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[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference最新文献

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A high resolution time measurement system 一种高分辨率时间测量系统
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161670
Y. Yamaguchi, N. Koyanagi, K. Katano
{"title":"A high resolution time measurement system","authors":"Y. Yamaguchi, N. Koyanagi, K. Katano","doi":"10.1109/IMTC.1991.161670","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161670","url":null,"abstract":"A high-resolution, less than 1-ps, time measurement system (TMS) has been developed using a time-to-voltage (T/V) conversion interpolation technique. In order to accomplish the high-resolution measurement, the authors developed two specific techniques. One is the generation of an accurate interpolation pulse from the measured signal that is realized by the emitter-coupled logic (ECL)-gate-array. The other is the T/V converter which converts the pulse width to the corresponding voltage to thereby measure the pulse width. The T/V converter consists of current switches, and integrated capacitor and a buffer amplifier. The switched current charges the capacitor during the time that the interpolation pulse is on a high level. In this conversion, high-speed and accurate analog circuit design are being used, and therefore a 1-ps time resolution and a less than 10-ps linearity error are obtained. The system is composed of a wideband input amplifier, a 16-b microprocessor and a highly stabilized oscillator. The total RMS jitter using this system is less than 15-ps, and single-shot resolution is less than 1 ps. TMS has many applications, for example, time interval measurement, jitter analysis, measurement of frequency stability, etc.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116821540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Portable system for measuring biomechanical properties 便携式生物力学性能测量系统
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161656
H. Oka, T. Irie, S.Y. Hao, T. Yamamoto
{"title":"Portable system for measuring biomechanical properties","authors":"H. Oka, T. Irie, S.Y. Hao, T. Yamamoto","doi":"10.1109/IMTC.1991.161656","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161656","url":null,"abstract":"A portable system has been developed for measuring biomechanical impedance on the skin surface. The measurement system comprises a measuring probe and a measuring device. The probe is of the pen-type. The device includes a random noise source, amplifiers, an A/D converter, a microcomputer, a liquid crystal display and a floppy disk unit. The biomechanical impedances on the skin surface are measured and the skin viscoelasticity are obtained. SI (stiffness index) is proposed as the new index of skin stiffness. The coefficient of correlation between SI and palpation scores is 0.797.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117347714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On monitoring the condition of turbine flowmeters 汽轮机流量计状态监测研究
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161553
J. Amadi-Echendu, Zhu Hengjun
{"title":"On monitoring the condition of turbine flowmeters","authors":"J. Amadi-Echendu, Zhu Hengjun","doi":"10.1109/IMTC.1991.161553","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161553","url":null,"abstract":"A description is given of how the unconditioned signal from the sensor in a turbine flowmeter can be analyzed to provide a signature of the instrument. This signature is not only additional to the customary information provided by a turbine flowmeter, but it also indicates the condition of the instrument within the process environment. A theoretical model is used to synthesize the basic signal expected from a turbine flowmeter operating under normal and abnormal conditions. The results obtained by analyzing theoretical and practical signals are compared to validate the theoretical model.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117192292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
An electro-optic measurement apparatus for organic media 一种用于有机介质的电光测量装置
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161545
A. Nahata, C. Wu, J. Yardley
{"title":"An electro-optic measurement apparatus for organic media","authors":"A. Nahata, C. Wu, J. Yardley","doi":"10.1109/IMTC.1991.161545","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161545","url":null,"abstract":"An electro-optic characterization apparatus based on an AC modulated Senarmont compensator, which is particularly suited for studying the electro-optic response of thin polymer films, has been developed. The system is capable of measuring the Pockel's effect at a variety of wavelengths with a minimum phase-shift sensitivity of 1 mu rad. Sample to sample variations in the coefficient measurements are less than 15%. A systematic evaluation of thin, poled electro-optic polymer films on coplanar electrodes has been made to demonstrate the usefulness of the apparatus, Corrections are described for the fringing effects of the applied electric field. The reproducibility of the electro-optic data has been verified through an examination of the polymer thickness dependence.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114658468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Using VXIbus-based products for RF test systems 使用基于vxibus的产品进行射频测试系统
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161528
M. Levy
{"title":"Using VXIbus-based products for RF test systems","authors":"M. Levy","doi":"10.1109/IMTC.1991.161528","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161528","url":null,"abstract":"VXIbus has received widespread acceptance as an excellent means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high performance RF and microwave. The special areas of concern relating to RF and microwave issues and how VXIbus products can achieve the necessary performance are discussed. A description is given of the release of an RF chassis and RF prototyping card. These are low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127402618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Instrumentation and measurement for a submillimeter-wave planar diode mixer 亚毫米波平面二极管混频器的仪器与测量
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161563
T. Newman, K. T. Ng
