{"title":"环境压力筛选(ESS)的经典方法和贝叶斯方法:比较","authors":"R. Barlow, I. Bazovsky, S. Wechsler","doi":"10.1109/ARMS.1990.67935","DOIUrl":null,"url":null,"abstract":"Optimal designs for electronic components environmental stress screening (ESS) plans are discussed relative to a classical and a Bayesian statistical point of view. A solution to the problem of determining optimal screen-times given the stress level, as well as the optimal stress level given a screen duration, is provided using the Bayesian approach. Other ESS measures described in a military handbook are calculated using the Bayesian approach.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Classical and Bayes approaches to environmental stress screening (ESS): a comparison\",\"authors\":\"R. Barlow, I. Bazovsky, S. Wechsler\",\"doi\":\"10.1109/ARMS.1990.67935\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Optimal designs for electronic components environmental stress screening (ESS) plans are discussed relative to a classical and a Bayesian statistical point of view. A solution to the problem of determining optimal screen-times given the stress level, as well as the optimal stress level given a screen duration, is provided using the Bayesian approach. Other ESS measures described in a military handbook are calculated using the Bayesian approach.<<ETX>>\",\"PeriodicalId\":383597,\"journal\":{\"name\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARMS.1990.67935\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67935","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Classical and Bayes approaches to environmental stress screening (ESS): a comparison
Optimal designs for electronic components environmental stress screening (ESS) plans are discussed relative to a classical and a Bayesian statistical point of view. A solution to the problem of determining optimal screen-times given the stress level, as well as the optimal stress level given a screen duration, is provided using the Bayesian approach. Other ESS measures described in a military handbook are calculated using the Bayesian approach.<>
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