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Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987最新文献

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Comprehensive partial discharge characteristics sensitive to electrode configuration 对电极结构敏感的全面局部放电特性
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736546
T. Okamoto
{"title":"Comprehensive partial discharge characteristics sensitive to electrode configuration","authors":"T. Okamoto","doi":"10.1109/CEIDP.1987.7736546","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736546","url":null,"abstract":"It is very important to find the partial discahrge (PD) characteristics which can be a measure to indicate the void shape or PD electrode configuration in order to develop diagnostic method of high voltage insulation degradation by PD measurement. Conventional PD characteristics are however ineffective to estimate the shape of a void.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130311170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Steady state and transient photoconduction in poly (N-vinylcarbazole) films 聚(n -乙烯基咔唑)薄膜的稳态和瞬态光导
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736563
J. Hu, K. Kao
{"title":"Steady state and transient photoconduction in poly (N-vinylcarbazole) films","authors":"J. Hu, K. Kao","doi":"10.1109/CEIDP.1987.7736563","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736563","url":null,"abstract":"Steady state and transient photoconduction currents under non-uniform illumination by a series of rectangular light pulses have been measured for poly(N-vinylcarbazole) (PVK) films as functions of applied electric field and photon energy. The results show that the carriers photogenerated in the bulk or photo-injected from the metallic electrode are mainly holes, and that the transport is a thermally activated hopping process. The field dependence of the photoconduction current in the visible and infrared regions is attributed to field-assisted photo-injection of holes into the bulk from the metallic electrode by tunneling in a manner similar to the Franz-Keldysh effect.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132379812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thermally stimulated currents in ethylene-propylene rubber with fillers 含填料的乙丙橡胶中的热刺激电流
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736558
K. Kudo, J. Tanaka, D. Damon
{"title":"Thermally stimulated currents in ethylene-propylene rubber with fillers","authors":"K. Kudo, J. Tanaka, D. Damon","doi":"10.1109/CEIDP.1987.7736558","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736558","url":null,"abstract":"EPR polymers with fillers are being used for the insulation of medium and high voltage power cables. Although a great deal of work has been done on the electrical properties of polymers and the intact cable, there seems not to be a systematic study of the electrical properties as a function of the inorganic structural characteristic of the filler. The trapping sites of carriers in the filled polymers has been thought \" to be closely related to the boundary regions between polymer and filler. Recently, several studies have been carried out on the behavior of space charges in composite polymers [1–4]. However very little work has been done on whether fillers affect the electrical properties at other than the interfacial areas. We are, at this time, reporting preliminary data on the study of the electrical properties of fillers with different structures using the TSC technique to measure the space charge characteristic.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131089446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influence of the processing variables on the morphology and dielectric breakdown of the XLPE 工艺参数对XLPE形貌和介电击穿的影响
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736589
J. D. Ambrósio, G. W. Almeida
{"title":"Influence of the processing variables on the morphology and dielectric breakdown of the XLPE","authors":"J. D. Ambrósio, G. W. Almeida","doi":"10.1109/CEIDP.1987.7736589","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736589","url":null,"abstract":"Polymeric materials with good physical properties can be obtained only by new chemical composition, but also by modification of morphology through processing. T. Fukuda, et al [1], and Takahashi, et al [2], demonstrated that dielectric strength increases with the degree crystallinity of XLPE. J.P. Gupta and N.V. Sefton [3] demonstrated that the degree of crystallinity of LDPE increases with pressure, either in compression moulding or in extrusion. This paper is an investigation to verify the influence of processing on morphology and the impulse breakdown strength in XLPE.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125453824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
AC admittance and electrochemical studies of thin insulating films on metal electrodes immersed in electrolyte solutions 电解液溶液中金属电极上绝缘薄膜的交流导纳及电化学研究
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736550
D. Taylor, A. G. Macdonald, A. Solway
{"title":"AC admittance and electrochemical studies of thin insulating films on metal electrodes immersed in electrolyte solutions","authors":"D. Taylor, A. G. Macdonald, A. Solway","doi":"10.1109/CEIDP.1987.7736550","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736550","url":null,"abstract":"The advent of Biotechnology has created a need for novel sensors and for electrodes with specific electrocatalytic properties. One approach to developing such devices is to deposit on an electrode a thin, passive, insulating film containing active molecules for performing the sensing or catalytic operation. The active species will be chosen for its ability to undergo specific chemical or electron transfer reactions. Certain proteins are known to be very specific in their action and the immobilisation of such proteins on electrodes is now receiving much attention.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129407957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influence of temperature-history on the AC breakdown of isotactic polypropylene 温度历史对等规聚丙烯交流击穿的影响
