Classical and Bayes approaches to environmental stress screening (ESS): a comparison

Abstract

Optimal designs for electronic components environmental stress screening (ESS) plans are discussed relative to a classical and a Bayesian statistical point of view. A solution to the problem of determining optimal screen-times given the stress level, as well as the optimal stress level given a screen duration, is provided using the Bayesian approach. Other ESS measures described in a military handbook are calculated using the Bayesian approach.<>