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2020 Conference on Precision Electromagnetic Measurements (CPEM)最新文献

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Modeling Wideband Low-Current Shunts with a New Design 一种新型宽带小电流分流器建模方法
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191749
G. Kyriazis, R. Souza, E. Yasuda, L. Di Lillo
{"title":"Modeling Wideband Low-Current Shunts with a New Design","authors":"G. Kyriazis, R. Souza, E. Yasuda, L. Di Lillo","doi":"10.1109/CPEM49742.2020.9191749","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191749","url":null,"abstract":"Low-current shunts with a new design were constructed as part of a trilateral South American project. Lumped equivalent circuit models for the shunt design are summarized here. The ac-dc transfer differences of shunts with nominal currents from 20 mA to 200 mA are computed using standard two-port network theory. Some experimental results to validate the model are reported. The measured ac-dc current transfer differences agree with the predicted values within the standard uncertainties in the whole frequency range of interest (10 Hz to 100 kHz).","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123008541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis of dominant uncertainty in the calibration of optical tachometers 光学转速表标定中的主要不确定度分析
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191738
Nelson Bahamón Cortés, Alexander Gutiérrez Guevara, Claudia Fernanda Rodríguez Rodríguez, Liz Catherine Hernández Forero
{"title":"Analysis of dominant uncertainty in the calibration of optical tachometers","authors":"Nelson Bahamón Cortés, Alexander Gutiérrez Guevara, Claudia Fernanda Rodríguez Rodríguez, Liz Catherine Hernández Forero","doi":"10.1109/CPEM49742.2020.9191738","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191738","url":null,"abstract":"The mathematical model of uncertainty estimation in the calibration of optical tachometers is presented. Emphasis is placed on the analysis of the dominant uncertainty component, for which two mathematical models are used and compared to each other. The first model uses a mathematical expression that constitutes a discriminant and the second model is based on Monte Carlo methods. Results are displayed and analyzed for five calibration points.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121298378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of UME Kibble Balance-3 UME磨粉秤的设计
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191798
Hacā Ahmedov, B. Korutlu, R. Orhan, Özlen Tuncel, Ç. Dogan
{"title":"Design of UME Kibble Balance-3","authors":"Hacā Ahmedov, B. Korutlu, R. Orhan, Özlen Tuncel, Ç. Dogan","doi":"10.1109/CPEM49742.2020.9191798","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191798","url":null,"abstract":"We present the basic design of Kibble Balance-3 apparatus developed in National Metrology Institute in Turkey and describe the improvements with respect to the previous system.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121400619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Linearity Measurements on Critical Noise Thermometer Components 关键噪声温度计元件的线性测量
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191699
D. Drung, C. Krause
{"title":"Linearity Measurements on Critical Noise Thermometer Components","authors":"D. Drung, C. Krause","doi":"10.1109/CPEM49742.2020.9191699","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191699","url":null,"abstract":"A method for measuring the nonlinearity of noise thermometer components was developed that reduces the demands on the test signal generator. The method was applied to characterize the preamplifier and analog-to-digital converter (ADC) of PTB's new noise thermometer. For the complete signal path, gain nonlinearities below about one part in 105 were experimentally demonstrated at input rms noise levels between $71 mu mathrm{V}$ and $284 mu mathrm{V}$. It was further demonstrated that dither can reduce the ADC nonlinearity by at least one order of magnitude.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116255615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Magnetic Sensing with Nitrogen-Vacancy Centers Based on Lock-in Detection 基于锁定检测的氮空位中心磁传感
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191789
E. Moreva, E. Bernardi, P. Traina, G. Petrini, S. D. Tchernij, J. Forneris, F. Picollo, V. Pugliese, A. Sosso, Ž. Pastuović, I. Degiovanni, P. Olivero, M. Genovese
{"title":"Magnetic Sensing with Nitrogen-Vacancy Centers Based on Lock-in Detection","authors":"E. Moreva, E. Bernardi, P. Traina, G. Petrini, S. D. Tchernij, J. Forneris, F. Picollo, V. Pugliese, A. Sosso, Ž. Pastuović, I. Degiovanni, P. Olivero, M. Genovese","doi":"10.1109/CPEM49742.2020.9191789","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191789","url":null,"abstract":"Nitrogen-vacancy (NV) centers in diamond allow measurement of magnetic fields at nanoscale. The working principle is based on the measurement of a NV center resonance frequency shift, detected by monitoring the center's photoluminescence. Here we present a technique based on lock-in detection and simultaneous excitation of the three peaks corresponding to hyperfine interaction between the NV center and the 14N nucleus.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125599232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Automated Leakage Current Measurement Capability for Programmable Josephson Voltage Standards 自动泄漏电流测量能力可编程约瑟夫森电压标准
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191831
C. Burroughs, A. Rüfenacht, S. Cular, P. Dresselhaus
