2012 IEEE Computer Society Annual Symposium on VLSI最新文献

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A New Algorithm for Routing-Aware Net Placement in Cross-Referencing Digital Microfluidic Biochips 交叉参考数字微流控生物芯片中路由感知网络布局的新算法
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.33
P. Roy, Rupam Bhattacharjee, H. Rahaman, P. Dasgupta
{"title":"A New Algorithm for Routing-Aware Net Placement in Cross-Referencing Digital Microfluidic Biochips","authors":"P. Roy, Rupam Bhattacharjee, H. Rahaman, P. Dasgupta","doi":"10.1109/ISVLSI.2012.33","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.33","url":null,"abstract":"Digital micro fluidic biochips (DMFB) represent a new generation lab-on-a-chip architecture based upon micromanipulation of droplets via a programmed external electric field by an individually addressable 2D electrode array. DMFBs are classified as: Direct addressing and Cross-referencing biochips. Cross-referencing biochip technology scales down the number of pins per chip drastically, thereby reducing the costs of manufacturing and testing. However, these chips face a serious issue in terms of electrode interference during simultaneous routing of droplets. In this paper, we propose a routing-aware zone-based detailed placement scheme that rearranges the droplet locations on a pre-synthesized Bioassay schematic. The objectives of the proposed scheme include (i) an improved routing in respect of less overall routing time, more cell utilization, less crossover with intelligent collision avoidance, and (ii) enhanced pin sharing overcoming the major issue of electrode interference for Cross-referencing biochips. Simulations are carried out on four test benches of Benchmark suite III, and the results obtained are encouraging.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"600 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115108011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A Temperature and Reliability Oriented Simulation Framework for Multi-core Architectures 面向温度和可靠性的多核体系结构仿真框架
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.22
S. Corbetta, Davide Zoni, W. Fornaciari
{"title":"A Temperature and Reliability Oriented Simulation Framework for Multi-core Architectures","authors":"S. Corbetta, Davide Zoni, W. Fornaciari","doi":"10.1109/ISVLSI.2012.22","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.22","url":null,"abstract":"The increasing complexity of multi-core architectures demands for a comprehensive evaluation of different solutions and alternatives at every stage of the design process, considering different aspects at the same time. Simulation frameworks are attractive tools to fulfil this requirement, due to their flexibility. Nevertheless, state-of-the-art simulation frameworks lack a joint analysis of power, performance, temperature profile and reliability projection at system-level, focusing only on a specific aspect. This paper presents a comprehensive estimation framework that jointly exploits these design metrics at system-level, considering processing cores, interconnect design and storage elements. We describe the framework in details, and provide a set of experiments that highlight its capability and flexibility, focusing on temperature and reliability analysis of multi-core architectures supported by Network-on-Chip interconnect.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"550 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120876454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
Formal Estimation of Worst-Case Communication Latency in a Network-on-Chip 片上网络中最坏情况通信延迟的形式化估计
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.31
V. Palaniveloo, A. Sowmya
{"title":"Formal Estimation of Worst-Case Communication Latency in a Network-on-Chip","authors":"V. Palaniveloo, A. Sowmya","doi":"10.1109/ISVLSI.2012.31","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.31","url":null,"abstract":"Network on a Chip (NoC) is an on-chip communication infrastructure implemented using routers similar to a computer network. NoC is used to design complex systems-on-chip (SoCs) for applications that expect quality-of-service(QoS) guarantee, which depends on the application traffic characteristics, timing constraints, NoC router architecture and communication paradigm. There are several QoS metrics such as data-integrity, latency and throughput, however, in this paper we measure latency upper bound (i.e., worst-case communication latency) as it provides insight on QoS guarantee of the system. We present a formal framework for evaluating worst-case end-to-end latency of packets in an on-chip network, which is obtained by systematic abstraction of an earlier formal modeling and verification framework to verify large NoC designs. Worst case communication latencies of the packets are measured for uniform traffic scenarios at different uniform packet injection rates.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128533982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Compilation Accelerator on Silicon 基于硅的编译加速器
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.76
N. Venkateswaran, V. Srinivasan, R. Kannan, P. Thinakaran, R. Hariharan, B. Vasudevan, N. Nachiappan, Karthikeyan P. Saravanan, Aswinkumar Sridharan, Vigneshwaran Sankaran, Vignesh Adhinarayanan, V. Vignesh, Ravindhiran Mukundrajan
