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2016 IEEE East-West Design & Test Symposium (EWDTS)最新文献

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Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults 时序电路多卡断故障的伪穷举测试
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807694
A. Matrosova, E. Mitrofanov
{"title":"Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults","authors":"A. Matrosova, E. Mitrofanov","doi":"10.1109/EWDTS.2016.7807694","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807694","url":null,"abstract":"A Sequential circuit design is based on using mixed description of a behavior of a combinational part. The behavior is represented with a composition of ROBDDs and monotonous products. The design method provides fully delay testability of a combinational part of a sequential circuit. In this paper it is shown that the method also provides multiple stuck-at faults testability of a combinational part. The pseudo-exhaustive test consisting of two parts is developed. One part is used to test sub-circuits obtained by covering nodes of the proper ROBDDs by elementary circuits (Invert-AND-XOR circuits). It allows detecting multiple stuck-at faults at gate poles of elementary circuits evenly remote from the combinational part inputs. The second test part detects all multiple stuck-at faults at gate poles of the rest component of the combinational part. It is supposed that only one of these two components of a combinational part may be faulty. An estimation of the length of such test is given.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130622105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The new method of secure data transmission on the indirect steganography basis 在间接隐写的基础上实现数据安全传输的新方法
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807754
A. Bekirov, D. Barannik, Oleg Frolov, O. Suprun
{"title":"The new method of secure data transmission on the indirect steganography basis","authors":"A. Bekirov, D. Barannik, Oleg Frolov, O. Suprun","doi":"10.1109/EWDTS.2016.7807754","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807754","url":null,"abstract":"In this article an approach for realization of steganographic embedding by using functional transformation for adaptive positional number is considered.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122157708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Structural CDC analysis methods 结构CDC分析方法
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807671
S. Zaychenko, Pavlo Leshtaev, B. Gureev, Maksym Shliakhtun
{"title":"Structural CDC analysis methods","authors":"S. Zaychenko, Pavlo Leshtaev, B. Gureev, Maksym Shliakhtun","doi":"10.1109/EWDTS.2016.7807671","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807671","url":null,"abstract":"This paper analyzes a problem of Clock Domain Crossings (CDC) verification in modern System-on-Chips. We suggest a set of topological methods that automatically discover CDCs and detect typical structural mistakes frequently occurring at the border of independent clock domains in many designs. Detecting structural design rule violations is a critical part of a complex CDC verification flow implemented in our commercial product ALINT-PRO-CDC™ [1].","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129131602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Optimizing network utilization through source code state model representation 通过源代码状态模型表示优化网络利用率
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807732
Jorge López, N. Kushik, A. Cavalli, N. Yevtushenko
{"title":"Optimizing network utilization through source code state model representation","authors":"Jorge López, N. Kushik, A. Cavalli, N. Yevtushenko","doi":"10.1109/EWDTS.2016.7807732","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807732","url":null,"abstract":"As `computational' systems grow in usage, an aspect often required to be enhanced is their energetic consumption. This paper presents a methodology for measuring and optimizing the energy spent by the embedded software. The proposed approach relies on the use and manipulation of state models that can be effectively obtained from the source code. The network load/utilization is considered as an optimization criterion for the overall software energy consumption.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127658856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiophysical processes in thin-film structures 薄膜结构中的辐射物理过程
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807720
D. Bezuglov, G. N. Shalamov, G. Sinyavsky, A. N. Zaichenko, L. Cherckesova, O. Manaenkova, A. Shein
{"title":"Radiophysical processes in thin-film structures","authors":"D. Bezuglov, G. N. Shalamov, G. Sinyavsky, A. N. Zaichenko, L. Cherckesova, O. Manaenkova, A. Shein","doi":"10.1109/EWDTS.2016.7807720","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807720","url":null,"abstract":"In the presented article the radio physical processes proceeding in nonlinear parametric zonal systems (NPS) are analyzed. Such NPS are the foundation of parametric generators of signals, parametric modulators-amplifiers and many other types of parametric transducers on which resonance circuits that are widely applied in modern radio electronics are built. However, NPS with weak nonlinearity, working or on current subharmonics or on combination of frequencies, in the first zone of instability of electromagnetic oscillations, are still used. For implementation of further transition to thin-film structures with distributed parameters it is necessary to consider the mechanism of resonant circuit interaction with external influence of pumping and the process of parametric excitation of oscillations. It is important to analyze the nonlinear phenomena in the first and in the higher zones of instability of electromagnetic oscillations where current ultraharmonics are arising.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125619772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
No-reference image quality assessment based on local binary patterns 基于局部二值模式的无参考图像质量评估
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807685
I. Nenakhov, V. Khryashchev, A. Priorov
