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Annual Proceedings on Reliability and Maintainability Symposium最新文献

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A Bayesian methodology for assessing reliability during product development 在产品开发过程中评估可靠性的贝叶斯方法
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67957
S. Kaplan, G.D.M. Cunha, A. Dykes, D. Shaver
{"title":"A Bayesian methodology for assessing reliability during product development","authors":"S. Kaplan, G.D.M. Cunha, A. Dykes, D. Shaver","doi":"10.1109/ARMS.1990.67957","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67957","url":null,"abstract":"Discussed are two issues of concern to the defense acquisition community: how to develop a reasonably accurate assessment of weapons system reliability in a small sample environment, and, in the absence of extensive testing, how to assess the impact of corrective action on reliability growth. A stepwise process is described for analyzing failure data derived from various sources: subassembly level, system level (factory), system level (field) and operational testing. Bayes theory is applied in a sequential manner to the various levels of testing. The prior-distribution and updating procedures at each level involve using engineering judgement to evaluate the relevance of the various kinds of tests, the significance of failures observed, and the effectiveness of corrective actions. The application of the Bayesian process sets the language and format that provide a framework for gathering, organizing, and incorporating the expert knowledge and consensus of the entire engineering team into the assessment of reliability growth.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121615975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Landing gear steer-by-wire control system; digital vs. analog study 起落架线控操纵系统;数字与模拟研究
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67959
L. Dacko, R. Darlington, D. Shindman
{"title":"Landing gear steer-by-wire control system; digital vs. analog study","authors":"L. Dacko, R. Darlington, D. Shindman","doi":"10.1109/ARMS.1990.67959","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67959","url":null,"abstract":"A worthiness study in which the digital steer-by-wire control system was compared to an analog one using the life-cycle cost procedure is presented. The purpose of the study was to determine whether the higher reliability, ease of test, decrease in maintenance cost, and lower delay and cancellation rates foreseen for the digital system were worth increased recurring and nonrecurring costs. A potential drawback is the cost of the software development and certification. It is strongly influenced by proper programming techniques and good definition of requirements. The life-cycle cost analysis has shown that it is advantageous to make a large initial investment in technology that will be paid back over the life of the system.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117147325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Improving reliability and maintainability programs with configuration management-the next revolution 通过配置管理提高程序的可靠性和可维护性——下一次革命
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67941
R. G. Boznak
{"title":"Improving reliability and maintainability programs with configuration management-the next revolution","authors":"R. G. Boznak","doi":"10.1109/ARMS.1990.67941","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67941","url":null,"abstract":"The role of configuration management to define and communicate the desired result and to control and incorporate changes to the definition throughout the product's life cycle is discussed. Configuration management provides a degree of control throughout a product's development that ensures the predictability of achieving reliability and maintainability goals as well as cost, quality, and schedule objectives. Management is often unable to visualize how elements at the beginning of product development can later require a multitude of costly changes. Aggressive reliability and maintainability targets cannot be reached in a piecemeal manner. Rather, success requires an integrated and comprehensive approach.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127011803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Five basic steps to problem trending 问题趋势的五个基本步骤
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67926
E.L. Bombara
{"title":"Five basic steps to problem trending","authors":"E.L. Bombara","doi":"10.1109/ARMS.1990.67926","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67926","url":null,"abstract":"Five basic steps to problem trending evolved from experience in trending problems on Space Shuttle hardware are discussed: extracting data; constructing a Pareto chart of all failure modes; constructing normalized subsystem, component, and failure-mode trend charts; identifying trend direction; and providing a summary assessment. The five-step method has been useful for identifying failure modes of concern, evaluating the effectiveness of corrective actions, and determining funding allocation.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127086384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Availability tradeoffs for today's complex systems (military radar) 当今复杂系统(军用雷达)的可用性权衡
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67964
D. G. Willingham, J. D. Forster
{"title":"Availability tradeoffs for today's complex systems (military radar)","authors":"D. G. Willingham, J. D. Forster","doi":"10.1109/ARMS.1990.67964","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67964","url":null,"abstract":"For the US Navy's relocatable over-the-horizon radar (ROTHR) project, tradeoffs involve millions of dollars. This work describes the problems solved, work performed, and results achieved for the selection of ROTHR spare parts to optimally support mission availability at least cost. A reliability block diagram (RBD) describing the complete system-to-critical-part relationship was developed first. This RBD described 305 unique removable units in over 2800 part applications, requiring 83 pages of drawings. Parts exhibiting electronic adjacency were modeled with each part as the center of a subsystem which could have itself up or both the adjacent parts up for subsystem success. For parts with preceding power circuitry bringing down groups, sets of binomial probabilities showing all combinations were developed. The optimal selection of critical spare parts resulted in achieving the system operational availability goal of 95% at a saving of approximately $4.0 per ROTHR installation compared to simple protection level sparing methods.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"247 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126027015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reliability analysis based on a mathematical tool 基于数学工具的可靠性分析
