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Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)最新文献

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Dynamics of the frequency estimation in the frequency domain 动态的频域频率估计
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2007-12-06 DOI: 10.1109/TIM.2007.908240
D. Agrez
{"title":"Dynamics of the frequency estimation in the frequency domain","authors":"D. Agrez","doi":"10.1109/TIM.2007.908240","DOIUrl":"https://doi.org/10.1109/TIM.2007.908240","url":null,"abstract":"The possibilities of error reduction of frequency estimation with multi-point interpolated discrete Fourier transform (DFT) for the Hanning window is described. Estimation of the periodic parameter by the interpolation of the DFT gives the same effect as the reduction of the spectrum tails. The side-lobe suppression is at the cost of widening the main lobe, and with this, increasing the noise contributions. In this paper, we try to show a trade off between the reduction of the systematic error of the frequency estimation and the uncertainty of the estimated results due to the interpolation algorithm. The number of interpolated points depends on the noise level, and on the mutual positions of frequency components of the signal.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130567678","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 38
Novel computer-based processing system for partial discharge detection and diagnosis 基于计算机的局部放电检测与诊断处理系统
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351139
X. Ma, C. Zhou, I. Kemp
{"title":"Novel computer-based processing system for partial discharge detection and diagnosis","authors":"X. Ma, C. Zhou, I. Kemp","doi":"10.1109/IMTC.2004.1351139","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351139","url":null,"abstract":"This paper presents a novel computer-based PD measurement system, which incorporates the conventional partial discharge detection circuits with a real-time oscilloscope of very wide bandwidth up to the order of gigahertz. The calibration pulse of the detection circuit is investigated for the denoising purposes. A sophisticated analytical tool, wavelet analysis, has been proposed and realised to preprocess PD data as acquired in the measuring system. On this basis, PD patterns during an adequate recording duration are given to further identify the origin of the PD source.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115233349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Concurrent measurement of combustion oscillation and temperature of multiple flames in a simulated gas turbine 模拟燃气轮机多火焰燃烧振荡和温度的同步测量
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351258
G. Lu, S. Siouris, Yong Yan, C.W. Wilson, S. Cornwell
{"title":"Concurrent measurement of combustion oscillation and temperature of multiple flames in a simulated gas turbine","authors":"G. Lu, S. Siouris, Yong Yan, C.W. Wilson, S. Cornwell","doi":"10.1109/IMTC.2004.1351258","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351258","url":null,"abstract":"A vision-based instrumentation system for the measurement of oscillation frequency and temperature distribution of multiple flames in a gas turbine combustor is developed and tested. The system, utilising imaging, spectral analysis and two-colour pyrometry techniques, is capable of monitoring the oscillation frequency and temperature distribution of up to eight flames concurrently and simultaneously. The relative error of the system for frequency measurement is less than 1% (0-100 Hz) whilst for temperature measurement it is no greater than 2% (1000/spl deg/C-1500/spl deg/C). Experimental results obtained on a simulated gas turbine have demonstrated that the fundamental frequency of the flame measured by the system responds in predictable ways to the excitation frequency of fuel flow. Further development is underway to apply the technique to a practical gas turbine combustor.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"296 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115666727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Image-based navigation on a chip 基于图像的芯片导航
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351098
M. Lifshits, E. Rivlin, M. Rudzsky
{"title":"Image-based navigation on a chip","authors":"M. Lifshits, E. Rivlin, M. Rudzsky","doi":"10.1109/IMTC.2004.1351098","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351098","url":null,"abstract":"In semiconductor industry, where highest levels of precision and robustness are required, machine vision tools evolved to become a mainstream automation tools that guide robotic handling, assembly and inspection processes. This paper presents an algorithm for navigation on a chip that is based on localization of microscopic eye-point images using a previously acquired wafer map. It is fast enough for in-line microscopy and robust to visual changes occurring during the manufacturing process, such as contrast variations, re-scaling, rotation and partial feature obliteration. The algorithm uses geometric hashing, a highly efficient technique drawn from the object recognition field. Experimental results indicate high reliability of the algorithm.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121822187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The CDFII silicon detector CDFII硅探测器
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351163
J. Thom
{"title":"The CDFII silicon detector","authors":"J. Thom","doi":"10.1109/IMTC.2004.1351163","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351163","url":null,"abstract":"The CDFII silicon detector consists of 8 layers of double-sided silicon micro-strip sensors totalling 722,432 readout channels, making it one of the largest silicon detectors in present use by an HEP experiment. After two years of data taking, we report on our experience operating the complex device. The performance of the CDFII silicon detector is presented and its impact on physics analyses is discussed. We have already observed measurable effects from radiation damage. These results and their impact on the expected lifetime of the detector are briefly reviewed.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116911202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The research of parameter optimization design method for analogy circuit [analog circuits] 类比电路[模拟电路]参数优化设计方法研究
