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[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference最新文献

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Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method) 用电磁线圈测量高纯铜电阻率的温度依赖性(SRPM法)
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161578
H. Nakane, T. Watanabe, C. Nagata, S. Fujiwara, S. Yoshizawa
{"title":"Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)","authors":"H. Nakane, T. Watanabe, C. Nagata, S. Fujiwara, S. Yoshizawa","doi":"10.1109/IMTC.1991.161578","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161578","url":null,"abstract":"The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10/sup -12/ Omega -m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121820730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Parameter correlation of impulse shapes using two-port synthesis 使用双端口合成的脉冲形状参数关联
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161587
J. Googe, P. Ewing, R.A. Hess
{"title":"Parameter correlation of impulse shapes using two-port synthesis","authors":"J. Googe, P. Ewing, R.A. Hess","doi":"10.1109/IMTC.1991.161587","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161587","url":null,"abstract":"Equations are derived for determining the time constants of the double exponential impulse from the commonly used parameters for several standard test impulses. A resistor-capacitor (RC) circuit is synthesized that will produce the desired impulse. The prototype network is realized through a computer-aided design (CAD) procedure using Cauer's RC ladder two-port synthesis method. Descriptions of prototype circuits and test data comparing the theoretical and experimental impulse shapes are also included. The results are a simplified method for determining the time constants of a double exponential function from given impulse parameters and a method for deriving the component values for prototype circuits.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124972963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Design concepts of instruments for vector parameter identification 矢量参数识别仪器的设计概念
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161611
M. Min, T. Parve, A. Ronk
{"title":"Design concepts of instruments for vector parameter identification","authors":"M. Min, T. Parve, A. Ronk","doi":"10.1109/IMTC.1991.161611","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161611","url":null,"abstract":"The design concepts for phase-sensitive measuring instruments, which are based on two-phase synchronous detection and known as vector analyzers, are proposed. The main idea of the design is to use the advantages of both analog and digital signal processing methods by combining the synchronous detection and averaging procedures with the integrating analog-to-digital and functional digital-to-analog conversion principles. The reference channel of the vector analyzer is built up on the basis of the adaptive third-order phase-locked loop (PLL).<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128746302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Some theorems on Walsh transforms of quantizer differential and integral nonlinearity 量化微分和积分非线性沃尔什变换的若干定理
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161539
K. Hejn, I. Kale
{"title":"Some theorems on Walsh transforms of quantizer differential and integral nonlinearity","authors":"K. Hejn, I. Kale","doi":"10.1109/IMTC.1991.161539","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161539","url":null,"abstract":"Methods of diagnosing component tolerances of quantizers are derived, based on the assumption of known and available data about a quantizer's nonlinearities. Two of the methods are direct and are based on the Householder orthogonalization, applied to an overdetermined equation system containing data about differential or integral nonlinearities. The remaining two methods are indirect and are based on two theorems which employ the Walsh transformation on the quantizer's differential or integral nonlinearities. The MATLAB language was used to good effect for simulation of these techniques.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"295 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124229096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Experimental determination of stress in magnetic recording thin film disks 磁记录薄膜磁盘应力的实验测定
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161620
S. Howe
{"title":"Experimental determination of stress in magnetic recording thin film disks","authors":"S. Howe","doi":"10.1109/IMTC.1991.161620","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161620","url":null,"abstract":"An experimental program is described to help understand and explain the stress state in Cr and CoCrPt thin films sputtered on ceramic (canasite) substrates. Thin film magnetic recording disk substrates are used with production process equipment. A measurement technique is developed. The effect of Cr thickness and sputter preheat on stress in the Cr layer is determined. Stresses in equal thickness Cr and CoCrPt films on canasite are compared. Repeatability of stress levels in films deposited several weeks apart is examined. Average stress immediately after deposition and after several weeks is determined to look for time-dependent effects. A factorial experiment explores the process space of preheat, Cr thickness, and CoCrPt thickness with average film stress as the output variable. After making several assumptions, stress in the CoCrPt layer is computed from the data, leading to a determination of average CoCrPt stress in the process space. The stress state in the Cr layer is controlled by a reduction in argon sputter pressure to introduce atomic shot peening. An outline for further experimental work is developed.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125222995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sorting biological objects with microwave resonant cavities 用微波谐振腔对生物物体进行分类
