M. Kruskopf, D. Patel, Chieh-I. Liu, A. Rigosi, R. Elmquist, Yicheng Wang, S. Bauer, Yefei Yin, K. Pierz, E. Pesel, M. Götz, J. Schurr
{"title":"Graphene quantum Hall effect devices for AC and DC resistance metrology","authors":"M. Kruskopf, D. Patel, Chieh-I. Liu, A. Rigosi, R. Elmquist, Yicheng Wang, S. Bauer, Yefei Yin, K. Pierz, E. Pesel, M. Götz, J. Schurr","doi":"10.1109/CPEM49742.2020.9191851","DOIUrl":null,"url":null,"abstract":"The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort, we report on ac quantum Hall measurements of a graphene-based Hall bar using superconducting contacts and a novel contact design approach.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM49742.2020.9191851","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort, we report on ac quantum Hall measurements of a graphene-based Hall bar using superconducting contacts and a novel contact design approach.