Songping Wu, Hao Shi, M. Herndon, B. Cornelius, M. Halligan, J. Fan
{"title":"Modeling and analysis of a trace referenced to a meshed ground plane","authors":"Songping Wu, Hao Shi, M. Herndon, B. Cornelius, M. Halligan, J. Fan","doi":"10.1109/ISEMC.2011.6038298","DOIUrl":null,"url":null,"abstract":"Meshed planes are used in today's flexible PCB designs, and due to their non-homogeneous nature, Modeling of nearby interconnects increases in complexity. In this paper, a method to evaluate the effective characteristic impedance of a trace referenced to a meshed plane is proposed that is simpler and optimization based. The effective impedance and the per-unit-length parameters of the line were associated with the meshed plane periodical patterns as well as trace relative locations. A systematic study was performed to reveal the essential relationship between the meshed plane geometric parameters and the trace characteristics.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2011.6038298","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
Meshed planes are used in today's flexible PCB designs, and due to their non-homogeneous nature, Modeling of nearby interconnects increases in complexity. In this paper, a method to evaluate the effective characteristic impedance of a trace referenced to a meshed plane is proposed that is simpler and optimization based. The effective impedance and the per-unit-length parameters of the line were associated with the meshed plane periodical patterns as well as trace relative locations. A systematic study was performed to reveal the essential relationship between the meshed plane geometric parameters and the trace characteristics.