{"title":"Instrumentation and measurement for a submillimeter-wave planar diode mixer","authors":"T. Newman, K. T. Ng","doi":"10.1109/IMTC.1991.161563","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161563","url":null,"abstract":"The design of a planar diode submillimeter-wave mixer is presented in which scale models play an important role. By constructing larger scale models of mixer components the design process is simplified by making component changes easier and by making the measurements easier with the aid of a network analyzer. Separate scale models were used to find: optimum diode geometry; a microstrip low-pass filter; and a wide-bandwidth transition from circular waveguide to shielded microstrip. After combining the results from these measurements to form a mixer circuit model, the combined effect of the various components was studied and adjustments were made to present an optimum impedance to the diode terminals. Tests of the design at 345 GHz confirm the accuracy of the design procedure.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125355930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Utilizing multivariate autoregressive model to reveal internal dependencies in multichannel measurement data 利用多元自回归模型揭示多通道测量数据的内在依赖关系
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161603
R. Suoranta, S. Rantala
{"title":"Utilizing multivariate autoregressive model to reveal internal dependencies in multichannel measurement data","authors":"R. Suoranta, S. Rantala","doi":"10.1109/IMTC.1991.161603","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161603","url":null,"abstract":"A method based on the estimation of the multivariate autoregressive model (MAR-model) is introduced to analyze multichannel data. Because the MAR-model is a black-box model and can describe systems with feedback-loops, it table for the analysis of complex closed-loop multivariate systems. The authors identify the MAR-model and, based on the model, decompose the multichannel spectral matrix. The proposed method offers a new possibility to analyze systems of which there is no exact prior knowledge of internal structures.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121633230","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A low cost HPM receiver 低成本HPM接收器
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161548
R. Dybdal, T. T. Mori, A. M. Castañeda
{"title":"A low cost HPM receiver","authors":"R. Dybdal, T. T. Mori, A. M. Castañeda","doi":"10.1109/IMTC.1991.161548","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161548","url":null,"abstract":"A simple HPM (high power microwave) receiver was developed to monitor the incident power density where sensitive electronics are present and to provide a record of the occurrence of potentially damaging RF exposure. This receiver measures the peak value of the incident field strength over a broad instantaneous bandwidth (1 to 6 GHz), identifies time periods during which threshold field strengths (2, 10, and 50 V/m) are exceeded, provides coverage over a +or-45 degrees field of view, and will detect a single pulse whose duration exceeds 250 ns. The receiver uses a simple design to permit low-cost fabrication. A unique microstrip antenna was developed to fulfil design objectives.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"553 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122604200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reactive power calculations using quadratic phase coupling estimation 无功功率计算采用二次相位耦合估计
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161665
G. A. Girgis
{"title":"Reactive power calculations using quadratic phase coupling estimation","authors":"G. A. Girgis","doi":"10.1109/IMTC.1991.161665","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161665","url":null,"abstract":"A time-domain approach for the calculation of the active, reactive and distortion power components in power systems confronted with the presence of substantial voltage and current distortion as well as measurement noise is presented. This approach uses autocorrelation and third-order cumulants for estimating the power components. The third-order cumulant is defined in terms of its joint moment of order up to 3. The degree of quadratic phase coupling is carried out once the bifrequencies of the power spectra are identified. This analysis is applied to a signal extracted from a linear combination of the voltage, current, and voltampere waveforms. The triples (nf, nf, 2nf) where, n=1,2,. . .,etc., and where n is the harmonic order, are the bifrequencies in the analyzed waveform. This new technique is suitable for use in situations where the following are required: noise filtering in current and voltage waveforms, precise calculations of power components in single-phase or multiphase circuits, and presence of distorted voltage and current waveforms in the network.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123535117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Automated swept-angle bistatic scattering measurements using continuous wave radar 连续波雷达自动扫描角双基地散射测量
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161547
M. Coté
{"title":"Automated swept-angle bistatic scattering measurements using continuous wave radar","authors":"M. Coté","doi":"10.1109/IMTC.1991.161547","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161547","url":null,"abstract":"A description is given of the automated swept-angle bistatic scattering measurement system. The measurement technique is described, and it is shown that it can provide accurate bistatic scattering from near backscatter through forward scatter. The author shows how the measurement error can be estimated using background data collected during each measurement session. The calibration technique is described, and the phase of the calibrating sphere's measured scattered field is shown to give information about the sphere's position relative to the center of rotation of the measurement system. A method for correcting this phase error is given. The capability of the measurement system is demonstrated by examining the e-plane scattering from an aluminum cube with 0.75 wavelength side length, for broadside incidence.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115029479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 35
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