A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization

Abstract

A description is given of a six-port reflectometer with a variable test port impedance. The six-port junction was specially designed to allow the variation of the test port impedance over almost all of the Smith chart. Such a reflectometer is found suitable for active nonlinear microwave oscillator characterization such as microwave source pull/load pull oscillator measurements, and device line measurements of negative resistance one port terminal devices.<>