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Proceedings., Annual Reliability and Maintainability Symposium最新文献

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Qualification of high reliability medical grade batteries 高可靠性医疗级电池的认证
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49626
D. Eberhard, R.C. Stinebring
{"title":"Qualification of high reliability medical grade batteries","authors":"D. Eberhard, R.C. Stinebring","doi":"10.1109/ARMS.1989.49626","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49626","url":null,"abstract":"Pacemakers and other implantable medical devices require a very high degree of reliability. The design and component qualification programs used at the author's company are discussed. Qualification of critical subassemblies, production processes, and product design is examined. The reliability record of lithium/iodine batteries is given as an example of the efficacy of the reliability effort.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116811151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Management method for LSI wafer fabrication facilities 大规模集成电路晶圆制造设备管理方法
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49597
T. Tsuyama, T. Harada, J. Nakazato, K. Kubouchi
{"title":"Management method for LSI wafer fabrication facilities","authors":"T. Tsuyama, T. Harada, J. Nakazato, K. Kubouchi","doi":"10.1109/ARMS.1989.49597","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49597","url":null,"abstract":"A method is described for analyzing factors causing variations in manufacturing facilities in which monitored data that correlate with product quality are collected during routine operation. By using a method of accumulating deviations from the center value of the monitored data and quality data in time sequence, the fluctuation point can be detected, the correlation checked, and the cause of the variation discovered.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"348 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115970552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reliability testing of a software-driven system 软件驱动系统的可靠性测试
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49624
D. Hagist
{"title":"Reliability testing of a software-driven system","authors":"D. Hagist","doi":"10.1109/ARMS.1989.49624","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49624","url":null,"abstract":"An examination is made of the difficulties in reliability testing of a large, integrated hardware/software system, which is driven by the software. The reliability test technique is presented which was developed for the Enhanced Naval Warfare Gaming System and which meets the requirements of MIL-STD-781. A brief overview of this warfare simulation system is given, and this system is used to illustrate some of the considerations that arise in test planning.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"436 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116012747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Probabilistic modeling of solar power systems 太阳能发电系统的概率建模
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49639
F. Safie
{"title":"Probabilistic modeling of solar power systems","authors":"F. Safie","doi":"10.1109/ARMS.1989.49639","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49639","url":null,"abstract":"The author presents a probabilistic approach based on Markov chain theory to model stand-alone photovoltaic power systems and predict their long-term service performance. The major advantage of this approach is that it allows designers and developers of these systems to analyze the system performance as well as the battery subsystem performance in the long run and determine the system design requirements that meet a specified service performance level. The methodology presented is illustrated by using data for a radio repeater system for the Boston, Massachusetts, location.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129244942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 35
Operability and maintainability hazards in communications systems 通信系统的可操作性和可维护性危害
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49630
M. W. Hulet, K. Morehouse
{"title":"Operability and maintainability hazards in communications systems","authors":"M. W. Hulet, K. Morehouse","doi":"10.1109/ARMS.1989.49630","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49630","url":null,"abstract":"A discussion is presented of some industrial applications and lessons learned about hazards in the rapidly advancing communications technology which should be considered. Specific hazard areas revealed by hazards analysis include various electrical hazards, unusual lifting, material handling requirements, inadequate equipment access, inadequate drawing maintenance, and requirements for employees to work alone in hazardous, remote locations. It is demonstrated that these hazards can be controlled to an acceptable level of risk if they are approached seriously by program management using accepted hazards analysis and control procedures. It is shown that decision-making by management in developing technology fields must include a thorough assessment of acceptable risks if the company is to remain competitive.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"184 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129652013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new concept in reliability modeling 可靠性建模中的新概念
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49580
K. Aggarwal
{"title":"A new concept in reliability modeling","authors":"K. Aggarwal","doi":"10.1109/ARMS.1989.49580","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49580","url":null,"abstract":"A concept called criticality is defined and its use in reliability analysis and apportionment is discussed. Criticality of a component is defined as the probability of system failure if that particular component fails. This concept is simple to use and can be integrated into the development of extension of models of classical reliability theory to increase their practical value. It can also be used by those system designers who are applying the notion of graceful degradation in their design.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126171740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
What is a system approach to prediction? 什么是预测的系统方法?
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49623
A. Wild
{"title":"What is a system approach to prediction?","authors":"A. Wild","doi":"10.1109/ARMS.1989.49623","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49623","url":null,"abstract":"It is proposed that the systems approach as formulated in the 1960s should be revived to resolve some of the difficulties in predicting reliability of systems with software. The basics of the approach are reviewed, and peculiarities of software are discussed. It is shown that the main difficulty in predicting reliability of systems incorporating software lies in improper understanding of the nature of software, in the lack of communication between those dealing with hardware and software, and in too much emphasis on 'how' while forgetting 'what' and 'why'.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126296780","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Software maintainability-a new 'ility' 软件可维护性——一种新的“能力”
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49572
D. A. Sunday
{"title":"Software maintainability-a new 'ility'","authors":"D. A. Sunday","doi":"10.1109/ARMS.1989.49572","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49572","url":null,"abstract":"The author addresses the issue of maintainable software and how to evaluate a design for software maintainability. A discussion is presented of software maintainability which includes: software maintainability checklists, software maintainability program plans, software maintainability support concepts, software support plans, and computer resource integrated support data (CRISD) documents.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128395982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Developing an ESS automation tool 开发ESS自动化工具
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49653
W. Garry
{"title":"Developing an ESS automation tool","authors":"W. Garry","doi":"10.1109/ARMS.1989.49653","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49653","url":null,"abstract":"Recent US Department of Defense initiatives have placed greater requirements on equipment manufacturers to deliver hardware which has been debugged to the greatest extent possible. The author addresses the methodology for making the transition from a statement of need, to requirements definition, and finally to the development of a piece of software specially designed to help fulfil the need for delivery of defect-free hardware. He describes the rationale and approach used in developing a computer program to assist in the planning, analysis, and control of environmental stress screening (ESS).<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125678797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Accounting for soft errors in memory reliability prediction 在内存可靠性预测中考虑软误差
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49600
J. E. Miller, H. Hecht, S. Morris
{"title":"Accounting for soft errors in memory reliability prediction","authors":"J. E. Miller, H. Hecht, S. Morris","doi":"10.1109/ARMS.1989.49600","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49600","url":null,"abstract":"Presents a method for quantifying the contribution of uncorrectable soft errors in a scrubbed memory to the prediction of memory reliability. For most analyses involving memory scrubbing, the assumption that all soft errors are scrubbed does not introduce significant error into the predicted reliability calculation. This is true for the basic assumptions made; particularly the assumption of independent events. When correlation between hard failures and soft errors does exist, as in the case of an electrical transient causing permanent cell damage as well as a single event upset, contribution of uncorrectable soft errors must be readdressed.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130009333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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