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Proceedings., Annual Reliability and Maintainability Symposium最新文献

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Software reliability and redundancy optimization 软件可靠性和冗余优化
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49570
D.-H. Chi, H.-H. Lin, W. Kuo
{"title":"Software reliability and redundancy optimization","authors":"D.-H. Chi, H.-H. Lin, W. Kuo","doi":"10.1109/ARMS.1989.49570","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49570","url":null,"abstract":"A procedure for reliability-related quality programming is developed to fill existing gaps in software design and development so that a quality programming plan can be achieved. The authors investigate the tradeoff between system reliability improvement and resource consumption through the management phase. A software reliability-to-cost relation is developed from both a software reliability-related cost model and software redundancy models with common-cause failures. The software reliability optimization problem can be formulated into a mixed-integer programming problem and solved by a branch-and-bound technique.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133952062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
Guidelines for specification development 规范开发指南
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49565
G. Belev
{"title":"Guidelines for specification development","authors":"G. Belev","doi":"10.1109/ARMS.1989.49565","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49565","url":null,"abstract":"The author provides formats and checklists designed to minimize the ambiguity, minimize overall procurement costs and maximize the potential of receiving items, materials or services desired on time, at or under the budgeted costs and in accordance with the specifications. Methodologies such as acquisition streamlining, tiering reviews and value analysis are mentioned to focus attention on which requirements are necessary (represent the actual minimum needs of the engineer) and eliminate those that are not needed or cost effective, while not compromising the performance or negatively impacting quality.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134645221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Acoustic emission testing of composite materials 复合材料声发射测试
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49587
L.A. Duesing
{"title":"Acoustic emission testing of composite materials","authors":"L.A. Duesing","doi":"10.1109/ARMS.1989.49587","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49587","url":null,"abstract":"Acoustic emission (AE) is defined, and the various systems for acoustic emission testing are discussed. Focus is placed on the four types of AE sensors: piezoelectric, electromagnetic, capacitive and optical. Key parameters are discussed to given an insight into the data available during an AE inspection. Calibration of the test equipment is discussed along with AE applications. Factors relating to system selection are outlined.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"260 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115889388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Efficiency of product support 产品支持效率
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49617
G. Benz
{"title":"Efficiency of product support","authors":"G. Benz","doi":"10.1109/ARMS.1989.49617","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49617","url":null,"abstract":"It is shown that a Markov technique can predict the rate of spares failure (stockouts) which prevails for most of the life cycle (after absorption of some initial spares into the spares pipeline). It is also shown that these steady-state failure rates can be combined with standard Markov solutions and arithmetic operations to produce an optimized product-using agency as a function of product support alternatives (quantities of support equipment, spares and support personnel). Reductions in replenishment time through improved training or equipment will also appear in these models. Therefore the efficiency of product support can be evaluated using these techniques. Their use could sharpen the competitive edge of product support services.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122322030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A corollary to: Duane's postulate on reliability growth (avionics) 杜安关于可靠性增长假设的推论(航空电子)
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49594
D. Frank
{"title":"A corollary to: Duane's postulate on reliability growth (avionics)","authors":"D. Frank","doi":"10.1109/ARMS.1989.49594","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49594","url":null,"abstract":"Results are presented of an investigation into reliability characteristics demonstrated by selected avionic equipment over the major portion of their expected service life. It was found that avionics equipment items of various types demonstrate remarkably similar trends of a gradual decline in reliability during prolonged service. The data provide a basis for modification on J.T. Duane's learning curve approach (1964) by extending its applicability to project a reliability profile over an equipment's planned service life. The revised equations are then used to predict changes in equipment reliability and availability, thus providing a capability to more accurately estimate life-cycle support resource requirements and costs.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116618876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Repair actions for self-diagnostic machines 自诊断机器的修复动作
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49574
Z. Papp