{"title":"Compilation Accelerator on Silicon","authors":"N. Venkateswaran, V. Srinivasan, R. Kannan, P. Thinakaran, R. Hariharan, B. Vasudevan, N. Nachiappan, Karthikeyan P. Saravanan, Aswinkumar Sridharan, Vigneshwaran Sankaran, Vignesh Adhinarayanan, V. Vignesh, Ravindhiran Mukundrajan","doi":"10.1109/ISVLSI.2012.76","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.76","url":null,"abstract":"Current day processors utilize a complex and finely tuned system software to map applications across their cores and extract optimal performance. However with increasing core counts and the rise of heterogeneity among cores, tremendous stress will be exerted on the software stack leading to bottlenecks and underutilization of resources. We propose an architecture for a Compilation Accelerator on Silicon (CAS) coupled with a hardware instruction scheduler to tackle the complexity involved in analyzing dependencies among instructions dynamically, accelerate machine code generation and obtain optimum resource utilization across the cores by effective and efficient scheduling. The CAS is realized as a two-level hierarchical subsystem employing the Primary Compiler on Silicon (PCOS) and Secondary Compiler on Silicon (SCOS) with the hardware instruction scheduler as an integral part of it. A comparative analysis with the conventional GCC compiler is presented for a real world brain modeling application and higher instruction generation rates along with improved scheduling efficiency is observed resulting in a corresponding increase in resource utilization.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128221184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Parametric Hierarchy Recovery in Layout Extracted Netlists 布局提取网表中的参数层次恢复
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.18
John Lee, Puneet Gupta, F. Pikus
{"title":"Parametric Hierarchy Recovery in Layout Extracted Netlists","authors":"John Lee, Puneet Gupta, F. Pikus","doi":"10.1109/ISVLSI.2012.18","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.18","url":null,"abstract":"Modern IC design flows depend on hierarchy to manage the complexity of large-scale designs, however, due to the increased impact of long-range layout context on device behavior, extraction tools flatten these designs. As a result, in post-layout extraction, the hierarchy is lost and the designs are flattened, increasing both the size of the design database, and the amount of runtime that is needed to process these designs. In this paper, the idea of parametric hierarchy recovery is proposed that takes net lists extracted from the design layout, and recovers their hierarchical structure while preserving parametric accuracy. This decreases the size of the netlist and enables the use of hierarchical comparison methods and analysis. Our experiments show that in physical verification this method leads to a 70% reduction in runtime on average without any parametric error. Furthermore, this method can be used to provide tractable timing and power analysis that utilizes detailed transistor information in the presence of systematic layout-dependent variation.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126233766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Dataflow Framework for DSP Algorithm Refinement 一种DSP算法优化的数据流框架
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.74
Youngsoo Kim, W. Alexander, W. Edmonson
{"title":"A Dataflow Framework for DSP Algorithm Refinement","authors":"Youngsoo Kim, W. Alexander, W. Edmonson","doi":"10.1109/ISVLSI.2012.74","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.74","url":null,"abstract":"Current video compression algorithms are increasingly complicated and difficult to analyze and profile. Design tools and system level languages often prove to be inefficient and incapable of providing complexity analysis as a first step directed toward at the implementation of video compression algorithms. This paper proposes framework that will help to develop a methodology that facilitates the derivation of analytical dataflow models. The framework proposes dataflow models for quantifying the underlying algorithm's memory complexity, related timing considerations, and verification of the correctness of the video compression algorithm.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126574153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Instruction Set Architecture Extensions for a Dynamic Task Scheduling Unit 动态任务调度单元的指令集体系结构扩展
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.51
Oliver Arnold, Benedikt Noethen, G. Fettweis
{"title":"Instruction Set Architecture Extensions for a Dynamic Task Scheduling Unit","authors":"Oliver Arnold, Benedikt Noethen, G. Fettweis","doi":"10.1109/ISVLSI.2012.51","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.51","url":null,"abstract":"In this paper a heterogeneous Multiprocessor System on-Chip (MPSoC) is controlled by a dynamic task scheduling unit called Core Manager. The instruction set architecture of this unit is extended to improve performance for dynamic data dependency checking, task scheduling, processing element (PE) allocation and data transfer management. In order to analyze and compare different implementations and trade-offs a tool flow was developed. Area and timing results are provided as well. A significant performance improvement can be shown for all parts of the Core Manager.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122208639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Variance Optimization of CMOS OpAmp Performances Using Experimental Design Approach 基于实验设计方法的CMOS运放性能方差优化
