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2016 IEEE East-West Design & Test Symposium (EWDTS)最新文献

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Multi-interval static timing analysis accounting logic compatibility 多间隔静态定时分析会计逻辑兼容性
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807650
S. Gavrilov, G. Ivanova, D. Ryzhova, P. Volobuev
{"title":"Multi-interval static timing analysis accounting logic compatibility","authors":"S. Gavrilov, G. Ivanova, D. Ryzhova, P. Volobuev","doi":"10.1109/EWDTS.2016.7807650","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807650","url":null,"abstract":"The influence of technological and circuit parameters variations on the combinational circuit elements delay increases with the transistor size reduction. Delay uncertainty comes from the parameter values dispersion; therefore, it is critical to analyze the possible delay variance. This paper presents the solution to problems of complex digital circuits performance analysis with the presence of the aforementioned uncertainty. In order to account technological and circuit element parameters uncertainty we propose a method which is based on interval modeling. Unlike the traditional analysis based on the test sequence modeling with ordering events during the time, the proposed method provides space ordering, thus it offers significant accuracy increase for interval delay analysis with simultaneous input switching consideration.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115704115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Information-measuring control system of active vibration protection RED 主动振动保护信息测量控制系统RED
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807740
A. Lysenko, N. Goryachev, N. Yurkov, A. M. Telegin, V. Trusov
{"title":"Information-measuring control system of active vibration protection RED","authors":"A. Lysenko, N. Goryachev, N. Yurkov, A. M. Telegin, V. Trusov","doi":"10.1109/EWDTS.2016.7807740","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807740","url":null,"abstract":"In this article the positive effect of vibration damping based on the introducing phase shift between the vibrosignals brought to the points of attachment of electronic devices is shown. A diagram block of information-measuring control system of active vibration protection of electronic devices allowing to lower vibration exposure by changing the phase of vibration signals is also presented. Authors depict the design of active damper integrated primary converter allowing to create the phase-shifted signals and to provide additional vibration damping. The results of simulation, which point to a significant reduction of vibration loads are presented.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125915494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Universal mitigation of NBTI-induced aging by design randomization 通过设计随机化普遍缓解nbti诱导的衰老
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807635
M. Jenihhin, A. Kamkin, Z. Navabi, Somayeh Sadeghi Kohan
{"title":"Universal mitigation of NBTI-induced aging by design randomization","authors":"M. Jenihhin, A. Kamkin, Z. Navabi, Somayeh Sadeghi Kohan","doi":"10.1109/EWDTS.2016.7807635","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807635","url":null,"abstract":"In this paper we propose to think out of the box and discuss an approach for universal mitigation of Negative Bias Temperature Instability (NBTI) induced aging untied from the limitations of its modelling. The cost-effective approach exploits a simple property of a randomized design, i.e., the equalized signal probability and switching activity at gate inputs. The techniques considered for structural design randomization involve both the hardware architecture and embedded software layers. Ultimately, the proposed approach aims at extending the reliable lifetime of nanoelectronic systems.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123573780","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Robust algorithm for detection of image features 图像特征检测的鲁棒算法
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807702
K. Rumyantsev, Dmitry Petrov
{"title":"Robust algorithm for detection of image features","authors":"K. Rumyantsev, Dmitry Petrov","doi":"10.1109/EWDTS.2016.7807702","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807702","url":null,"abstract":"Authors proved existence of uniformly most powerful invariant algorithm based on the t-test. Conducted study allowed to synthesize decision rule for detection of image features on 3×3 pixel patch was found. Simulation proved stability of the proposed feature point detection algorithm to change of mean value and standard deviation of background pixels' intensity. Versatility of detection algorithm determined only by set of pixels in the signal sample. Uniqueness of detected features determined by formation of support and analyzed samples. Authors obtained equations that allow to assess the effectiveness of the robust feature detector.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115203105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Contactless measurement technique for the amplitude of vibrational movement of the test material point 非接触式测量技术用于测试材料点的振动运动幅度
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807737
A. Grigoriev, N. Yurkov, I. Kochegarov
{"title":"Contactless measurement technique for the amplitude of vibrational movement of the test material point","authors":"A. Grigoriev, N. Yurkov, I. Kochegarov","doi":"10.1109/EWDTS.2016.7807737","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807737","url":null,"abstract":"The article examines the problem and characteristics of contact less measurement technique of the vibration movement amplitude of the test material point along the z-axis of the object surface. In the article the error assessment of vibration measurements is determined. The authors describe overview and the results of experimental studies.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122795161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Client-server based wireless networked control system 基于客户端-服务器的无线联网控制系统
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807627
Mehdi J. Marie, G. Al-Suhail, Salah S. Al-Majeed
