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Partial discharge inception voltage and breakdown voltage of micro cellular resin 微孔树脂局部放电起始电压和击穿电压
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7351985
Naoto Yanaze, M. Kozako, M. Hikita, K. Tomizawa, M. Ohya
{"title":"Partial discharge inception voltage and breakdown voltage of micro cellular resin","authors":"Naoto Yanaze, M. Kozako, M. Hikita, K. Tomizawa, M. Ohya","doi":"10.1109/CEIDP.2015.7351985","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7351985","url":null,"abstract":"This paper deals with partial discharge inception voltage (PDIV) and breakdown voltage (BDV) of novel insulating material including multi micro size cavities to reduce its permittivity and wight as well for insulation performance test of high voltage cable and equipment. PDIV of specimen including multi voids with average diameter of 34 μm decrease with X-ray irradiation. The result suggests that PD would occur in the specimen with average diameter of 34 μm. In addition to BDV and PDIV increases with the decrease of the cavity size.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130716531","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Molecular scale simulation of hole mobility and current densities in amorphous tridecane 非晶三烷中空穴迁移率和电流密度的分子尺度模拟
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7352081
M. Unge, C. Tornkvist, P. Kordt, D. Andrienko
{"title":"Molecular scale simulation of hole mobility and current densities in amorphous tridecane","authors":"M. Unge, C. Tornkvist, P. Kordt, D. Andrienko","doi":"10.1109/CEIDP.2015.7352081","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352081","url":null,"abstract":"The hole mobility of amorphous tridecane (a model of amorphous polyethylene) is simulated using a parameter-free approach which combines density functional theory, molecular dynamics and kinetic Monte Carlo methods. We observe large variations of the current density in the samples, typical to materials with large energetic disorder. The obtained mobility values are of the same order of magnitude as the highest experimentally reported values. By introducing carbonyl groups, we assess the effect of material oxidation and find that the mobility is reduced by an order of magnitude already at moderate concentrations of these groups.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134346162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Dielectric spectroscopy on alumina-epoxy composites towards the quantification of filler-particulate microstructure effects 铝-环氧复合材料的介电光谱对填料-颗粒微观结构影响的定量研究
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7352026
G. X. Glenis, G. Papalabris, T. Argyropoulos, C. Dervos
{"title":"Dielectric spectroscopy on alumina-epoxy composites towards the quantification of filler-particulate microstructure effects","authors":"G. X. Glenis, G. Papalabris, T. Argyropoulos, C. Dervos","doi":"10.1109/CEIDP.2015.7352026","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352026","url":null,"abstract":"Cylindrical ingots of epoxy resin composites containing alumina of various microstructure particulates were prepared and their dielectric properties were investigated by the parallel capacitance method in the frequency range 20 Hz - 1 MHz, as a function of depth below the surface. Nano-porous (90 Å), or non-porous alumina particulates, with sizes varying from 63 to 200 μm, were mixed as composite fillers at various contents (up to 5% wt). Sample-wafers were extracted from the cylindrical ingots to investigate the porosity induced effects on particulate mixing, dispersibility, precipitation, and relate filler concentration to the electrical response observed at various depths. According to the experimental results, the nano-pore induced effects dominate and reduce the effective relative dielectric constant compared to the non-porous alumina, while the dissipation factor values remain unaffected. Finally, the presence of nano-pores in the alumina particulates induces particle stratification effects and the filler particles with increased pore concentrations become stratified within the upper layer of the molded material.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115377462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical aging tests on different kind of insulating systems adopted for induction stator motor 感应定子电机不同绝缘系统的电老化试验
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7352068
F. Guastavino, D. Cordano, E. Torello, G. Secondo
