{"title":"Automated swept-angle bistatic scattering measurements using continuous wave radar","authors":"M. Coté","doi":"10.1109/IMTC.1991.161547","DOIUrl":null,"url":null,"abstract":"A description is given of the automated swept-angle bistatic scattering measurement system. The measurement technique is described, and it is shown that it can provide accurate bistatic scattering from near backscatter through forward scatter. The author shows how the measurement error can be estimated using background data collected during each measurement session. The calibration technique is described, and the phase of the calibrating sphere's measured scattered field is shown to give information about the sphere's position relative to the center of rotation of the measurement system. A method for correcting this phase error is given. The capability of the measurement system is demonstrated by examining the e-plane scattering from an aluminum cube with 0.75 wavelength side length, for broadside incidence.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1991.161547","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 35
Abstract
A description is given of the automated swept-angle bistatic scattering measurement system. The measurement technique is described, and it is shown that it can provide accurate bistatic scattering from near backscatter through forward scatter. The author shows how the measurement error can be estimated using background data collected during each measurement session. The calibration technique is described, and the phase of the calibrating sphere's measured scattered field is shown to give information about the sphere's position relative to the center of rotation of the measurement system. A method for correcting this phase error is given. The capability of the measurement system is demonstrated by examining the e-plane scattering from an aluminum cube with 0.75 wavelength side length, for broadside incidence.<>