发布求助
文献互助 智能选刊 最新文献

Annual Proceedings on Reliability and Maintainability Symposium最新文献

筛选
英文 中文
Progress in fiber optic reliability and maintainability 光纤可靠性和可维护性的研究进展
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67951
D.A. Followell
{"title":"Progress in fiber optic reliability and maintainability","authors":"D.A. Followell","doi":"10.1109/ARMS.1990.67951","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67951","url":null,"abstract":"Results from tests of connectors from several manufacturers are presented. Tests included preparation time, insertion loss, thermal shock, humidity cycling, thermal life aging, and durability. Results were generally very promising. Testing was also performed on an improved pot and polish connector which is being used in the AV-8B digital map set. This connector requires approximately 15 min to terminate, an improvement over the 2 h required for the previous connector. The new connector uses an epoxy that is preinstalled in the contact and is thicker than the previous epoxy. This results in reduced termination time, because the epoxy does not have to be mixed and injected into the contact.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1003 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120942372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The NASA trend analysis program NASA趋势分析项目
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67925
J. Crawford, R. Weinstock
{"title":"The NASA trend analysis program","authors":"J. Crawford, R. Weinstock","doi":"10.1109/ARMS.1990.67925","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67925","url":null,"abstract":"The four main areas of the NASA trend analysis program-problem/reliability, performance, supportability, and programmatic trending-are defined and illustrated with examples from Space Shuttle applications. Emphasis is on the programmatic-trending component of the program and several of the statistical techniques used. Also described is the NASA safety, reliability, maintainability, and quality assurance (SRM&QA) management information center, used to focus management attention on key near-term launch concerns and long-range mission trend issues.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123699342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A CAD-based electronics design rule checker to improve system reliability 基于cad的电子设计规则检查器，提高系统可靠性
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67999
S. Harbater, W.C. Tonelli
{"title":"A CAD-based electronics design rule checker to improve system reliability","authors":"S. Harbater, W.C. Tonelli","doi":"10.1109/ARMS.1990.67999","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67999","url":null,"abstract":"The computer-aided reliability diagnostic system (CARDS) is described. It is an expert-system-based electronics design rule checker that automatically identifies potential reliability and performance problems concurrently with the computer-aided design process. The integration of CARDS into the Mentor Graphics computer-aided engineering system is described.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127597693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microelectronic reliability predictions derived from component defect densities 基于元件缺陷密度的微电子可靠性预测
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67985
J. Stevenson, J. A. Nachlas
{"title":"Microelectronic reliability predictions derived from component defect densities","authors":"J. Stevenson, J. A. Nachlas","doi":"10.1109/ARMS.1990.67985","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67985","url":null,"abstract":"A physics-of-failure approach to reliability prediction for integrated circuits is discussed. The analysis described is based upon the expectation that no integrated circuit can ever be free of imperfections and the assumption that both microscopic (point) defects and macroscopic flaws play influential roles in determining IC reliability. It is demonstrated that the microscopic defects can be directly implicated in gradual degradation over time via analyses related to those used in modeling a variety of solid-state phenomena.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126347286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Human dependability requirements, scope and implementation at the European Space Agency 人的可靠性要求，范围和实施在欧洲航天局
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67936
R. Atkins
{"title":"Human dependability requirements, scope and implementation at the European Space Agency","authors":"R. Atkins","doi":"10.1109/ARMS.1990.67936","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67936","url":null,"abstract":"The results of preliminary investigations into the human-dependability needs of the European Space Agency are outlined. From these investigations a comprehensive human dependability program has been recommended to assist in the design of operationally safe space systems. Because the Agency is aware of the controversy surrounding this, a very careful review of the proposals is being undertaken. The proposed specification requires the implementation of programs for human-dependability testing and simulation, data collection and the maintenance of detailed data files on analysis results, incidents and incident investigations, and reports on lessons learned.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128108345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reliability prediction model for gyroscopes 陀螺仪可靠性预测模型
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67921
A. Dumai, A. Winkler
