applications of embedded systems. Best results are obtained by placing a small electromagnetic probe just over areas of an integrated circuit which are leaking the most information. To find such locations, some cartography methods have been proposed in the past, but never used against asymmetric-key cryptosystems. In this paper, we target such cryptosystem, more precisely a FPGA-based RSA hardware implementation. We show that these methods are effective to locate the RSA cryptoprocessor.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117138313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Skin-effect model for time and frequency domain PEEC solver 时域和频域PEEC求解的皮肤效应模型
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038319
G. Antonini, A. Ruehli
{"title":"Skin-effect model for time and frequency domain PEEC solver","authors":"G. Antonini, A. Ruehli","doi":"10.1109/ISEMC.2011.6038319","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038319","url":null,"abstract":"A challenging issue for the solution of large electromagnetic problems is the efficient modeling of the broadband skin-effect for conducting planes and 3D shapes. The inclusion of such models in an EM solver can be very costly in compute time and memory requirements. Progress has recently been made in the design of skin-effect models. Several properties of a model are desirable for the solution of practical problems such as the broadband frequency domain or the time domain applicability. In this paper, we present a new model which meets some of these challenges and which is suitable for the PEEC solution method. In this paper, we consider relatively thin conductors.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125141314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Minimizing the number of basis functions in chip-package co-simulation using lauerre-FDTD 利用lauerre-FDTD最小化芯片封装联合仿真中基函数的数量
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038437
Myunghyun Ha, M. Swaminathan
{"title":"Minimizing the number of basis functions in chip-package co-simulation using lauerre-FDTD","authors":"Myunghyun Ha, M. Swaminathan","doi":"10.1109/ISEMC.2011.6038437","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038437","url":null,"abstract":"Interaction between the chip and package at the system level needs to be predicted in the design process for saving time and cost, which requires chip-package co-simulation. Laguerre-FDTD is an unconditionally stable FDTD scheme which is attractive for chip-package co-simulation since its time-step is not limited by the Courant condition. In Laguerre-FDTD, the transient waveform of the field of interest is represented as the weighted sum of Laguerre basis functions. Therefore, the number of basis functions used in the simulation is directly related to both the simulation run time and the accuracy. Normally, there is a tradeoff between simulation run time and the accuracy. However, this paper proposes a novel solution to minimize the number of basis functions while increasing the accuracy of the output transient waveform of interest. The method for maximizing the efficiency in terms of run time and improving the accuracy of simulation described in this paper is a key step for the automation and practical use of the transient simulation technique using Laguerre polynomials.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126905131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Application of Double Layer Frequency Selective Surface for SMPS shielding 双层频率选择表面在SMPS屏蔽中的应用
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038351
T. R. S. Kumar, C. Venkatesh
{"title":"Application of Double Layer Frequency Selective Surface for SMPS shielding","authors":"T. R. S. Kumar, C. Venkatesh","doi":"10.1109/ISEMC.2011.6038351","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038351","url":null,"abstract":"While designing the metallic enclosure for the electromagnetic shielding of electronic circuits, apertures on the enclosure walls become unavoidable for the purpose of signal cabling and ventilation. The Conventional Enclosure design involves a repeated procedure where the hole position and locations are varied until the Shielding Effectiveness (SE) requirements met. In this paper Double Layer Frequency Selective Surface (DLFSS) is used to construct the walls of the SMPS Enclosure which involves simple procedure. The FSS constructed from Greek Cross type apertures, etched on the conducting walls without any dielectric substrate (to enable ventilation) act as a spatial band-pass filter. Even though the design objective of the EM Shielding Enclosure is all-stop filter characteristics, the ventilation requirement impose the enclosure to allow certain band of EMI to pass. So the DLFSS is designed to pass a band of EMI at 15GHz which is acceptable to satisfy the EMC and ventilation requirements. DLFSS and Conventional SMPS enclosures are modelled and shielding effectiveness is calculated and compared.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122659502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Modeling and analysis of a trace referenced to a meshed ground plane 建模和分析跟踪参考网格地平面
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038298
Songping Wu, Hao Shi, M. Herndon, B. Cornelius, M. Halligan, J. Fan
{"title":"Modeling and analysis of a trace referenced to a meshed ground plane","authors":"Songping Wu, Hao Shi, M. Herndon, B. Cornelius, M. Halligan, J. Fan","doi":"10.1109/ISEMC.2011.6038298","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038298","url":null,"abstract":"Meshed planes are used in today's flexible PCB designs, and due to their non-homogeneous nature, Modeling of nearby interconnects increases in complexity. In this paper, a method to evaluate the effective characteristic impedance of a trace referenced to a meshed plane is proposed that is simpler and optimization based. The effective impedance and the per-unit-length parameters of the line were associated with the meshed plane periodical patterns as well as trace relative locations. A systematic study was performed to reveal the essential relationship between the meshed plane geometric parameters and the trace characteristics.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122670122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Pseudo-balanced signaling using power transmission lines for parallel links 使用电力传输线进行平行链路的伪平衡信令
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038431
S. Huh, M. Swaminathan, D. Keezer
{"title":"Pseudo-balanced signaling using power transmission lines for parallel links","authors":"S. Huh, M. Swaminathan, D. Keezer","doi":"10.1109/ISEMC.2011.6038431","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038431","url":null,"abstract":"Power integrity has become an indispensable part to ensure signal integrity in high-speed systems. Simultaneous switching noise (SSN) in the power delivery network (PDN) is now one of major factors to place the limit on the noise margin for off-chip communication so that a great emphasis is being placed on controlling SSN. A power transmission line (PTL) has been suggested as a new PDN design to achieve near-zero SSN. In this paper, a new signaling scheme is proposed to address the issues associated with the PTL, and yield a significant improvement in signal integrity.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122671881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Analysis and design of GHz power noise isolation using 45° rotated photonic crystal fence 45°旋转光子晶体栅栏对GHz功率噪声隔离的分析与设计
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038399
A. Scogna, A. Orlandi, Tzong-Lin Wu, Ting-Kuang Wang
{"title":"Analysis and design of GHz power noise isolation using 45° rotated photonic crystal fence","authors":"A. Scogna, A. Orlandi, Tzong-Lin Wu, Ting-Kuang Wang","doi":"10.1109/ISEMC.2011.6038399","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038399","url":null,"abstract":"A photonic crystal fence (PCF) is proposed for noise isolation with minimum use of high dielectric constant (DK) rods material. Only three rows of periodic high-DK rods are used in the PCF, but broadband and high efficient noise suppression are retained. It will be shown that a 45° rotated square lattice represents a good compromise in terms of both high-DK material reduction (cost reduction) and noise suppression performance. A design flow for choosing the high-DK rod radius, pitch, and dielectric constant for the PCF is also demonstrated.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122787034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
FPGA core PDN design optimization FPGA核心PDN设计优化
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038346
Zhuyuan Liu, S. Sun, P. Boyle
{"title":"FPGA core PDN design optimization","authors":"Zhuyuan Liu, S. Sun, P. Boyle","doi":"10.1109/ISEMC.2011.6038346","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038346","url":null,"abstract":"This paper analyses and quantifies the impact of numbers of package power and ground balls and on-package decoupling capacitors (OPD) on an FPGA's on-chip core power distribution network (PDN) performance. Measurement methodologies are developed to study the PDN quality in both time domain and frequency domain. The PDN performance is evaluated from three aspects, the PDN noise amplitude, core logic maximum operation frequency, and system clock jitter. The findings help chip designers optimize the PDN design to achieve a cost and performance balance.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128503387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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