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736587
B. Krishnakumar, R. Gupta, W. Sarjeant, R. Somoano, L. Lowry
{"title":"Influence of temperature-history on the AC breakdown of isotactic polypropylene","authors":"B. Krishnakumar, R. Gupta, W. Sarjeant, R. Somoano, L. Lowry","doi":"10.1109/CEIDP.1987.7736587","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736587","url":null,"abstract":"Isotactic polypropylene is rapidly becoming the dielectric material of choice in most of the high voltage and pulsed power capacitor applications. Polymers lend themselves to a variety of heat treatments resulting in samples possessing a wide range of crystal 1 inities and morphologies. There have not been many studies dealing with the effect of temperature history on the breakdown characteristics of polymers. Most of the existing studies have dealt with the effect of temperature history on the DC or impulse strength of polyethylene [1–3].","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115038946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterization of smoothness via laser profiling of a surface 用激光刻划表面来表征光滑度
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1987-10-01 DOI: 10.1109/CEIDP.1987.7736597
C. L. Flenniken
{"title":"Characterization of smoothness via laser profiling of a surface","authors":"C. L. Flenniken","doi":"10.1109/CEIDP.1987.7736597","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736597","url":null,"abstract":"A number of instruments are in use for the inspection of polyethylene-based insulation products for power cable. The trend towards higher voltages and long-term XLPE cable system reliability emphasizes the importance of not only the insulation materials, but also the semiconductive shields and the perfection of the shield/insulation interface. Protrusions from the semiconductive shields penetrating into the insulation have been observed to initiate tree growth and thereby give premature failures. Consequently, the need to quantitatively evaluate the smoothness of the carbon filled shield material has been recognized. Currently, extruded semicon tapes are manually examined under a strong light or at low magnification for undispersed black or other protrusions on their surface. This technique to evaluate extruded tape smoothness is qualitative and subject to the errors associated with human judgement. To quantify the smoothness characteristics of a semicon extruded tape surface, a laser-light profiling device has been developed to count and size the number of surface imperfections. This instrument permits rapid quantitative analysis of large surface areas of semiconductive tape directly from an extruder with immediate data analysis and presentation. The electrical stress enhancement resulting from these protrusions from the shield into the insulation may then be evaluated by numerical methods.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129853075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new approach to compatibility of magnet wire and varnish using dielectrometry 用介电法测定磁丝与清漆相容性的新方法
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1986-11-01 DOI: 10.1109/CEIDP.1986.7726470
Ge Zhengyan, Chen Daqian, Xu Gong
{"title":"A new approach to compatibility of magnet wire and varnish using dielectrometry","authors":"Ge Zhengyan, Chen Daqian, Xu Gong","doi":"10.1109/CEIDP.1986.7726470","DOIUrl":"https://doi.org/10.1109/CEIDP.1986.7726470","url":null,"abstract":"This paper presents an experimental results which show that the regular pattern of chemical aging process of insulating materials under sealed heating condition can be monitored and characterized by dielectrometry or dielectric analysis with higher degree of sensitivity, efficiency and resolution in comparision with the usual method in which the compatibility is assessed by the drooping characteristic of breakdown voltage according to UL-1446 [1]. It is also found a prediction of new prospect that may be feasible to accelerate the aging test of an insulation system associated with functional factors by dielectrometry.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130071135","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron-spectroscopy study on the cause of higher breakdown strength in ethylene-styrene copolymer 乙烯-苯乙烯共聚物高击穿强度原因的电子能谱研究
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Pub Date : 1900-01-01 DOI: 10.1109/CEIDP.1987.7736608
I. Rácz, Y. Ohki
{"title":"Electron-spectroscopy study on the cause of higher breakdown strength in ethylene-styrene copolymer","authors":"I. Rácz, Y. Ohki","doi":"10.1109/CEIDP.1987.7736608","DOIUrl":"https://doi.org/10.1109/CEIDP.1987.7736608","url":null,"abstract":"It is known that electrons with energies near the ionization potential (referred to as high energy electrons in this paper) play an important role in triggering the damage process in polymeric insulators. High energy electrons break chemical bonds and create free radicals or initiate electron avalanches. However, the detailed process is not fully understood. Contradiction exists between the calculated and the measured carrier mobilities in polymers. The breakdown field of polymers is ca. 10 MVcm−1 and the band gap is ca. 10 eV. This requires an electron mobility of 100 cm2 V−1 s−1 or a mean free path in the order of 10 nm. However, the experimental mobility values are by many orders of magnitude smaller. If the existence of a mean free path in the 10 nm order could be verified, it would prove the existence of high mobility electrons in a breakdown field.","PeriodicalId":433367,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126063269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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