Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987最新文献_第2页

Dielectric relaxation behavior of polymer liquid crystals at temperatures up to 220°C 聚合物液晶在220°C温度下的介电弛豫行为

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736552

K. Wiefling, R. Akins, W. Gordon, D. Schuele, C. Andeen

引用次数: 0

Initiation mechanism of electrical tree — chain scission by injected charge and role of oxygen 注入电荷引发电树链断裂机理及氧的作用

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736592

N. Shimizu, K. Uchida, K. Horii

引用次数: 20

Tree growth simulation associated with dielectric breakdown 与介质击穿相关的树木生长模拟

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736594

J. Fukai, N. Sano

{"title":"Tree growth simulation associated with dielectric breakdown","authors":"J. Fukai, N. Sano","doi":"10.1109/CEIDP.1987.7736594","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736594","url":null,"abstract":"In many dielectric failures the final disruption is preceded by the sporadically progressive development of many minute branched channels(i.e., trees or dendrites), and the ultimate failure follows one of these channels. Trees often exhibit a strong tendency to branch into complicated patterns. Treeing, in general, is a weak-link phenomenon [1]. It has been shown that a simple stochastic model naturally leads to characteristic structures of the discharge pattern [2]. The type of tree dealt with in this paper is the one in which the configuration grows rapidly with a single discharge, and consists of a highly conducting gaseous plasma generated by the rapid dissociation of the solid. Tree growth is simulated by a Monte Carlo method based on a probability field associated with the electric potential, similar to that of Reference 2. Tree growth involves two competing factors, stochastic and deterministic. The patterns developed in the simulation depend upon the size of the lattice (the density of mesh points between two parallel electrode surfaces) and the way that the next growth site is selected from the local electric field and a stochastic algorithm. The tip effect and anisotropy due to lattice size are discussed in detail. The results of simulation give an insight into the mechanism of tree growth associated with dielectric breakdown.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124721043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Computer — Aided partial discharge measurements 计算机辅助局部放电测量

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736548

P. Reynolds

{"title":"Computer — Aided partial discharge measurements","authors":"P. Reynolds","doi":"10.1109/CEIDP.1987.7736548","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736548","url":null,"abstract":"An instrument is described which makes computer assisted measurements for the identification of the source and nature of partial discharges which may occur in an insulation system. The instrument accepts pulse count, phase, and voltage magnitude information from a commercially available partial discharge detector of the resonant-coupled type. These signals are then processed for further analysis. This partial discharge analysis information, when received by the personal computer, may be displayed in graphical form of discharges vs. phase, or by histograms of count of pulse heights. The instrument software also includes a partial discharge identification algorithm programmed using the language of an expert system shell. This algorithm, which uses data acquired from the partial discharge test, and further data derived from intermediate calculations together with queries to the operator, will provide additional information about the site and nature of the partial discharges. The expert system has the capability of identifying many types of discharge phenomena. The results obtained with the system may be displayed on a screen or a plotter, to provide hard copy.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127358275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Charging behavior of polyethylene and ionomers 聚乙烯和离聚物的充电行为

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736575

M. Broadhurst, A. Dereggi, G. T. Davis, F. Mopsik

{"title":"Charging behavior of polyethylene and ionomers","authors":"M. Broadhurst, A. Dereggi, G. T. Davis, F. Mopsik","doi":"10.1109/CEIDP.1987.7736575","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736575","url":null,"abstract":"Space charge may lower the breakdown strength of solid insulation by making local electric fields bigger than the applied field. One extensive study[1] of this phenomenon led to a proposal to blend crosslinked polyethylene (XLPE) insulation with an ionomer to reduce space charge build-up. The authors used contact electrification (no applied field) as a measure of the tendency for a polymer to charge under an applied field and found that the XLPE acquired negative charge, the ionomer positive charge and a blend of the two acquired much less net charge than either component. The reverse-polarity breakdown strength of the blend was found to be higher than that of XLPE and this was related to its reduced contact charging. We have extended this work to test the above ideas and proposal for improving the performance of XLPE-insulated cables. In our study we measured electric field distributions in films of polyethylene, ionomers and blends charged by applying 0 to 50 V/μm at temperatures between 20 and 80°C for times up to 100 hours. These electric field measurements show more directly, than do contact charging data, the charging behavior that occurs in the bulk of coaxial DC power cable insulation in service under an applied field.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130816181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

IR photoconductivity of β-CuPc/poly (NVK-BMA) β-CuPc/poly (NVK-BMA)的红外光导性能

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736562

H. Zhang, D. Pan, J. Wen

引用次数: 0

A model for insulation failure by partial discharges 局部放电导致绝缘失效的模型

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736543

I. Sen, V. Prabhashanker

引用次数: 0

Laser excited fluorescence probes to study insulator damage 激光激发荧光探针研究绝缘体损伤

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736607

D. J. Zoledzicwska, E. Menzel, V. K. Agarwal, L. Hatfield

引用次数: 1

A study on partial discharge degradation of polypropylene films 聚丙烯薄膜局部放电降解的研究

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736545

V. Krishnan, R. Nema

引用次数: 1

"Detection, location and characterization of partial discharge sites in extruded dielectric cables" 《挤压介质电缆局部放电部位的检测、定位和表征》

Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736533

M. Mashikian, R. Northrop, R. Bansal, C. Nikias

引用次数: 1