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2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)最新文献

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Time-Domain Analysis and Modeling of Large-Signal RFI Rectification in MOS Transistors MOS晶体管大信号RFI整流的时域分析与建模
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485139
F. Torrès, C. Pouant, A. Reineix, P. Hoffmann, J. Raoult, L. Chusseau
{"title":"Time-Domain Analysis and Modeling of Large-Signal RFI Rectification in MOS Transistors","authors":"F. Torrès, C. Pouant, A. Reineix, P. Hoffmann, J. Raoult, L. Chusseau","doi":"10.1109/EMCEUROPE.2018.8485139","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485139","url":null,"abstract":"Based on theoretical and experimental time-domain results, this article analyses large-signal radio-frequency interference (RFI) rectification effects in small-signal low-frequency MOS transistors. Measurements indeed show that beyond the maximum operating frequency, transistors seem to exhibit RFI rectification, which is confirmed, with excellent agreement, by SPICE simulations. Transistors models used in these simulations are extracted from measurements, and include all the parasitic elements (package and circuit). After investigating transistors' internal currents, it appears that this rectification effect is not related to active nonlinearities of the device, but to the nonlinear capacitances of the transistors: the gate-drain overlap capacitance and, for the major part, to the parasitic drain-bulk junction capacitance. A simplified model reproducing this effect is presented, and the frequency range of occurrence of the RFI rectification is analyzed.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114332598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fast Simulation of Large-Scale Cable Systems by Hybridization of MTL, MNA and FDTD Methods 基于MTL、MNA和FDTD方法的大型电缆系统快速仿真
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485074
A. Demurov, I. Badzagua, A. Gheonjian, D. Eremyan, A. Bzhalava, B. Khvitia, Z. Kutchadze, R. Jobava
{"title":"Fast Simulation of Large-Scale Cable Systems by Hybridization of MTL, MNA and FDTD Methods","authors":"A. Demurov, I. Badzagua, A. Gheonjian, D. Eremyan, A. Bzhalava, B. Khvitia, Z. Kutchadze, R. Jobava","doi":"10.1109/EMCEUROPE.2018.8485074","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485074","url":null,"abstract":"This paper presents a hybrid approach to the frequency and time domain simulation of complex cable systems with arbitrary linear or linearized circuits at terminations. Depending on the type of cables to be investigated, either FDTD/MNA or MTL/MNA approach can be recommended. In FDTD/MNA scheme 1D-FDTD method is applied to solve the transient response of a cable system, which is then used together with circuits of termination devices to simulate the complete network by modified nodal analysis (MNA). In the second scheme, MTL theory is used to extract equivalent circuit models of cables. All extracted equivalent circuits are then merged with termination devices and solved using specialized MNA-based circuit solver. Both methods are speed-oriented, provide accurate results and can be used for fast simulation of large-scale cable systems. Validation of the proposed methods is performed by comparison with measurements of high voltage shielded cable test setup. Two application examples demonstrate the potential of the proposed approaches for simulation of large-scale cable systems - automotive harness and office wiring network.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124294530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An Equivalent Radiation Source Based on Artificial Neural Network for EMI Prediction 基于人工神经网络的等效辐射源电磁干扰预测
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485100
S. Yao, Y. Shu, L. Tong, X.C. Wei, Y.B. Yang, E. Liu
{"title":"An Equivalent Radiation Source Based on Artificial Neural Network for EMI Prediction","authors":"S. Yao, Y. Shu, L. Tong, X.C. Wei, Y.B. Yang, E. Liu","doi":"10.1109/EMCEUROPE.2018.8485100","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485100","url":null,"abstract":"In this paper, an equivalent radiation source based on the artificial neural network (ANN) is proposed for the electromagnetic interference (EMI) prediction of an unknown noise source. Firstly, the unknown noise source is equivalent to a dipole array, and the magnetic field over the plane above the unknown noise source is scanned. From this information a set of linear equations is obtained for the solution of the dipole array. Next, in order to consider the multi-reflections between the unknown source and its nearby components on the same PCB, and also the possible nonlinearity interaction between the circuits and electromagnetic fields, the original dipole array equivalent source is extended to the equivalent source based on the ANN. A numerical example shows that the proposed ANN equivalent source can be better in predicting the shadowing effect of the components around the unknown EMI source. This study provides a novel possible solution for the EMI source reconstruction through the near-field scanning.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125701372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Issues Concerning Radio Noise Floor Measurements Using a Portable Measurement Set-Up 关于使用便携式测量装置测量无线电噪声底的问题
