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[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference最新文献

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Measurement and evaluation of two-phase flow parameters 两相流参数的测量与评价
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161573
Liu Haiqing, Zhou Zequi, Hu Chiying
{"title":"Measurement and evaluation of two-phase flow parameters","authors":"Liu Haiqing, Zhou Zequi, Hu Chiying","doi":"10.1109/IMTC.1991.161573","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161573","url":null,"abstract":"The authors' use of fuzzy theory for identification of two-phase flow patterns and flow imaging based on signals from traditional transducers of flow measurement is briefly summarized. The application of the fuzzy identification theory makes it possible to describe the real flow patterns of two-phase flow more accurately and objectively. The flow pattern judgment is based on an original signal (pressure drop or local conductivity) which is only related with the conditions of fluids in the pipe, and the traditional single-phase transducers are used. This method can thus be used to identify flow patterns, in real-time measurement. Experimental results of online measurement of various distributions of two phases were obtained. Three cases of the real distribution, which correspond to the flow pattern of stratified flow, bubble flow, and slug flow, are shown. The experimental results show that the flow pattern image on a CRT agrees fairly well with the picture obtained using a high-speed camera.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129943677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Measurement of signal parameters by using nonlinear observers 用非线性观测器测量信号参数
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161613
F. Nagy
{"title":"Measurement of signal parameters by using nonlinear observers","authors":"F. Nagy","doi":"10.1109/IMTC.1991.161613","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161613","url":null,"abstract":"A method to design absolutely stable observers for multiple-output time-varying free nonlinear dynamical systems is presented. This method can be used to measure even those signal parameters that are nonlinear functions of the observations. An adaptive Fourier analyzer has been designed by using the proposed method. Simulation and realization results of this observer are provided.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129070222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 36
Measurement and use of dielectric properties of agricultural products 农产品介电性能的测量和使用
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161675
S. Nelson
{"title":"Measurement and use of dielectric properties of agricultural products","authors":"S. Nelson","doi":"10.1109/IMTC.1991.161675","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161675","url":null,"abstract":"The dependence of the dielectric properties of materials on other variables is discussed as it relates to agricultural products. Measurement techniques for determining dielectric properties of such materials are reviewed briefly, and graphical data are presented to illustrate the dependence of dielectric properties of some products on frequency and moisture content. Several agricultural applications are discussed in which dielectric properties information is useful.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129125229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Optimization of the birefringence properties of injection molded substrates for MO media MO介质注射成型基板双折射性能的优化
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161632
R.M. Pisipati, H. Schmid, G. Kapf
{"title":"Optimization of the birefringence properties of injection molded substrates for MO media","authors":"R.M. Pisipati, H. Schmid, G. Kapf","doi":"10.1109/IMTC.1991.161632","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161632","url":null,"abstract":"Consideration is given to the 1991 state of the art in materials used for polymeric substrates for magnetooptic (MO) media. The focus of this work is primarily on polycarbonate and the most significant substrate property confronting the field, namely, birefringence. Other constraints placed by optical storage technology on the substrate material are discussed along with new materials and research activities aimed at circumventing some of the limitations.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130653495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An enhanced time domain approach for dielectric characterization using stripline geometry 带状线几何介质表征的增强时域方法
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161676
K. Fidanboylu, S. Riad, A. Elshabini-Riad
{"title":"An enhanced time domain approach for dielectric characterization using stripline geometry","authors":"K. Fidanboylu, S. Riad, A. Elshabini-Riad","doi":"10.1109/IMTC.1991.161676","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161676","url":null,"abstract":"A time-domain approach for dielectric characterization using a stripline geometry is presented. The technique uses both time-domain reflectometry (TDR) and time-domain transmission (TDT) measurements for determining an optimum frequency-dependent lossy transmission-line model for the stripline under test. The optimization is done in the time domain by comparing the experimental TDR and TDT response waveforms with the simulated ones using a nonlinear least squares fit. The material properties such as the complex permittivity of the dielectric material are determined from the optimum lossy transmission line model. Both simulated and experimental results are presented.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130245986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Both active and reactive power and energy transfer standard 既有有功和无功功率，又有能量传输标准
