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Proceedings., Annual Reliability and Maintainability Symposium最新文献

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Motivating the sure bounds 确定界限的激励
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49615
A.L. White
{"title":"Motivating the sure bounds","authors":"A.L. White","doi":"10.1109/ARMS.1989.49615","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49615","url":null,"abstract":"Motivation is provided for a theorem that provides upper and lower bounds for the reliability of configurable digital control systems. The reliability goals for these systems are too high to be established by natural life testing, which means the probability of system failure must be computed from mathematical models that capture the essential elements of fault occurrence and system fault recovery. The upper and lower bound theorem shows that system recovery can be adequately described by its first two moments, provided component failure rate is low and system recovery is fast. This result greatly simplifies both the fault injection experiments that study system recovery and the numerical computations that estimate the probability of system failure from a mathematical model.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126016906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Cost effective vibration testing for automotive electronics 具有成本效益的汽车电子振动测试
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49592
S. Wennberg, C.R. Freyler
{"title":"Cost effective vibration testing for automotive electronics","authors":"S. Wennberg, C.R. Freyler","doi":"10.1109/ARMS.1989.49592","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49592","url":null,"abstract":"The application of a novel random vibration test strategy has been effective in increasing the reliability of a wide range of automotive electronics products. Selecting stress levels greater than the measured mission profile for design qualification testing has the potential to reduce costs by $6000 per test. On one product line this represents a cost savings of $100000 per year. This savings is realized by reducing the shaker time required for qualification testing. The increased stress levels also provide a greater confidence that a product will be reliable in the vehicle.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115633863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fast data generation for front-end system design 快速生成前端系统设计数据
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49551
R. Butler
{"title":"Fast data generation for front-end system design","authors":"R. Butler","doi":"10.1109/ARMS.1989.49551","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49551","url":null,"abstract":"The author addresses the issue of fast data generation for use in front-end analysis. The objective of generating data is to allow the use of the analytical tools required to study system design issues early. By early, the author means before the design has matured enough to produce the required data as a byproduct. The method of generating data described here is called the system design utility (SDU). While it has been given the more general name because it is useful for a range of design issues, it was developed with the reliability data generation problem in mind. SDU provides a means of developing a system's tentative hardware breakdown structure, performing reliability allocation based on a system goal, and adjusting the results according to judgement, experience, or available field data.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114839966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Automatic trend analysis in an on-line condition monitoring device for intermittently operated electromechanical systems 间歇运行机电系统在线状态监测装置的自动趋势分析
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49646
P. Barkan, J. A. Howard
{"title":"Automatic trend analysis in an on-line condition monitoring device for intermittently operated electromechanical systems","authors":"P. Barkan, J. A. Howard","doi":"10.1109/ARMS.1989.49646","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49646","url":null,"abstract":"A description is given of an automated wear and condition monitoring device which is to be permanently mounted on critical, intermittently operated electromechanical systems such as circuit breakers, air compressor systems, or other electrically actuated mechanisms. The monitor should both enhance the reliability of operation of critical systems and extend the intervals between routine maintenance of these systems. It should prove to be particularly valuable in applications involving critical equipment in remote or inaccessible locations.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130167390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Lost opportunities-reliability and maintainability can enhance productivity 失去的机会——可靠性和可维护性可以提高生产率
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49610
O. H. Fedor
{"title":"Lost opportunities-reliability and maintainability can enhance productivity","authors":"O. H. Fedor","doi":"10.1109/ARMS.1989.49610","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49610","url":null,"abstract":"Lost opportunities using reliability practise to improve productivity are discussed. Recommendations are made based on proven techniques and results. The NASA-developed systems assurance analysis (SAA) is presented as a tool to avoid failures and reduce operational risks.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"136 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121633336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Industry initiative to improve maintenance at nuclear power plants 工业界倡议改善核电站的维护
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49637
G. Peterson
{"title":"Industry initiative to improve maintenance at nuclear power plants","authors":"G. Peterson","doi":"10.1109/ARMS.1989.49637","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49637","url":null,"abstract":"The author focuses on highlights of the Institute of Nuclear Power Operations (INPO) evaluation process, industry maintenance initiatives, and industry progress in resolving generic equipment problems, such as motor-operated valves. Also included are some of the emerging maintenance issues facing the nuclear power industry and the present status of some nuclear industry performance indicators.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"228 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132539874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Motivating reliable switching system performance 激励可靠的交换系统性能
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49631
L. Fletcher, D. Burns, W.P. Cochrane
{"title":"Motivating reliable switching system performance","authors":"L. Fletcher, D. Burns, W.P. Cochrane","doi":"10.1109/ARMS.1989.49631","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49631","url":null,"abstract":"The use of reliability performance criteria to motivate the design of reliable local telephone switching systems is discussed. The process of criteria development and the development of reliability performance criteria for switching systems are described. Procedures for switching-system field performance monitoring and failure analysis are defined. These are designed to obtain more meaningful reliability data on in-service switching systems.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"486 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133045968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Maintenance evaluation-a missing link? 维护评估——缺失的一环?
