{"title":"Impact of new technology on repair","authors":"R. E. Neubauer, W.C. Laird","doi":"10.1109/ARMS.1989.49577","DOIUrl":null,"url":null,"abstract":"The authors assert that complex integrated circuits will dominate the next generation circuit boards, subsystems, and systems. Visual inspection and similar techniques used in repairing circuit boards in the past cannot be applied to these complex systems; however, design features such as design for testability, built-in-test, and manufacturing processes such as pin-grid-array, surface-mounted, and socketed devices provide capabilities that should render fault isolation, testing, and component replacement less time consuming. These complex circuits are expensive, so that repair of the systems containing these circuits needs to be addressed by industry. The authors propose a repair philosophy is to develop long-range support requirements such as test/diagnostic equipments, training, logistics, and repair procedures for fleet equipment.<<ETX>>","PeriodicalId":430861,"journal":{"name":"Proceedings., Annual Reliability and Maintainability Symposium","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Annual Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1989.49577","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The authors assert that complex integrated circuits will dominate the next generation circuit boards, subsystems, and systems. Visual inspection and similar techniques used in repairing circuit boards in the past cannot be applied to these complex systems; however, design features such as design for testability, built-in-test, and manufacturing processes such as pin-grid-array, surface-mounted, and socketed devices provide capabilities that should render fault isolation, testing, and component replacement less time consuming. These complex circuits are expensive, so that repair of the systems containing these circuits needs to be addressed by industry. The authors propose a repair philosophy is to develop long-range support requirements such as test/diagnostic equipments, training, logistics, and repair procedures for fleet equipment.<>