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161569
F. Castelli
{"title":"Both active and reactive power and energy transfer standard","authors":"F. Castelli","doi":"10.1109/IMTC.1991.161569","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161569","url":null,"abstract":"A prototype of the IRTCTS (infrared thermal converter Watt VAR transfer standard) for active power and energy has been designed and constructed. The general features of the design are illustrated. The adoption of this IRTCTS as an AC-DC voltage comparator and the feature of the design of a transfer standard for reactive power and energy are illustrated. Test results obtained on the prototype prove that the transfer uncertainty is almost inappreciable from DC to 75 kHz and equal to 10 ppm at 200 kHz and that it is not affected by temperature, voltage, current, or power factor.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125445226","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
On the development of a rule based expert system for multichannel spectral estimation 基于规则的多信道频谱估计专家系统的开发
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161627
J. Kulubi, L. van Biesen
{"title":"On the development of a rule based expert system for multichannel spectral estimation","authors":"J. Kulubi, L. van Biesen","doi":"10.1109/IMTC.1991.161627","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161627","url":null,"abstract":"The development of a rule-based expert system for multichannel spectral estimation is presented. Expert system specifications, a knowledge acquisition framework, and the selection of a control architecture are discussed. Three control architectures are described: the metarule architecture, the metaknowledge architecture, and the blackboard architecture.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126371336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Detection and classification of buried dielectric anomalies using a separated aperture sensor and a neural network discriminator 基于分离孔径传感器和神经网络鉴别器的埋藏介质异常检测与分类
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161628
M. Azimi-Sadjadi, David E. Poole, S. Sheedvash, K. Sherbondy, Scott A. Stricker
{"title":"Detection and classification of buried dielectric anomalies using a separated aperture sensor and a neural network discriminator","authors":"M. Azimi-Sadjadi, David E. Poole, S. Sheedvash, K. Sherbondy, Scott A. Stricker","doi":"10.1109/IMTC.1991.161628","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161628","url":null,"abstract":"The problem of detection and classification of buried dielectric anomalies using artificial neural networks was considered. Several methods for training and data representation were developed to study the trainability and generalization capabilities of the networks. The effect of the architectural variation of the network performance was also studied. The principal component method was used to reduce the volume of the data and also the dimension of the weight space. Simulation results on two types of targets were obtained which indicated superior detection and classification performance when compared with the conventional methods.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121043666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
A method of improving the resolution and accuracy of rotary encoders using code compensation technique 一种利用码补偿技术提高旋转编码器分辨率和精度的方法
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161572
N. Hagiwara, Y. Suzuki, H. Murase
{"title":"A method of improving the resolution and accuracy of rotary encoders using code compensation technique","authors":"N. Hagiwara, Y. Suzuki, H. Murase","doi":"10.1109/IMTC.1991.161572","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161572","url":null,"abstract":"A method for improving the resolution and accuracy of incremental type rotary encoders using a phase encoding and code compensation system is described. Applying this system to an optical incremental encoder whose scale pitch is 1/36000, a rotation resolution of 1/920000 and a better than +or-1/300000 rotation (+or-0.0012 degrees ) precision are obtained. The system can also be used for a precise measurement of speed fluctuation.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121824110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 55
Filtering capabilities and convergence of the Van-Cittert deconvolution technique Van-Cittert反卷积技术的滤波能力和收敛性
[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference Pub Date : 1991-05-14 DOI: 10.1109/IMTC.1991.161604
A. Bennia, S. Riad
{"title":"Filtering capabilities and convergence of the Van-Cittert deconvolution technique","authors":"A. Bennia, S. Riad","doi":"10.1109/IMTC.1991.161604","DOIUrl":"https://doi.org/10.1109/IMTC.1991.161604","url":null,"abstract":"The application of the Van-Cittert technique in iterative frequency-domain deconvolution is demonstrated. The technique is shown to have a built-in filtering capability which can successfully be used to produce optimum deconvolution estimates. The Bennia-Riad optimization criterion for iterative deconvolution is used with the Van-Cittert technique to optimize the number of iterations required to achieve acceptable (optimum) deconvolution results. An experimental example is provided to illustrate the application. of the deconvolution technique and the optimization criterion.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122907896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 46
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