{"title":"使用基于vxibus的产品进行射频测试系统","authors":"M. Levy","doi":"10.1109/IMTC.1991.161528","DOIUrl":null,"url":null,"abstract":"VXIbus has received widespread acceptance as an excellent means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high performance RF and microwave. The special areas of concern relating to RF and microwave issues and how VXIbus products can achieve the necessary performance are discussed. A description is given of the release of an RF chassis and RF prototyping card. These are low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using VXIbus-based products for RF test systems\",\"authors\":\"M. Levy\",\"doi\":\"10.1109/IMTC.1991.161528\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"VXIbus has received widespread acceptance as an excellent means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high performance RF and microwave. The special areas of concern relating to RF and microwave issues and how VXIbus products can achieve the necessary performance are discussed. A description is given of the release of an RF chassis and RF prototyping card. These are low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications.<<ETX>>\",\"PeriodicalId\":439545,\"journal\":{\"name\":\"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1991.161528\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1991.161528","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
VXIbus has received widespread acceptance as an excellent means of improving performance and downsizing automatic test and measurement systems. However, there has been some reluctance to adopt it for all applications, particularly high performance RF and microwave. The special areas of concern relating to RF and microwave issues and how VXIbus products can achieve the necessary performance are discussed. A description is given of the release of an RF chassis and RF prototyping card. These are low-noise, highly shielded designs which offer the user a new spectrum of potential VXIbus applications.<>