{"title":"No-reference image quality assessment based on local binary patterns","authors":"I. Nenakhov, V. Khryashchev, A. Priorov","doi":"10.1109/EWDTS.2016.7807685","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807685","url":null,"abstract":"This paper presents the new algorithm for no-reference image quality assessment (NRQ LBP). This algorithm does not need a priori information about possible types of image distortions before assessment. No transformation to another coordinate frame (DCT, wavelet, etc.) is required, distinguishing it from prior no reference quality assessment approaches. NRQ LBP is based on machine learning and uses extremely randomized trees method for mapping quality features with subject quality score (DMOS). Quality features are bins of a histogram of local binary patterns calculated for neighborhood radiuses 1, 2, 3 pixels. Comparative experimental results a given for modern image quality assessment algorithms (PSNR, SSIM, MS-SSIM, LBIQ, GRNN, BRISQUE, NRLBPS). Images from standard LIVE database are used as training and testing datasets. Spearman correlation coefficient, Pearson correlation coefficient and RMSE are used to determine the accuracy of compared algorithms. Performance results shows that proposed algorithm is highly competitive with tested algorithms and moreover it has very low computational complexity, making it well suited for real time applications.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125725431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Testing logic circuits at different abstraction levels: An experimental evaluation 在不同抽象层次测试逻辑电路:一个实验评估
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807687
S. Smolov, Jorge López, N. Kushik, N. Yevtushenko, M. Chupilko, A. Kamkin
{"title":"Testing logic circuits at different abstraction levels: An experimental evaluation","authors":"S. Smolov, Jorge López, N. Kushik, N. Yevtushenko, M. Chupilko, A. Kamkin","doi":"10.1109/EWDTS.2016.7807687","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807687","url":null,"abstract":"The paper presents an experimental evaluation of test generation methods for digital circuits. Two methods are considered: an EFSM-based one, aimed at the code coverage of high-level (RTL) descriptions, and an equivalence-checking based on low-level (gate) description. High-level code and low-level fault coverage are measured for generated tests. Low-level mutants were generated for several fault models. Experiments have been performed for a subset of ITC'99 benchmarks. The results show that in most cases, the mutant coverage remains rather low for RTL tests. Vice versa, low-level tests have lower or the same RTL code coverage as high-level ones.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117288975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Methodological aspects of detection and resolution of conflicts of train control systems information security software 列车控制系统信息安全软件冲突检测与解决的方法学方面
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807692
A. Kornienko, M. Polyanichko, D. Efanov
{"title":"Methodological aspects of detection and resolution of conflicts of train control systems information security software","authors":"A. Kornienko, M. Polyanichko, D. Efanov","doi":"10.1109/EWDTS.2016.7807692","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807692","url":null,"abstract":"This paper considers a methodological approach to automated detection and resolution of conflicts of information security software of train traffic control information system, based on the analysis of system performance, finding the conflicts in configuration files, registry keys, and dynamic libraries assessment. Models of conflicting objects of computer system and a method for calculation of a composite indicator value of performance decreasing, based on linguistic rules and discriminant function, are introduced.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133525990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Adaptation of discrete estimation algorithms according state model and shaping noise parameters based on the combined maximum principle 基于组合极大值原理的状态模型自适应离散估计算法和噪声参数整形算法
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807734
A. Kostoglotov, Igor Deryabkin, S. Lazarenko, I. Pugachev, A. Kuznetsov
{"title":"Adaptation of discrete estimation algorithms according state model and shaping noise parameters based on the combined maximum principle","authors":"A. Kostoglotov, Igor Deryabkin, S. Lazarenko, I. Pugachev, A. Kuznetsov","doi":"10.1109/EWDTS.2016.7807734","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807734","url":null,"abstract":"If the motion model is inconsistent with the observable state change when tracking the maneuvering target, it can lead to divergence and even failure of the estimation algorithm. Hence the development of adaptive filters is actual problem. One of the traditional variant for the filter adaptation is to use a set of identical models with different parameters. This allows taking into account the uncertainty of statistic or geometric nature for the kinematic models when describing the maneuver. However, a wide variety of the maneuver types leads to complexity for implementation of the filters built on the basis of this approach. In this paper the problem of adaptation of the discrete mathematical model to the observed system is solved as the result of structural synthesis which is obtained from the solution of inverse problem of dynamics based on the combined maximum principle.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129719457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Digital beamforming in MIMO-radar with frequency diversity 频率分集mimo雷达的数字波束形成
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807638
V. Lobach, A. Kasyanov, M. Potipak
{"title":"Digital beamforming in MIMO-radar with frequency diversity","authors":"V. Lobach, A. Kasyanov, M. Potipak","doi":"10.1109/EWDTS.2016.7807638","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807638","url":null,"abstract":"The aim of this work is to develop an algorithm of digital beam forming for coherent MIMO radar with frequency diversity. We discussed ways to simplify hardware implementation of MIMO radar using serial method of MIMO channel matrix forming. A model of probing waveform, which allows performing digital beam forming at functional level is proposed. The bearing resolution of MIMO radar is estimated based on radiation pattern and ambiguity function modeling. Serial manner of MIMO channel matrix forming requires a larger number of orthogonal probing waveforms and twice longer time, relative to the traditional parallel method.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"221 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129950536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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