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.38
Arnab Khawas, S. Mukhopadhyay
{"title":"Variance Optimization of CMOS OpAmp Performances Using Experimental Design Approach","authors":"Arnab Khawas, S. Mukhopadhyay","doi":"10.1109/ISVLSI.2012.38","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.38","url":null,"abstract":"The effects of random variations in the fabrication process have increased significantly with the scaling of technology, causing analog circuit performance parameters to deviate from their expected values. This leads to parametric failure of I performances causing a significant loss of yield. In this work, we propose a statistical design flow, based on analytical equation based convex optimization and Response Surface Method (RSM)based experimental design technique to enhance the parametric yield of analog circuits. Stochastic MOSFET (SMOS) models are used for statistical simulation of circuits to capture the effect of process variation and mismatch in terms of performance parameter variation. The fitted quadratic response surface models for performance standard deviation are used to optimize device dimensions of a two-stage Cascode OpAmp to get a variance optimal design keeping other performance parameters as design constraints.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125104580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On Design of Temperature Invariant Physically Unclonable Functions Based on Ring Oscillators 基于环振子的温度不变物理不可克隆函数的设计
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.66
Raghavan Kumar, Vinay C. Patil, S. Kundu
{"title":"On Design of Temperature Invariant Physically Unclonable Functions Based on Ring Oscillators","authors":"Raghavan Kumar, Vinay C. Patil, S. Kundu","doi":"10.1109/ISVLSI.2012.66","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.66","url":null,"abstract":"CMOS implementation of Physically Unclonable Functions (PUFs) facilitates a number of applications ranging from digital rights management, device authentication, counterfeit detection/prevention and cryptographic key generation. Key expectations from such PUF circuits are high (i) uniqueness and (ii) reliability. Uniqueness refers to differentiated responses over challenge-response pairs. Reliability demands unvarying responses under varying environmental conditions such as temperature, supply voltage and noise. This paper describes two methods for achieving the above goals in a ring oscillator based PUF. The first method exploits the negative temperature resistance property of n+ and p+ polysilicon placed as source feedback resistors to de-sensitize ring oscillators to temperature variations. The second method uses an optimized supply voltage (V'DD) to reduce the temperature sensitivity of delay based ring oscillator PUFs. We report an improvement in reliability of 16% by combining these methods. Further, we propose a temperature-invariant ring oscillator PUF architecture based on Serial-Input Serial-Output (SISO) topology. In the proposed design, the relative phase difference between two ring oscillators is translated to a digital response bit. We show that this phase difference based response generation is superior to frequency based response generation in terms of area and power.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131481565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Operation Dynamics in Phase-Change Memory Cells and the Role of Access Devices 相变存储单元的操作动力学及存取装置的作用
2012 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2012-08-19 DOI: 10.1109/ISVLSI.2012.48
A. Faraclas, N. Williams, F. Dirisaglik, K. Cil, A. Gokirmak, H. Silva
{"title":"Operation Dynamics in Phase-Change Memory Cells and the Role of Access Devices","authors":"A. Faraclas, N. Williams, F. Dirisaglik, K. Cil, A. Gokirmak, H. Silva","doi":"10.1109/ISVLSI.2012.48","DOIUrl":"https://doi.org/10.1109/ISVLSI.2012.48","url":null,"abstract":"A detailed physical model of the heating and amorphization profiles in phase-change memory elements is applied to illustrate the effects of loads and pulse rise times on the reset operation of phase-change memory cells. Finite element modeling of the electrical and thermal transport is used for a mushroom phase-change memory element -- including temperature dependent materials parameters, thermoelectric terms and thermal boundary resistance between different materials - and integrated idealized circuit models are used for the access devices (MOSFET and diode, with a separate series resistance). The results show certain windows of loads and transient times that lead to successful reset operation without excessive wasted power, for the particular PCM cells and programming conditions simulated.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134598662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
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