Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)

H. Nakane, T. Watanabe, C. Nagata, S. Fujiwara, S. Yoshizawa
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引用次数: 16

Abstract

The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10/sup -12/ Omega -m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples.<>
用电磁线圈测量高纯铜电阻率的温度依赖性(SRPM法)
采用一种利用带圆柱形铜芯的圆形多层螺线管线圈和不带铜芯的相同线圈的阻抗差来估算电阻率的方法(SRPM法)来测量高纯铜的电阻率。结果表明,可以精确测量10/sup -12/ Omega -m的电阻率。在100hz下测得的高纯铜的残余电阻率与直流四探头法测得的值具有良好的相关性。高纯度铜在极低电阻率下存在频率依赖性。随着测量频率的提高,由于样品表面的氧化涂层和污垢,蒙皮深度似乎会影响表面电阻率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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