{"title":"Validation of Geant4-based dose computational tools with REEF experiments","authors":"F. Lei, S. Rason, K. Ford, P. Morris","doi":"10.1109/RADECS.2009.5994692","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994692","url":null,"abstract":"This paper reports on the experiments carried out using the QinetiQ's REEF (Realistic Electron Exposure Facility) for the validation of computational tools used in space radiation studies. The experiments consist of measuring the dose rate due to the 90Sr/90Y source after aluminium shields of various thicknesses (0–15 mm), using TLDs and RADFET. The experiments have been modelled in simple 1D geometries using the MULASSIS tool and in detailed 3D geometries with the GRAS tool. Good agreements have been achieved between the measured and simulated data.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"59 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114053964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Toure, J. Portal, G. Hubert, K. Castellani-Coulié, A. Lesea
{"title":"Effect of multiple injections on the SEEs in SRAM cell","authors":"G. Toure, J. Portal, G. Hubert, K. Castellani-Coulié, A. Lesea","doi":"10.1109/RADECS.2009.5994589","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994589","url":null,"abstract":"This paper presents a new approach to analyze nanometres SRAM response to SEE attributed to proton-Silicon interactions. It couples the MUlti SCAles Single-Event Phenomena Predictive Platform (MUSCA SEP3) with SPICE modelling to study multi-injections phenomena.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132840757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Davidson, W. Kang, P. K. Basu, A. Holmes-Siedle, K. Galloway
{"title":"A MEMS dosimeter comprising diamond for very high neutron fluence","authors":"J. Davidson, W. Kang, P. K. Basu, A. Holmes-Siedle, K. Galloway","doi":"10.1109/RADECS.2009.5994555","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994555","url":null,"abstract":"The construct and modeled performance of a bi-layer cantilever beam type device which can serve as a dosimeter for very high neutron fluence environments such as nuclear or fusion applications is described. A layer of material such as molybdenum is fabricated integral to a microelectronics scaled CVD diamond cantilever beam such that, as it is irradiated, the layer swells in a predictable manner due to radiation damage, creating a changing state of strain in the bi-layer beam proportional to the fluence. The more the neutron fluence, the larger is the strain and hence the greater the deflection of the beam. This effect is, by the MEMS design and construct, tied to a variable displacement air gap plate capacitor such that the change in capacitance provides a direct measure of fluence.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125525349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Pershenkov, D. V. Savchenkov, A. Bakerenkov, V. N. Ulimov, A. Nikiforov, A. Chumakov, A. Romanenko
{"title":"The conversion model of low dose rate effect in bipolar transistors","authors":"V. Pershenkov, D. V. Savchenkov, A. Bakerenkov, V. N. Ulimov, A. Nikiforov, A. Chumakov, A. Romanenko","doi":"10.1109/RADECS.2009.5994661","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994661","url":null,"abstract":"Physical model of the ELDRS in bipolar transistors is presented. Basis of the model is the assumption that there're shallow and deep radiation-induced traps in the oxide which are converted to the interface traps with time constants, corresponding interface trap build-up at high and low dose rates. Excess base current is calculated with use of convolution integral for exponential and power response functions. The model provides well agreement between calculation results and published experimental data. The fitting parameter extraction technique is discussed.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"208 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131545420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Radiation environments and shielding approach for Jupiter Europa Orbiter (JEO)","authors":"I. Jun, K. Clark, T. Yan, T. van Houten","doi":"10.1109/RADECS.2009.5994674","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994674","url":null,"abstract":"A brief overview of the Jupiter Europa Orbiter (JEO) mission is presented along with a discussion of the challenges associated with the harsh radiation environment anticipated for the mission. The shielding approach for such harsh environment is discussed.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131865329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"3D Simulation of charge collection and MNU in SEU hardened storage cells","authors":"Lin Liu, Yuanfu Zhao, S. Yue","doi":"10.1109/RADECS.2009.5994585","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994585","url":null,"abstract":"Three-dimensional simulation is used to explore the basic charge-collection mechanisms in MOSEFT. Then the problem of multiple-node upset in DICE is studied. The results show the transient floating node and charge lateral diffusion are the key reasons for MNU.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133041360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Madan, Jiong Jiong Mo, R. Arora, S. Phillips, J. Cressler, P. Marshall, peixiong zhao, S. Koester