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485041
K. Fockens, F. Leferink
{"title":"Issues Concerning Radio Noise Floor Measurements Using a Portable Measurement Set-Up","authors":"K. Fockens, F. Leferink","doi":"10.1109/EMCEUROPE.2018.8485041","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485041","url":null,"abstract":"An investigation is made into the selection of measurement antennas for man-made noise measurements. Although an ITU-R recommendation about noise measurements exists, the nature and goals of specific measurements campaigns prescribe additional requirements in the selection of antennas. Seen from points of sensitivity and calibration accuracy electric field rod antennas appeared to be suitable only for use on fixed locations in combination with a low impedance grounding. For portable measurement set-ups tuned magnetic field loop antennas are more applicable, but sensitivity and directivity of loop antennas require suitable measures.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122278260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Experimental Analysis of the Field Homogeneity and Isotropy Inside a Reverberation Chamber with Two Hemispherical Diffractors 双半球衍射混响室内场均匀性和各向同性的实验分析
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485147
M. Magdowski, Jagadeesh Immidisetti, R. Vick
{"title":"Experimental Analysis of the Field Homogeneity and Isotropy Inside a Reverberation Chamber with Two Hemispherical Diffractors","authors":"M. Magdowski, Jagadeesh Immidisetti, R. Vick","doi":"10.1109/EMCEUROPE.2018.8485147","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485147","url":null,"abstract":"In this paper, the possible improvement of the statistical homogeneity and isotropy of the electromagnetic field inside the working volume of a reverberation chamber by two hemispherical diffractors is analyzed experimentally. The hemispheres are made from copper and have a diameter that equals about the third of the wavelength at the lowest usable frequency. Four different configurations are analyzed: no diffractor, one diffractor mounted at a wall, one diffractor mounted at the ground and both diffractors mounted. The main result is that no improvement of the statistical uniformity can be observed.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127934062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Calibrated Contactless Impedance Measurements with DC Bias Currents 校准非接触阻抗测量与直流偏置电流
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485081
M. Harm, O. Kerfin, Lukas Oppermann, A. Enders, T. Braunschweig
{"title":"Calibrated Contactless Impedance Measurements with DC Bias Currents","authors":"M. Harm, O. Kerfin, Lukas Oppermann, A. Enders, T. Braunschweig","doi":"10.1109/EMCEUROPE.2018.8485081","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485081","url":null,"abstract":"Fast switching semiconductors in power electronic devices require the knowledge of the high frequency behaviour of the implemented system components. Impedance probes can be used to examine the HF properties of those devices in situ and without galvanic contact. However in systems under operation, DC or low frequency currents will lead to saturation effects in the impedance probe's core resulting in a degradation of the coupling between the probe and the system under test. In this paper the influence of DC bias currents on contactless impedance measurements is examined and different solution attempts are presented.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132543490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Simplifying Risk Analysis to Determine the Influence of Wind Turbines to the Electric Field of a DVOR Antenna Using Artificial Neural Networks 用人工神经网络简化风险分析确定风力发电机对DVOR天线电场的影响
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485040
Felix Burghardt, Sergei Sandmann, H. Garbe
