{"title":"使用双端口合成的脉冲形状参数关联","authors":"J. Googe, P. Ewing, R.A. Hess","doi":"10.1109/IMTC.1991.161587","DOIUrl":null,"url":null,"abstract":"Equations are derived for determining the time constants of the double exponential impulse from the commonly used parameters for several standard test impulses. A resistor-capacitor (RC) circuit is synthesized that will produce the desired impulse. The prototype network is realized through a computer-aided design (CAD) procedure using Cauer's RC ladder two-port synthesis method. Descriptions of prototype circuits and test data comparing the theoretical and experimental impulse shapes are also included. The results are a simplified method for determining the time constants of a double exponential function from given impulse parameters and a method for deriving the component values for prototype circuits.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Parameter correlation of impulse shapes using two-port synthesis\",\"authors\":\"J. Googe, P. Ewing, R.A. Hess\",\"doi\":\"10.1109/IMTC.1991.161587\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Equations are derived for determining the time constants of the double exponential impulse from the commonly used parameters for several standard test impulses. A resistor-capacitor (RC) circuit is synthesized that will produce the desired impulse. The prototype network is realized through a computer-aided design (CAD) procedure using Cauer's RC ladder two-port synthesis method. Descriptions of prototype circuits and test data comparing the theoretical and experimental impulse shapes are also included. The results are a simplified method for determining the time constants of a double exponential function from given impulse parameters and a method for deriving the component values for prototype circuits.<<ETX>>\",\"PeriodicalId\":439545,\"journal\":{\"name\":\"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1991.161587\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1991.161587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Parameter correlation of impulse shapes using two-port synthesis
Equations are derived for determining the time constants of the double exponential impulse from the commonly used parameters for several standard test impulses. A resistor-capacitor (RC) circuit is synthesized that will produce the desired impulse. The prototype network is realized through a computer-aided design (CAD) procedure using Cauer's RC ladder two-port synthesis method. Descriptions of prototype circuits and test data comparing the theoretical and experimental impulse shapes are also included. The results are a simplified method for determining the time constants of a double exponential function from given impulse parameters and a method for deriving the component values for prototype circuits.<>