{"title":"Reliability prediction model for gyroscopes","authors":"A. Dumai, A. Winkler","doi":"10.1109/ARMS.1990.67921","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67921","url":null,"abstract":"An example is presented of reliability-prediction analysis of displacement gyros and rate gyros based on a detailed failure-mode analysis. Performance reliability and technical reliability are dealt with using different models for each to determine the reliability of the entire instrument. Miner's rule and reduced energy and statistical safety-factor methods are used. A Bayesian approach is used for the reliability demonstration.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125714345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Measurement assurance in reliability assessment 可靠性评估中的测量保证
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67963
M. B. Carey, G.N. Geissler, P.E. Montag, T.L. Yost
{"title":"Measurement assurance in reliability assessment","authors":"M. B. Carey, G.N. Geissler, P.E. Montag, T.L. Yost","doi":"10.1109/ARMS.1990.67963","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67963","url":null,"abstract":"A methodology is proposed for developing measurement assurance programs (MAPs). A MAP is a quality assurance program for a measurement process. It demonstrates that the uncertainty in the measurements on which reliability decisions are based is small enough to meet the needs of the reliability specialist. The essential feature of a MAP is that it focuses on the whole physical measurement process, i.e. the operator, the environment, the procedures, and the instruments. The methodology and supporting techniques are applied to the certification of an electrical component used in a large system. The uncertainties in the measurements of this component are estimated, and it is shown how they are useful to the reliability analyst.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132230710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A corrosion prevention and control (CPC) program 腐蚀预防和控制(CPC)程序
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67974
M. A. Young
{"title":"A corrosion prevention and control (CPC) program","authors":"M. A. Young","doi":"10.1109/ARMS.1990.67974","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67974","url":null,"abstract":"Corrosion is discussed as a serious threat to aviation readiness and safety. To prevent or minimize aircraft corrosion, the US Army Aviation Systems Command (AVSCOM) has developed and is implementing a corrosion prevention and control (CPC) program that incorporates the following actions: properly coating exposed metal; isolating dissimilar metals; using corrosion-resistant metal alloys; using proper sealants and water-displacing compounds; avoiding poor design features; increasing awareness of corrosion; and implementing an effective CPC program. The AVSCOM CPC program is divided into five major elements that incorporate CPC: management, design, maintenance, training, and awareness.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130117697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
State reduction for semi-Markov reliability models 半马尔可夫可靠性模型的状态约简
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67970
Allan L. White, Hampton, Daniel, Palumbo
{"title":"State reduction for semi-Markov reliability models","authors":"Allan L. White, Hampton, Daniel, Palumbo","doi":"10.1109/ARMS.1990.67970","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67970","url":null,"abstract":"Trimming, a method for reducing the number of states in a semi-Markov reliability model, is described, and an error bound is derived. The error bound uses only three parameters from the semi-Markov model-the maximum sum of rates for failure transitions leaving any state, the maximum average holding time for a recovery-mode state, and the operating time for the system. The error bound can be computed before any model generation takes places which means the modeler can decide immediately whether the model can be trimmed. The trimming has a precise and simple description and thus can be easily included in a program that generates reliability models. The simplest version of the error bound for trimming is presented. More accurate versions can be obtained by requesting more information about the system being modeled.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134252767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Analysis of warranty cost based on reliability 基于可靠性的保修成本分析
Annual Proceedings on Reliability and Maintainability Symposium Pub Date : 1990-01-23 DOI: 10.1109/ARMS.1990.67961
A. Myrick
{"title":"Analysis of warranty cost based on reliability","authors":"A. Myrick","doi":"10.1109/ARMS.1990.67961","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67961","url":null,"abstract":"A PC-based warranty cost analysis model developed jointly by the author and W. Hodges is presented, and reliability parameters and their fundamental effect as cost drivers are discussed. An example shows how estimated costs for spares, labor, repairs, packaging, transportation, escrow, administration, etc. are integrated into the analysis. Output of the model is a projection of the overall net account balance on a month-by-month basis throughout the warranty period. Examples also show how the model is used to conduct instant trade studies. Data that are routinely generated in the course of RAM modeling and predictions, with results from sparing analysis, were integrated into a mathematical model on a PC. By applying stock-in-trade data and accounting principles, a simple, direct, and powerful tool was developed for warranty cost analysis. The basic concept presented is applicable to various other areas.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130814499","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信