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351353
Wang Shujuan, Gao Hongliang, W. Zhiping
{"title":"The research of parameter optimization design method for analogy circuit [analog circuits]","authors":"Wang Shujuan, Gao Hongliang, W. Zhiping","doi":"10.1109/IMTC.2004.1351353","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351353","url":null,"abstract":"This paper proposes an analog circuit tolerance distribution method, based on the orthogonal table, which reduces the parameter design computation requirements. In the tolerance distribution, an improvement of the stability of the output characteristics of the circuit is achieved at the cost of an increase of the cost of the circuit. In order to enhance the stability of circuit output characteristics while keeping the cost unchanged, this paper proposes a parameter optimization design method after the completion of the tolerance design.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117218611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimization of the displacement sensing precision of a reflected beam sensor in outdoor environment 室外环境反射波束传感器位移传感精度的优化
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351231
A. Makynen, J. Kostamovaara
{"title":"Optimization of the displacement sensing precision of a reflected beam sensor in outdoor environment","authors":"A. Makynen, J. Kostamovaara","doi":"10.1109/IMTC.2004.1351231","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351231","url":null,"abstract":"A way to minimize the effect of atmospheric turbulence on sensing precision of a reflected beam sensor, intended for long range outdoor displacement sensing applications, is described. Adjusting the receiver parameters or averaging successive measurement results typically has a negligible effect on precision. A new averaging method using multiple, laterally separated reflectors is proposed.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121088365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new method of measuring the 3-D shape and surface reflectance of an object using a laser rangefinder 一种利用激光测距仪测量物体三维形状和表面反射率的新方法
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351315
M. Baba, D. Narita, K. Ohtani
{"title":"A new method of measuring the 3-D shape and surface reflectance of an object using a laser rangefinder","authors":"M. Baba, D. Narita, K. Ohtani","doi":"10.1109/IMTC.2004.1351315","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351315","url":null,"abstract":"The present paper describes a newly proposed method for simultaneously measuring 3D shape and surface reflectance of an object using a laser rangefinder. The original work of this method lies in the advantage that the proposed method measures the surface reflectance using the object itself that is used for the 3D shape measurement. Experimental results show that the proposed method was applicable to noncontact industrial inspection, robot vision in automatic assembly, and reverse engineering.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121326093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Design and realization of high accuracy SAM (static analog memories) using low cost DA converters 采用低成本数模转换器的高精度静态模拟存储器的设计与实现
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351107
G. Scandurra, C. Ciofi, G. Cannatà, G. Giusi
{"title":"Design and realization of high accuracy SAM (static analog memories) using low cost DA converters","authors":"G. Scandurra, C. Ciofi, G. Cannatà, G. Giusi","doi":"10.1109/IMTC.2004.1351107","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351107","url":null,"abstract":"In this paper we demonstrate that a proper connection of two or more low cost, low accuracy DA converter can be used for the realization of a high accuracy static analog memory (SAM), that is a circuit that behaves as a high accuracy sample & hold block with infinite hold capability. The topology we propose can be applied both at board level and an integrated circuit level when designing compact and low cost devices for automated test equipment (ATE). In fact, as it will be demonstrated in this paper, high accuracy can be guaranteed by design, without the need for any calibration procedure. The approach we propose can therefore be considered as a possible and advantageous alternative to the conventional methods employed for the realization of high accuracy, multiple outputs, programmable voltage or current sources. A prototype of a SAM based on the approach we propose has been realized and tested. As it will be shown, the experimental results we have obtained fully confirm the validity of our approach.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124934350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Flow profile estimator for closed pipes based on electrical capacitance tomography techniques 基于电容层析成像技术的封闭管道流型估计
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351558
A. Fuchs, B. Brandstatter, D. Watzenig, G. Holler, B. Kortschak
{"title":"Flow profile estimator for closed pipes based on electrical capacitance tomography techniques","authors":"A. Fuchs, B. Brandstatter, D. Watzenig, G. Holler, B. Kortschak","doi":"10.1109/IMTC.2004.1351558","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351558","url":null,"abstract":"This paper describes a non-invasive approach for a combined flow profile and velocity measurement of powdery solids and fluids. The measurement is based on Electrical Capacitance Tomography (ECT) techniques, where disturbances in terms of aluminum tracer particles are detected by monitoring capacitance changes caused by the metal tracers. The proposed algorithm for the localization of disturbances forms the basis for a later cross-correlation of layer images and for velocity and profile measurement consequently.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126015785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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