L. Li, Jingook Kim, Hanfeng Wang, Songping Wu, Y. Takita, H. Takeuchi, K. Araki, J. Fan
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Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe
This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current. Then, a post data-processing procedure is introduced to separate and obtain the parameters of multiple current components. The results obtained by the proposed method are validated with other approaches.
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