{"title":"Automated Leakage Current Measurement Capability for Programmable Josephson Voltage Standards","authors":"C. Burroughs, A. Rüfenacht, S. Cular, P. Dresselhaus","doi":"10.1109/CPEM49742.2020.9191831","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191831","url":null,"abstract":"We have developed a new measurement module that can be installed in existing National Institute of Standards and Technology (NIST) Programmable Josephson Voltage Standard (PJVS) systems to provide automated leakage-current measurement capability. The system utilizes several relays to switch between normal PJVS operating modes and leakage-current measurement modes without any manual operator actions. The simplicity and convenience of this automated method enables the verification of system leakage current characteristics on a frequent schedule. Full automation of these tasks provides significant advantages over traditional measurement methods performed by an operator, including reduced noise and drift, and reduced sensitivity to other activities in the nearby environment.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125633324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Graphene quantum Hall effect devices for AC and DC resistance metrology 用于交流和直流电阻测量的石墨烯量子霍尔效应器件
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191851
M. Kruskopf, D. Patel, Chieh-I. Liu, A. Rigosi, R. Elmquist, Yicheng Wang, S. Bauer, Yefei Yin, K. Pierz, E. Pesel, M. Götz, J. Schurr
{"title":"Graphene quantum Hall effect devices for AC and DC resistance metrology","authors":"M. Kruskopf, D. Patel, Chieh-I. Liu, A. Rigosi, R. Elmquist, Yicheng Wang, S. Bauer, Yefei Yin, K. Pierz, E. Pesel, M. Götz, J. Schurr","doi":"10.1109/CPEM49742.2020.9191851","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191851","url":null,"abstract":"The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort, we report on ac quantum Hall measurements of a graphene-based Hall bar using superconducting contacts and a novel contact design approach.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125954365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Systematic uncertainties in strontium optical lattice clocks 锶光学晶格钟的系统不确定度
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191772
Y. Foucault, B. Alves, W. Moreno, R. L. Targat, J. Lodewyck
{"title":"Systematic uncertainties in strontium optical lattice clocks","authors":"Y. Foucault, B. Alves, W. Moreno, R. L. Targat, J. Lodewyck","doi":"10.1109/CPEM49742.2020.9191772","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191772","url":null,"abstract":"Current optical clocks already out-perform microwave clocks and have published uncertainty budgets at the 10−18 level and below [1]–[3]. Their sensitivity to systematic effects is enhanced in turn, so constant efforts are needed to complete and improve evaluations of uncertainty and inaccuracy. We present here non-exhaustive investigations of systematic effects to be included in the uncertainty budget of strontium optical lattice clock, due to the black-body radiation, the presence of the lattice light and the background gas in the experimental chamber.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131453481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Inductive Voltage Divider Ratio Measurement Based on Dual-Channel PJVS 基于双通道PJVS的电感分压比测量
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191780
Zhengsen Jia, Tiandi Zhou, Lei Wang, Xitong Xu, Zhaomin Shi, Xianlin Pan, Jiangtao Zhang
{"title":"Inductive Voltage Divider Ratio Measurement Based on Dual-Channel PJVS","authors":"Zhengsen Jia, Tiandi Zhou, Lei Wang, Xitong Xu, Zhaomin Shi, Xianlin Pan, Jiangtao Zhang","doi":"10.1109/CPEM49742.2020.9191780","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191780","url":null,"abstract":"This paper introduces a dual-channel quantum voltage synthesis system based on Josephson junction. And two AC quantum voltage signals with adjustable amplitude and phase are synthesized. A method is introduced to measure the ratio and phase difference of an inductive voltage divider based on the dual-channel AC quantum voltage system. It is proved that the ratio and phase difference of a inductive voltage divider can be traced to Josephson quantum voltage by precision comparison experiment with self-calibration method.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"405 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133971326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantitative electro-optic measurements of ultrafast electrical signals on planar transmission lines: Pitfalls and caveats 平面传输线上超快电信号的定量电光测量:陷阱和警告
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191725
P. Struszewski, M. Bieler
{"title":"Quantitative electro-optic measurements of ultrafast electrical signals on planar transmission lines: Pitfalls and caveats","authors":"P. Struszewski, M. Bieler","doi":"10.1109/CPEM49742.2020.9191725","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191725","url":null,"abstract":"We study electro-optic sampling for the quantitative detection of ultrafast electrical pulses propagating on planar transmission lines. The electro-optic signal strongly depends on the modulation frequency necessary for the lock-in detection. Yet, even when taking this frequency dependence into account it is not possible to simply “calibrate” the experimental setup using a well-known reference signal. Instead it is necessary to accurate determine the electro-optic transfer function of the experimental setup, which is a tedious task and might lead to very large uncertainties.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131614915","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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