{"title":"Electrical aging tests on different kind of insulating systems adopted for induction stator motor","authors":"F. Guastavino, D. Cordano, E. Torello, G. Secondo","doi":"10.1109/CEIDP.2015.7352068","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352068","url":null,"abstract":"The massive adoption of electronic converters to supply induction motors leads to critical problems during the normal operation. One of the most investigated problem is the unexpected early failure of the stator winding insulation. When the motors are supplied by electronic converters, the stator insulating system could be subjected to over-voltages due to resonance and reflection phenomena; if these over-voltages exceed the partial discharge inception voltage, partial discharge activity can incept. The erosion of the enamel used to insulate the stator winding wires, due to the presence of partial discharge activity, leads to the degradation of the dielectric characteristics of the insulating system and in the worst cases, to a total breakdown. This investigation campaign presents the outcome of experimental tests aimed at the investigation of the unipolar pulses voltage waveforms role on the degradation of Type I stator winding insulation systems. Induction motors having different insulating systems have been considered. The stator windings have been realized using conventional or corona resistant enameled wires.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121133064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electrical breakdown of polypropylene filled with natural clay as nanomaterial 电击穿聚丙烯填充天然粘土作为纳米材料
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7351994
H. Hiziroglu, I. Shkolnik
{"title":"Electrical breakdown of polypropylene filled with natural clay as nanomaterial","authors":"H. Hiziroglu, I. Shkolnik","doi":"10.1109/CEIDP.2015.7351994","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7351994","url":null,"abstract":"This study presents the breakdown behavior of polypropylene filled with a various concentrations of nano-size natural clay. The concentrations of natural clay by weight were 0 %, 2 %and 6 % in polypropylene. For different concentrations of natural clay each specimen was subjected to a sinusoidal voltage waveform at power frequency with a certain ramp rate to a level where a breakdown occurred. The rms voltage at the breakdown was considered as the breakdown voltage of the sample. The mean dielectric strength improved about 3.5 % for the nanocomposite with 2 % of natural clay concentration in the host polypropylene. However, the improvement on the mean dielectric strength of the nanocomposite with 6 %concentration of natural clay appeared to be little more than 1 % when compared with 2 % concentration of natural clay in the host. This implies that there exits an optimum concentration of nanosize natural clay in polypropylene. Also observed was the increase of the dielectric strength of the materials with the increase of the ramp rate of the applied voltage.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124811679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
DC field distribution around an HVDC cable termination 高压直流电缆终端周围的直流场分布
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7352109
B. Kallstrand, D. Borg, L. Walfridsson, K. Johansson, C. Doiron, Fredrik Falth, M. Saltzer
{"title":"DC field distribution around an HVDC cable termination","authors":"B. Kallstrand, D. Borg, L. Walfridsson, K. Johansson, C. Doiron, Fredrik Falth, M. Saltzer","doi":"10.1109/CEIDP.2015.7352109","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352109","url":null,"abstract":"DC field measurements of the electric field around a cable termination have been performed. The field variation along the surface as well as its time development after voltage application is studied. The agreement between measured and simulated results is relatively good, for short times after voltage application. After longer time, deviations from the simulated results occur. Possible reasons for this discrepancy are discussed.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125057891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Space charge distribution measurements in insulating materials of commercially available enameled wire 市售漆包线绝缘材料中空间电荷分布的测量
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7352012
T. Saiki, K. Abe, H. Miyake, Y. Tanaka, T. Maeno
{"title":"Space charge distribution measurements in insulating materials of commercially available enameled wire","authors":"T. Saiki, K. Abe, H. Miyake, Y. Tanaka, T. Maeno","doi":"10.1109/CEIDP.2015.7352012","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352012","url":null,"abstract":"A generation of PD (partial discharge) in motor windings is a significant problem to develop a high voltage driving system, which is expected to improve the motor efficiency. A space charge accumulation in an insulating material of motor windings has been pointed out as one of reasons, for the PD generation because the space charge accumulation sometimes enhances the electric field in an insulating material. Therefore, measurement of the space charge in the insulating layer of motor windings is required. Space charge accumulation characteristics in film shape sample are usually measured using the PEA (pulsed electro-acoustic) method. However, since a manufacturing process of actual windings wire is different from that for film shape sample, the characteristics are assumed to be different from actual one. It means that it is difficult to evaluate the influences of the space charge on the insulating layer of the actual wire from the measurement result of the film shape sample. Therefore, in this research, we tried to measure the space charge distribution in the insulating material of actual enameled wires using an improved PEA measurement system. As a result, it is found that there are different types of space charge accumulation characteristics, even between nominally same insulating materials.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122114427","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Improvement on dielectric properties of CaCu3Ti4O12 ceramics by heat treatment in rich oxygen atmosphere 富氧气氛热处理改善cuu3ti4o12陶瓷介电性能