{"title":"Simplifying Risk Analysis to Determine the Influence of Wind Turbines to the Electric Field of a DVOR Antenna Using Artificial Neural Networks","authors":"Felix Burghardt, Sergei Sandmann, H. Garbe","doi":"10.1109/EMCEUROPE.2018.8485040","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485040","url":null,"abstract":"In aviation, an aircraft determines its position by the use of electromagnetic signals from terrestrial antennas. Therefore, these signals should be disturbed as few as possible while propagating towards the aircraft. This can be ensured by a protection zone around the transmitters, in which no buildings are allowed. However, the location of the antennas is becoming increasingly interesting for operators of wind turbines. In order to be able to estimate the risk of wind turbines disturbing the antenna signals, many simulations and measurements have to be carried out. This paper demonstrates how artificial neural networks can be used to reduce the complexity of such an investigation by performing only a part of the simulations and predicting the results of the remaining ones.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134570133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Investigation of Radiated EMI from Printed Circuit Board Edges up to 100 GHz by Using an Effective Two-Dimensional Approach 利用有效二维方法研究100 GHz以下印刷电路板边缘的辐射电磁干扰
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485124
Lei Wang, C. Schuster
{"title":"Investigation of Radiated EMI from Printed Circuit Board Edges up to 100 GHz by Using an Effective Two-Dimensional Approach","authors":"Lei Wang, C. Schuster","doi":"10.1109/EMCEUROPE.2018.8485124","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485124","url":null,"abstract":"Problems of the radiated EMI from printed circuit board (PCB) edge have been widely studied for a long time. However, most of those publications stay in the frequency lower than 20 GHz. With the development of high-speed communication and some new generation telecommunication technologies, the operating frequency is moving higher and higher. This paper investigates the radiated EMI from PCB edge up to 100 GHz, by using the full-wave simulation. To simplify the study, the PCB has been modeled as a two-dimensional (2D) approach by using periodical boundary. The impacts of different PCB parameters, such as the substrate thickness, dielectric constant, dielectric loss and multi-layers, have been studied in this paper, together with a 3D PCB model for reference. It's found that the PCB thickness and the dielectric constant affect the edge radiation a lot. For instance, the radiation of the PCB with 0.508 mm thickness increases by 0.06 dB/GHz, whereas the one with 1.524 mm thickness increases by 0.22 dB/GHz.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131824505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Frequently Asked Questions 常见问题
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/emceurope.2018.8485152
Christina Aguilera, Perfumes
{"title":"Frequently Asked Questions","authors":"Christina Aguilera, Perfumes","doi":"10.1109/emceurope.2018.8485152","DOIUrl":"https://doi.org/10.1109/emceurope.2018.8485152","url":null,"abstract":"Companies applying to the program must also submit detailed paperwork that describes how the companies test their products, where they are sold, what kinds of products they offer, and what kinds of ingredients they use. We also require all companies to have agreements in place with their suppliers that no animal testing is done at any stage on any of the ingredients or raw materials that they supply to the company for its products.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"2018 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133380560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Crosstalk Sensitivity Analysis on Bundles of Twisted Wire Pairs 双绞线束串扰灵敏度分析
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485033
J. L. Rotgerink, F. Leferink
{"title":"A Crosstalk Sensitivity Analysis on Bundles of Twisted Wire Pairs","authors":"J. L. Rotgerink, F. Leferink","doi":"10.1109/EMCEUROPE.2018.8485033","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485033","url":null,"abstract":"Uncertainties in the geometry of complex cable bundles highly complicate crosstalk predictions. A change in for instance the position or the twist rate of individual cables in a bundle might have an impact on crosstalk levels. Application of sensitivity analyses can indicate which model parameters are most sensitive, and in which cabling configurations. In this paper, the efficient Stochastic Reduced Order Models (SROM) method is used to perform such a sensitivity analysis. It is applied to two cable bundles with two and seven twisted wire pairs, respectively. Monte Carlo simulations are performed to determine the accuracy of the SROM method. The sensitivity of parameters like inter-pair and intra-pair separation distance and the twist rate is determined in two different cases. Moreover, the effects of bundle twist and cable meandering to parameter sensitivities is investigated.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133769283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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