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49636
R. A. Browning
{"title":"Maintenance evaluation-a missing link?","authors":"R. A. Browning","doi":"10.1109/ARMS.1989.49636","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49636","url":null,"abstract":"A discussion is presented of the maintainability/maintenance characteristics of a US Air Force electronic countermeasures (ECM) aircraft pod. The task was threefold: define and analyze the pod failure modes and their maintenance characteristics; determine the methodology and statistics associated with fault selection and recommend how many and which items/modes to fault; and provide a fault consequence analysis and develop fault simulation tools to force specific performance degradations for test purposes, without causing equipment damage or subjecting personnel to safety hazards. The methods used for each of these tasks are described, and the results are presented and assessed.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131967655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Impact of new technology on repair 新技术对维修的影响
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49577
R. E. Neubauer, W.C. Laird
{"title":"Impact of new technology on repair","authors":"R. E. Neubauer, W.C. Laird","doi":"10.1109/ARMS.1989.49577","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49577","url":null,"abstract":"The authors assert that complex integrated circuits will dominate the next generation circuit boards, subsystems, and systems. Visual inspection and similar techniques used in repairing circuit boards in the past cannot be applied to these complex systems; however, design features such as design for testability, built-in-test, and manufacturing processes such as pin-grid-array, surface-mounted, and socketed devices provide capabilities that should render fault isolation, testing, and component replacement less time consuming. These complex circuits are expensive, so that repair of the systems containing these circuits needs to be addressed by industry. The authors propose a repair philosophy is to develop long-range support requirements such as test/diagnostic equipments, training, logistics, and repair procedures for fleet equipment.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133482987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Built-in test strategies for military systems 军事系统内置测试策略
Proceedings., Annual Reliability and Maintainability Symposium Pub Date : 1989-01-24 DOI: 10.1109/ARMS.1989.49575
D.H. Merlino, J. Hadjilogiou
{"title":"Built-in test strategies for military systems","authors":"D.H. Merlino, J. Hadjilogiou","doi":"10.1109/ARMS.1989.49575","DOIUrl":"https://doi.org/10.1109/ARMS.1989.49575","url":null,"abstract":"Using the reliability models from MIL-STD-217E, a builtin test strategy (BIT) is developed. This approach illustrates that the BIT implementation is affected by temperature, environment, part quality level, electronic circuitry and packaging. All of these factors must first be considered as to their effects on the expected failure before embarking on a given BIT design approach. Most notably, failure rate distributions between the device electronics and package pins/interconnects are used in the approach discussed. The analysis compares the expected failure distributions for a typical line replaceable module (LRM) in both a ground benign (Gb) and an aircraft uninhibited fighter (Auf) environment to illustrate the resulting different BIT implementation.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122531392","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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