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-17 DOI: 10.1109/CEIDP.2015.7352002
Xuetong Zhao, Shuai Li, R. Liao, Junyan Zhang, Feipeng Wang, Jianying Li
{"title":"Improvement on dielectric properties of CaCu3Ti4O12 ceramics by heat treatment in rich oxygen atmosphere","authors":"Xuetong Zhao, Shuai Li, R. Liao, Junyan Zhang, Feipeng Wang, Jianying Li","doi":"10.1109/CEIDP.2015.7352002","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352002","url":null,"abstract":"CaCu3Ti4O12 ceramics were synthesized by using the solid-state reaction method, and the roles of the heat treatment on the microstructure and dielectric properties were investigated. It is indicated that no second phase is found after heat treatment. At room temperature, the dielectric constant is decreased slightly and the dielectric loss tangent is effectively suppressed to 0.03-0.04. In the temperature range of 183-273 K, the dielectric loss of CaCu3Ti4O12 ceramics is composed of conductance loss at low frequency and two relaxation loss peaks at high frequency. It is worth noting that the conductance loss at low frequency is reduced apparently by the heat treatment. Furthermore, the results of J-E exhibit that the breakdown field and nonlinear coefficient of CaCu3Ti4O12 ceramics are increased from 226 V/mm and 3.52 to 397 V/mm and 4.51, respectively. The Schottky barrier height of CCTO ceramics is boosted from 0.56 eV to 0.63 eV.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116646911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimation of the number of nucleotides with thymine in deoxyribonucleic acid by far-infrared absorption 用远红外吸收法估计脱氧核糖核酸中胸腺嘧啶核苷酸的数目
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-09 DOI: 10.1109/CEIDP.2015.7351989
Ayano Kitamura, M. Komatsu, Y. Ohki, M. Mizuno, M. Hirabayashi, H. Kojima
{"title":"Estimation of the number of nucleotides with thymine in deoxyribonucleic acid by far-infrared absorption","authors":"Ayano Kitamura, M. Komatsu, Y. Ohki, M. Mizuno, M. Hirabayashi, H. Kojima","doi":"10.1109/CEIDP.2015.7351989","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7351989","url":null,"abstract":"A new research trend that regards deoxyribonucleic acid (DNA) as a new dielectric polymeric material has been emerging in recent years. Especially for such application purposes, a simple easy-to-use method for determining the higher-order structure of synthetic DNA is desirable. From this viewpoint, we demonstrated in this research that far-infrared absorption spectroscopy can be a tool to determine the DNA higher-order structure and we calculated experimentally the integrated molar absorption coefficients per nucleotide with thymine at various frequencies. Therefore, using these coefficients, the number of thymine base on a single stranded DNA can be estimated by far-infrared spectroscopy.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125406396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influence of cable structure on the fault location by frequency domain reflectometry 电缆结构对频域反射法故障定位的影响
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2015-12-09 DOI: 10.1109/CEIDP.2015.7352023
Y. Ohki, N. Hirai
{"title":"Influence of cable structure on the fault location by frequency domain reflectometry","authors":"Y. Ohki, N. Hirai","doi":"10.1109/CEIDP.2015.7352023","DOIUrl":"https://doi.org/10.1109/CEIDP.2015.7352023","url":null,"abstract":"The authors have demonstrated that the estimation of the precise locations of points in cables aged thermally or mechanically or by the irradiation of gamma rays is possible by a combination of frequency domain reflectometry (FDR) and inverse fast Fourier transform (IFFT). This paper examines how this ability of fault location depends on the type and structure of the cable, using several kinds of polymer insulated cables such as triple core cables insulated with flame-retardant ethylene propylene diene copolymer (FR-EPDM), dual core cables insulated with silicone rubber (SiR) or crosslinked polyolefin (XLPO), and coaxial cylindrical cables insulated with low density polyethylene (LDPE). As a result, for cables with lengths of 16 to 72 m, the maximum sensitivity is attained when the highest frequency of the inputted electromagnetic waves is 1.0 GHz or higher for coaxial cables, but around 600 to 800 MHz for dual or triple core cables.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"323 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133449400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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