{"title":"Radiation effects in SiGe p-MODFETs grown on Silicon-on-Sapphire substrates","authors":"A. Madan, Jiong Jiong Mo, R. Arora, S. Phillips, J. Cressler, P. Marshall, peixiong zhao, S. Koester","doi":"10.1109/RADECS.2009.5994547","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994547","url":null,"abstract":"The radiation response of strained SiGe p-MODFETs to 63 MeV protons is investigated for the first time. It is observed that both the drain current and the transconductance of the devices improve (increase) marginally following proton exposure. Low-frequency noise measurements were made both before and after irradiation to better understand the role of traps, and also improves following exposure. Localized strain in high Ge content SiGe layers of the device may affect the trap density after irradiation.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"121 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121355485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
P. Beck, T. Berger, M. Hajek, M. Latocha, G. Reitz, S. Rollet, N. Vana, A. Zechner
{"title":"MATSIM: Development of a voxel model of the MATROSHKA astronaut dosimetric phantom exposed onboard ISS","authors":"P. Beck, T. Berger, M. Hajek, M. Latocha, G. Reitz, S. Rollet, N. Vana, A. Zechner","doi":"10.1109/RADECS.2009.5994675","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994675","url":null,"abstract":"The Austrian Institute of Technology coordinates the project MATSIM (MATROSHKA Simulation) in collaboration with the Vienna University of Technology and the German Aerospace Center, to perform FLUKA Monte Carlo simulations of the MATROSHKA numerical phantom under the radiation environment at the International Space Station (ISS). MATSIM is carried as co-investigation of the ESA ELIPS project MATROSHKA, an international collaboration of more than 18 research institutes and space agencies from all over the world, under the science and project lead of the German Aerospace Center. MATROSHKA is an ESA facility designed to determine the radiation exposure of an astronaut during an extravehicular activity at the ISS. During the project MATSIM a computer tomography scan of the MATROSHKA phantom has been converted into a high resolution 3-dimensional voxel model. The imparted energy and dose inside the model is determined. Part of the project is the phantom validation under reference radiation conditions. Investigations are carried out under ISS cosmic radiation conditions. The aim of the MATSIM project is the provision of comprehensive risk assessment of radiation hazard to humans in space due to ionising high energy particle radiation","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130238824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Radiation studies on the UMC 180nm CMOS process at GSI","authors":"S. Lochner, H. Deppe","doi":"10.1109/RADECS.2009.5994732","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994732","url":null,"abstract":"GRISU test ASICs were irradiated with different types of heavy ions, fluences up to 10<sup>12</sup> ions/cm<sup>2</sup> and with a LET in the range of 1–60MeV cm<sup>2</sup>/mg. Cross section for SEU/SET were measured during the tests. Furthermore TID measurements were applied. Results on degradation and annealing are reported.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129526749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault tolerant FIR filters using hamming codes","authors":"Shih-Fu Liu, P. Reviriego, J. A. Maestro","doi":"10.1109/RADECS.2009.5994701","DOIUrl":"https://doi.org/10.1109/RADECS.2009.5994701","url":null,"abstract":"Hamming Codes have been used to protect different circuits against Single Event Upsets (SEUs). In this paper, the use of Hamming on FIR Filters is studied in order to provide optimized and efficient protection techniques.","PeriodicalId":392728,"journal":{"name":"2009 European Conference on Radiation and Its Effects on Components and Systems","volume":"16 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120860950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}