{"title":"Repair actions for self-diagnostic machines","authors":"Z. Papp","doi":"10.1109/ARMS.1989.49574","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49574","url":null,"abstract":"The author develops a model to estimate the average number of repair actions (RA) for a system that is divided into two parts: the functional circuits that execute the operations required by the objectives of the system, and a part that performs error detection and diagnostic functions. The breakdown of a functional circuit (FC) generates a repair action but the failure of a maintenance circuit (MC) is only observable through FC failures. On the other hand, MC breakdowns may cause an incorrect diagnosis or fault isolation, and several repair actions may therefore be required to restore the operation of the system. The failures of the circuits come from either defective chips that have not been detected during manufacturing and testing or time-dependent breakdowns of the circuits that occur after the installation of the system. The author shows that similar formulas can be used in both estimations. The expected number of defective (failed) functional chips is inflated by the probability that there might be defective (failed) maintenance circuits in the system.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123505580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sneak circuit analysis automation 电路分析自动化
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49654
F.E. Walker
{"title":"Sneak circuit analysis automation","authors":"F.E. Walker","doi":"10.1109/ARMS.1989.49654","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49654","url":null,"abstract":"Sneak circuit analysis (SCA) is a functional reliability analysis technique with the potential of detecting unintended and thereby undesirable system operation. SCA can prevent unintended operational characteristics in a system when performed during the design phase of project development. Costs of correcting undetected system function continue to escalate through development to the deployment of a fully operational system. Detection of sneak conditions with SCA can prevent costly redesign and testing during the qualification and production phase of a project. The automation of the SCA process with the use of existing computer resources and proven sneak circuit detection techniques is described.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132004647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Survey of available software-safety analysis techniques 现有软件安全分析技术综述
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49571
M. Hansen
{"title":"Survey of available software-safety analysis techniques","authors":"M. Hansen","doi":"10.1109/ARMS.1989.49571","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49571","url":null,"abstract":"A survey is presented of the various software safety analysis techniques and methodologies. The techniques include software fault trees, sneak circuit analysis, nuclear safety cross-check analysis (NSCCA) and Petri nets. The author defines each technique as it applies to software safety and the utility of each model and its applicability based on system complexity.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129686208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
A performance measure for a VHSIC avionic system: mission dependent availability VHSIC航空电子系统的性能度量:任务相关可用性
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49599
S. C. Chay, J. G. Henderson
{"title":"A performance measure for a VHSIC avionic system: mission dependent availability","authors":"S. C. Chay, J. G. Henderson","doi":"10.1109/ARMS.1989.49599","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49599","url":null,"abstract":"A VHSIC (very-high-speed integrated circuit) avionic system is designed to carry out multiple missions, and the determination of whether the system is in the operable state or in the failed state depends on what particular mission the system is to perform at any given moment. Moreover, a VHSIC system contains an important feature, which allows extensive built-in-test capabilities with LRM (line replaceable module) modularity, which in turn gives a reconfiguration capability. For this type of system, the conventional reliability measures are not adequate. The authors introduce a performance and reliability measure, which they call 'mission-dependent availability', to be used for a VHSIC type of system. The measure is used to determine the logistics requirements and also to carry out tradeoff studies involving redundancies, built-in-test capabilities, maintenance actions and the extent of reconfiguration capability.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"528 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124262983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Bellcore system hardware reliability prediction Bellcore系统硬件可靠性预测
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49629
A.L. Black
{"title":"Bellcore system hardware reliability prediction","authors":"A.L. Black","doi":"10.1109/ARMS.1989.49629","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49629","url":null,"abstract":"An overview is given of the Bellcore system hardware reliability prediction process as applied to commercial telecommunications switching systems, with verification testing, and generation of reliability predictions. The 'Reliability performance objectives for LATA (Local Access Transport Area) switching systems' document specifies several reliability measures to be used in the analysis of commercial telecommunications switching systems. The measures are total system downtimes, total system failure rate, partial system downtime, individual line (or trunk) downtime, cutoff call probability, probability of an ineffective machine attempt, and line (or trunk) failure rate.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125466860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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