{"title":"Client-server based wireless networked control system","authors":"Mehdi J. Marie, G. Al-Suhail, Salah S. Al-Majeed","doi":"10.1109/EWDTS.2016.7807627","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807627","url":null,"abstract":"There are tremendous developments and achievements during recent years, related to the use of wireless technologies in industry to provide flexibility, scalability and low cost. Wireless Networked Control Systems (WNCSs) based on Wireless Sensor Networks (WSNs) integrate three technologies: control engineering, computer networks and wireless communication. WNCSs are systems of smart and wirelessly connected devices equipped with limited communication, computation and sensing capabilities for control and monitoring applications. The design, building and implementation of a WNCS for a FlyWheel Position Control System (F-W PCS) are based on the XBee platform. A simulation of the wireless networked F-W PCS mathematical model was implemented using the TrueTime 1.5 MATLAB/Simulink Toolbox with the wireless networks between controller and plant nodes employing ZigBee (IEEE802.15.4) and Wi-Fi (IEEE802.11) protocols. The real-time wireless F-W PCS was realized and implemented successfully. Experimental set-up and simulation results show the feasibility and reliability of the system when it is compared with more traditional networked control systems.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126667238","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Quantum-cryptographic network Quantum-cryptographic网络
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807623
A. Pljonkin, K. Rumyantsev
{"title":"Quantum-cryptographic network","authors":"A. Pljonkin, K. Rumyantsev","doi":"10.1109/EWDTS.2016.7807623","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807623","url":null,"abstract":"This paper describes trends in the field of encryption, based on the principles of quantum cryptography. Here is a description of commercial self-compensation quantum key distribution system (QKDS). A description of quantum-cryptographic network stand, based on integrated commercial QKDS Clavis2 from idQuantique (Switzerland), is also proposed. Research of quantum key integration into telecommunication data transmission network encryption protocol is offered. Capabilities of quantum-cryptographic network stand are also formulated.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123831883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Monochrome multitone image approximation with low-dimensional palette 单色多色调图像逼近与低维调色板
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807743
R. Neydorf, A. Aghajanyan, D. Vucinic
{"title":"Monochrome multitone image approximation with low-dimensional palette","authors":"R. Neydorf, A. Aghajanyan, D. Vucinic","doi":"10.1109/EWDTS.2016.7807743","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807743","url":null,"abstract":"The report is devoted to the problem of suboptimal approximation of monochrome multitone image. The proposed approximation consists in replacing the original image tone palette with a reduced size tone palette. The suboptimum approximation is based on the evolutionarily genetic algorithm. The algorithm provides the suboptimal selection of tones for the new palette and its covering range. The weight-dividing strategy of the original monochrome multitone image's frequency diagram of brightness is used to define the initial tones of the new palette and its covering range. These numerical vectors, considered as chromosomes, define the approximated image created by 2 respective chromosomes. The standard genetic operators of mutation is crossed over with the selection strategy, which provides an effective approximation optimization according to the criteria of the least square deviation between pixels of their original tones, when related to the new palette tones. The developed algorithm can be applied to the wide class of problems. Examples are the pattern recognition tasks, image defects detection, and image transformation, for printing equipment. The report illustrates the image approximation of the “on board electronic circuit” with the sub-optimization of the specific algorithm probabilistic parameters.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123982123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Cloud incident response model 云事件响应模型
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807665
A. Adamov, Anders Carlsson
{"title":"Cloud incident response model","authors":"A. Adamov, Anders Carlsson","doi":"10.1109/EWDTS.2016.7807665","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807665","url":null,"abstract":"This paper addresses the problem of incident response in clouds. A conventional incident response model is formulated to be used as a basement for the cloud incident response model. Minimization of incident handling time is considered as a key criterion of the proposed cloud incident response model that can be done at the expense of embedding infrastructure redundancy into the cloud infrastructure represented by Network and Security Controllers and introducing Security Domain for threat analysis and cloud forensics. These architectural changes are discussed and applied within the cloud incident response model.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"2020 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121343179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Power specification, simulation and verification of SystemC designs 系统设计的电源规格、仿真和验证
2016 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2016-10-01 DOI: 10.1109/EWDTS.2016.7807731
K. Gagarski, M. Petrov, M. Moiseev, Ilya V. Klotchkov
{"title":"Power specification, simulation and verification of SystemC designs","authors":"K. Gagarski, M. Petrov, M. Moiseev, Ilya V. Klotchkov","doi":"10.1109/EWDTS.2016.7807731","DOIUrl":"https://doi.org/10.1109/EWDTS.2016.7807731","url":null,"abstract":"SystemC language is widely used for hardware modules and whole systems on chip development. Hardware development for low power applications requires power management techniques like power gating, clock gating and memory power control. SystemC does not support power related features that is a gap between power intentions at architecture level and power specification implemented in RTL. We suggest SCPower extension that allows to inject power specification into SystemC designs and automatically generate UPF file. The SCPower extension provides power aware SystemC simulation that is equivalent to RTL simulation with power specification in UPF.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121736400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
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