{"title":"Calibration of 90° phase difference measured by digital sampling method","authors":"Jian Feng, Leibing Shi, Feng Xu, Yang Pan, Xianlin Pan, Jiangtao Zhang","doi":"10.1109/CPEM.2016.7540645","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540645","url":null,"abstract":"Digital sampling method is widely used in precision electromagnetic measurements based on DFT algorithms. The accuracy of phase difference measured by sampling method influences a lot to power, energy and so on. The active phase shifter is constructed to get stable 90° phase standard. To obtain the error of the phase shifter, two calibration steps are carried out in which a 1:-1 two-stage inductive voltage divider (IVD) is used. The calibration uncertainty for the 90° phase difference is 0.0006°. With the 90° phase standard, phase difference measured by a synchronous sampling digitizer using an improved DFT algorithm is calibrated.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126548561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Kumagai, Y. Irimajiri, S. Nagano, I. Morohashi, A. Kawakami, H. Ito, Y. Hanado, I. Hosako
{"title":"Current status of terahertz frequency metrology at NICT","authors":"M. Kumagai, Y. Irimajiri, S. Nagano, I. Morohashi, A. Kawakami, H. Ito, Y. Hanado, I. Hosako","doi":"10.1109/CPEM.2016.7540722","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540722","url":null,"abstract":"NICT has commenced development of an accurate and stable frequency standard for THz frequency band. We succeeded in phase-locking a single-mode 3THz quantum cascade laser (THz-QCL) to a THz reference. Using the phase-locked THz-QCL and a hot electron bolometer mixer, a THz wave generated by photomixing was evaluated. The result showed that the phase-locked THz-QCL and the optically generated THz wave had the same sability as the microwave references at the 10-15 level and also that imposed noises during heterodyne mixing were negligibly small.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121328513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Calibration of inductive voltage dividers at power frequencies using an AC-PJVS","authors":"J. Hsu, Shih-Fang Chen, Chin-Jung Kuo, M. Hsiao","doi":"10.1109/CPEM.2016.7540635","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540635","url":null,"abstract":"This paper describes a method for the calibration of inductive voltage dividers (IVDs) at power frequencies using an AC-program Josephson voltage standard (AC-PJVS). The IVD is used in the primary ac power standards based on a sampling measuring system. Because the AC-PJVS is operated automatically by a computer program, the measurement procedure is more straightforward than that of conventional step-up methods.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131731426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
P. Abbott, C. Stambaugh, E. Mulhern, E. Benck, Z. Kubarych
{"title":"Comparison of two methods for determining the sorption correction for a vacuum-realized kilogram","authors":"P. Abbott, C. Stambaugh, E. Mulhern, E. Benck, Z. Kubarych","doi":"10.1109/CPEM.2016.7540640","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540640","url":null,"abstract":"The International System of Units (SI) is expected to be revised in 2018, and in this new system, the unit of mass, the kilogram, will be realized in a vacuum environment. In order to transfer the vacuum realization to artifacts in atmospheric pressure air, the effects of the sorption of atmospheric contaminants must either be corrected for or eliminated. NIST has constructed a system that directly compares a mass in vacuum to a mass in air, thereby eliminating the need for sorption correction. We describe the operation of this system and compare results to those obtained from sorption corrections.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"13 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114102682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"10 V transconductance amplifier for the comparison of Josephson standards and thermal converters","authors":"I. Budovsky, L. Palafox","doi":"10.1109/CPEM.2016.7540632","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540632","url":null,"abstract":"This paper presents a further development of a transconductance amplifier for unloading a Josephson waveform synthesizer in quantum-based ac-dc difference measurements on thermal converters. The new amplifier has ultimate dc and low-frequency precision and works at voltages up to 10 V peak. It enables sub-μν/ν ac-dc transfer measurements at frequencies up to 10 kHz.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"191 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123388098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Chuansheng Li, H. Shao, Wei Zhao, Jiafu Wang, Huanghui Zhang
{"title":"Fiber-optic current sensor utilized for DC high current calibration","authors":"Chuansheng Li, H. Shao, Wei Zhao, Jiafu Wang, Huanghui Zhang","doi":"10.1109/CPEM.2016.7540574","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540574","url":null,"abstract":"A fiber-optic current sensor based on the Faraday effect is proposed as a value transfer standard to calibrate the direct high current for the electrowinning industry. The spun high birefringence optical fiber with strong resistance to accumulative bend-birefringence in the case of multi-turns sensing coil is packaged into a sensing element. The closed-loop signal-detecting scheme is utilized to improve the linearity of the sensor over the large dynamic range. The good linearity between the sensor output and current-induced Faraday phase shift is proved experimentally. The sensor achieves accuracy within ±0.1% for the equivalent current between 10 kA and 200 kA.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124132253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mohammad Saif Khan, O. Seron, G. Thuillier, O. Thévenot
{"title":"Development of a programmable small capacitance standard at LNE","authors":"Mohammad Saif Khan, O. Seron, G. Thuillier, O. Thévenot","doi":"10.1109/CPEM.2016.7540611","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540611","url":null,"abstract":"A programmable small capacitance standard consisting of several capacitors connected to a 20 channels multiplexer has been developed at LNE. This programmable standard is capable of producing decadic capacitances from 10 aF to at least 10 fF. This paper presents the first phase of the measurements which were performed in order to evaluate the errors introduced by the stray and cross capacitances.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131141314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. R. de Lima, R. T. de Barros e Vasconcellos, F. A. Silveira
{"title":"Improvements on the design of a four terminal-pair coaxial bridge","authors":"V. R. de Lima, R. T. de Barros e Vasconcellos, F. A. Silveira","doi":"10.1109/CPEM.2016.7540608","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540608","url":null,"abstract":"This paper describes how recent modifications made at the four terminal-pair coaxial bridge (4TCB), in operation at Inmetro, have improved the coaxiality of the bridge, significantly reducing the net current in the coaxial cables, thus reducing both electromagnetic noise and possible systematic errors. This has improved the reliability and repeatability of impedance measurements, and has enabled us to achieve uncertainties as low as parts in 108.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133884974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Identification and correction of artefact in the measurement of pulsed magnetic fields","authors":"G. Crotti, L. Giaccone, D. Giordano","doi":"10.1109/CPEM.2016.7540792","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540792","url":null,"abstract":"AC magnetic flux density meters usually integrate a high pass filter with a very low cut-off frequency (1 Hz-30 Hz) aiming at reducing the effect of slow oscillations. This can distort the actual time domain behaviour of induction waveforms detectable close to industrial or medical devices, even causing artefact high amplitude oscillations. This paper proposes a procedure to identify the filter parameters that accurately reproduce its measured frequency behaviour and suggests an algorithm to correct, in time domain, the field meter recorded waveform.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124038184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development of verification process for on-wafer measurement at millimeter-wave frequency","authors":"R. Sakamaki, M. Horibe","doi":"10.1109/CPEM.2016.7540617","DOIUrl":"https://doi.org/10.1109/CPEM.2016.7540617","url":null,"abstract":"The paper demonstrates useful devices for verification process of on-wafer measurement. Prior to evaluation of the devices, uncertainty analysis was conducted. Positional repeatability of probing was considered as a dominant uncertainty factor in the measurement. Based on the analysis, precise measurement systems with automatic probing system were developed to improve the measurement accuracy by reducing operator-derived error. Consequently, the verification devices were evaluated with lower uncertainty owing to automatic probing. The verification devices provided stable values independent from calibration techniques.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130643153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}