H. Nakane, T. Watanabe, C. Nagata, S. Fujiwara, S. Yoshizawa
{"title":"Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)","authors":"H. Nakane, T. Watanabe, C. Nagata, S. Fujiwara, S. Yoshizawa","doi":"10.1109/IMTC.1991.161578","DOIUrl":null,"url":null,"abstract":"The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10/sup -12/ Omega -m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1991.161578","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10/sup -12/ Omega -m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples.<>