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.68002
J.G. Dowlatshahi
{"title":"Reliability analysis based on a mathematical tool","authors":"J.G. Dowlatshahi","doi":"10.1109/ARMS.1990.68002","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68002","url":null,"abstract":"The MathCAD program, which has proven to be useful in reliability analysis of fault-tolerant systems, is described. Sensitivity and trade-off analyses can be performed easily within the program, and the results can be shown in graphical format for effective evaluation. Function libraries/macros can be developed to model every system configuration. Text, formulas, and graphics inside the MathCAD program, describing the entire analysis, can be used to generate formal documentation such as a reliability analysis report. The results are readable and easily understandable. There are no hidden functions, formulas, or procedures in the body of the analysis. The MathCAD tool helps the reliability engineer concentrate on modeling systems without getting involved in detailed mathematical computation of the system models.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127975058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Stress screening of electronic modules: investigation of effects of temperature rate of change 电子元件的应力筛选:温度变化率影响的研究
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67931
J. Kallis, W.K. Hammond, E.B. Curry
{"title":"Stress screening of electronic modules: investigation of effects of temperature rate of change","authors":"J. Kallis, W.K. Hammond, E.B. Curry","doi":"10.1109/ARMS.1990.67931","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67931","url":null,"abstract":"The authors discuss a study conducted to investigate the effects of temperature rate of change on the environmental stress screening of printed wiring assemblies (PWAs). The related effects of chamber air velocity and temperature dwell time on module temperature response were evaluated. The effects of varying thermal cycling parameter levels were investigated. The effects of various chamber air temperature rates of change and velocity levels on the temperature responses of two vastly different PWAs were measured. A thermal-cycling analysis of a PWA of the same construction as one of the two PWAs tested in the investigation was also performed. The results of a portion of the test are compared with the analytical predictions, validating the thermal response trends predicted by the mathematical model.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114261212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
D/Boolean application in reliability analysis D/布尔在可靠性分析中的应用
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67972
D. Koo
{"title":"D/Boolean application in reliability analysis","authors":"D. Koo","doi":"10.1109/ARMS.1990.67972","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67972","url":null,"abstract":"The disjointed Boolean (D/Boolean) solutions of several complex network reliability problems are presented to demonstrate the power and versatility of D/Boolean algebra. D/Boolean algebra is treated as a probability (rather than Boolean) function. This approach gives a reliability analyst the choice of preserving only the essential logic functions, removing the cumbersome manipulation of unnecessary logics, and efficiently deriving a probability solution of a system. The basic theory of D/Boolean algebra is discussed. It illustrates how a reliability solution of a moderately complex system (which may include a number of statistically dependent and independent circuits and/or the mixtures of sequential and combinatorial reliabilities) can be solved manually without complex computer algorithms.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131564840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
The modern assurance computing platform-progress report 现代化保障计算平台——进度报告
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67939
W. Kerscher
{"title":"The modern assurance computing platform-progress report","authors":"W. Kerscher","doi":"10.1109/ARMS.1990.67939","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67939","url":null,"abstract":"The product assurance organization of the AC Rochester Division of General Motors has embarked on a pilot program to develop and evaluate a departmental computing system to support their assurance activities. These activities have been evaluated with regard to the degree that they could make use of computer technology. Exhaustive system requirements were developed in the areas of human engineering, operation, technical, hardware, communication, business, and administrative requirements. Although this pilot program performed very well, shortcomings were identified in five specific areas. The common denominator of these various concerns was found to be the operating systems involved with various application packages, specifically, the Unix and DOS operating systems. A cost-effective approach utilizing a Unix-based workstation in the local area network has been found to be one possible solution to this situation. This pilot program is the continuation of an effort to develop an assurance computing platform.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"189 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134184586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Classical and Bayes approaches to environmental stress screening (ESS): a comparison 环境压力筛选(ESS)的经典方法和贝叶斯方法:比较
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67935
R. Barlow, I. Bazovsky, S. Wechsler
{"title":"Classical and Bayes approaches to environmental stress screening (ESS): a comparison","authors":"R. Barlow, I. Bazovsky, S. Wechsler","doi":"10.1109/ARMS.1990.67935","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67935","url":null,"abstract":"Optimal designs for electronic components environmental stress screening (ESS) plans are discussed relative to a classical and a Bayesian statistical point of view. A solution to the problem of determining optimal screen-times given the stress level, as well as the optimal stress level given a screen duration, is provided using the Bayesian approach. Other ESS measures described in a military handbook are calculated using the Bayesian approach.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134222262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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