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161535
A. Kraszewski, S. Nelson
{"title":"Sorting biological objects with microwave resonant cavities","authors":"A. Kraszewski, S. Nelson","doi":"10.1109/IMTC.1991.161535","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161535","url":null,"abstract":"It is shown how microwave resonators can be used as sensors for sorting dielectric objects. Differences in volume or mass can be distinguished among objects of irregular shape but of uniform dielectric properties. Moisture content, or other permittivity-dependent qualities can also be distinguished independent of mass or volume when objects are of uniform shape. Fundamental principles of the shape-independent and size-independent measurements are discussed, and experimental results are given.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132900080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization 具有可变测试端口阻抗的六端口反射计，适用于非线性微波器件的表征
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161571
F. Ghannouchi, R. Bosisio
{"title":"A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization","authors":"F. Ghannouchi, R. Bosisio","doi":"10.1109/IMTC.1991.161571","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161571","url":null,"abstract":"A description is given of a six-port reflectometer with a variable test port impedance. The six-port junction was specially designed to allow the variation of the test port impedance over almost all of the Smith chart. Such a reflectometer is found suitable for active nonlinear microwave oscillator characterization such as microwave source pull/load pull oscillator measurements, and device line measurements of negative resistance one port terminal devices.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132199046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fast up-date technique for digital oscilloscope 数字示波器的快速更新技术
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161610
S. Matsukura, T. Asaka, Y. Sugihara, N. Tonosaka
{"title":"Fast up-date technique for digital oscilloscope","authors":"S. Matsukura, T. Asaka, Y. Sugihara, N. Tonosaka","doi":"10.1109/IMTC.1991.161610","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161610","url":null,"abstract":"An improved hardware architecture for high-speed data processing with a high-speed update rate of 60 displays/s is described. This technique is applied to a general purpose digital oscilloscope, the DL 1200. An overview is provided of the technique and the new product.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"219 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132262681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measurement of cardiac electric field and current density during defibrillation 除颤过程中心脏电场和电流密度的测量
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161655
O. C. Deale, B. Lerman, S. Gao, K. T. Ng
{"title":"Measurement of cardiac electric field and current density during defibrillation","authors":"O. C. Deale, B. Lerman, S. Gao, K. T. Ng","doi":"10.1109/IMTC.1991.161655","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161655","url":null,"abstract":"To better delineate the mechanisms for defibrillation, work has begun to integrate experimental and numerical analyses of the electric field and current density during defibrillation. Measurement techniques developed are described. A bipolar electrode that eliminates the measurement errors associated with conventional unipolar electrodes is presented. Measurement results are presented together with a finite-element field solver that is useful for the numerical analysis of defibrillation and prediction of field perturbation associated with the bipolar electrodes.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127769283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New capacitive linear and rotary displacement transducers having extremely high both linearity and sensitivity 具有极高线性度和灵敏度的新型电容式线性和旋转位移传感器
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161622
F. Castelli
{"title":"New capacitive linear and rotary displacement transducers having extremely high both linearity and sensitivity","authors":"F. Castelli","doi":"10.1109/IMTC.1991.161622","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161622","url":null,"abstract":"The basic principle adopted in the design of new transducers is illustrated. This principle is based on the adoption of a very thin dielectric film between the electrodes. The film may be obtained either in micrometrical thickness, 1-3 mu m, by a dielectric spray varnish or, as illustrated in the features of an improved design, in submicrometrical, <1 mu m, thickness by metallic dielectric deposition in gas phase. The transducers are designed in a differential form. Their electrodes have to be constructed by photochemical etching. Prototypes of the illustrated transducers have been constructed and the test results obtained on them are analyzed. On the basis of the test results obtained, the proposal for a variable absolute capacitor and capacitive voltage divider is presented.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114545610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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