{"title":"Fault Dictionary Size Reduction for Million-Gate Large Circuits","authors":"Y. Hong, Juinn-Dar Huang","doi":"10.1109/ASPDAC.2007.358092","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.358092","url":null,"abstract":"In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"133 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120858443","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Armoni, L. Fix, Ranan Fraer, T. Heyman, Moshe Y. Vardi, Y. Vizel, Yael Zbar
{"title":"Deeper Bound in BMC by Combining Constant Propagation and Abstraction","authors":"R. Armoni, L. Fix, Ranan Fraer, T. Heyman, Moshe Y. Vardi, Y. Vizel, Yael Zbar","doi":"10.1109/ASPDAC.2007.358003","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.358003","url":null,"abstract":"The most successful technologies for automatic verification of large industrial circuits are bounded model checking, abstraction, and iterative refinement. Previous work has demonstrated the ability to verify circuits with thousands of state elements achieving bounds of at most a couple of hundreds. In this paper we present several novel techniques for abstraction-based bounded model checking. Specifically, we introduce a constant-propagation technique to simplify the formulas submitted to the CNF SAT solver; we present a new proof-based iterative abstraction technique for bounded model checking; and we show how the two techniques can be combined. The experimental results demonstrate our ability to handle circuit with several thousands state elements reaching bounds nearing 1,000.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133944496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Exploration of Low Power Adders for a SIMD Data Path","authors":"Giacomo Paci, P. Marchal, L. Benini","doi":"10.1109/ASPDAC.2007.358106","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.358106","url":null,"abstract":"Hardware for ambient intelligence needs to achieve extremely high computational efficiency (up to 40GOPS/W). An important way for reaching this is exploiting parallelism, and more specifically data-level parallelism enabled by SIMD. Whereas a large body of research exists on the benefits of the architectural design of and compilation onto SIMD, the design of energy-optimal functional units for SIMD has received limited attention. It appears that existing SIMD functional units are designed in an area optimal, but not energy optimal way. By exploiting the difference in critical path length for the types of operations (e.g., 4times8/2times16/1times32), SIMD adders can be developed that save up to 40% of energy. In this paper, the authors present these adders, the issues of building them and quantify their benefits for different usage scenarios and operating frequencies.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133621064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Next-Generation Design and EDA Challenges: Small Physics, Big Systems, and Tall Tool-Chains","authors":"Rob A. Rutenbar","doi":"10.1109/ASPDAC.2007.357772","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.357772","url":null,"abstract":"There is much discussion of two challenges in the design of tomorrow’s electronics: the difficult “small physics” of nanoscale transistors, and the silicon/software complexity of “big systems”. But those of us who want to build beautiful algorithms have an additional hurdle: “tall tool-chains”. If it takes 50 tool-steps to build an industrial-strength design flow, and each tool is based on 1-2 “big algorithms”, does this mean that each new algorithm idea is worth, at best, 1-2% of the success of a design? This seems to me a bad way of accounting for the tremendous value that EDA brings to the world of design. How can we have a big impact in this important technology area? In this talk, I will offer several pieces of advice for how not to get buried by the tall-toolchain problem. I will discuss how to identify design problems that can have large impact, how to embrace the strange physics of tomorrow’s silicon technologies in the service of building beautiful algorithms, and how to get fresh (and unique) insights on problems by spending time working with a real design team. I will use design examples ranging from lithography, to computational finance, to silicon-based speech recognition, to illustrate the point that this is an exciting time to be working on tomorrow’s tool and design challenges.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"41 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114009334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Trace Compaction using SAT-based Reachability Analysis","authors":"Sean Safarpour, A. Veneris, Hratch Mangassarian","doi":"10.1109/ASPDAC.2007.358109","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.358109","url":null,"abstract":"In today's designs, when functional verification fails, engineers perform debugging using the provided error traces. Reducing the length of error traces can help the debugging task by decreasing the number of variables and clock cycles that must be considered. We propose a novel trace length compaction approach based on SAT-based reachability analysis. We develop procedures and algorithms using pre-image computation to efficiently traverse the state space and reduce the trace lengths. We further introduce a data structure used to store the visited states which is critical to the performance of the proposed approach. Experiments demonstrate the effectiveness of the reachability approach as approximately 75% of the traces are reduced by one or two orders of magnitudes.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116386960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Topology exploration for energy efficient intra-tile communication","authors":"Jin Guo, A. Papanikolaou, F. Catthoor","doi":"10.1109/ASPDAC.2007.357982","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.357982","url":null,"abstract":"With technology nodes scaling down, the energy consumed by the on-chip intra-tile interconnects is beginning to have a significant impact on the total chip energy. The energy-optimal sectioned bus (ESB) template is an energy efficient architecture style for on-chip communication between components. To achieve minimum energy operation, the netlist topology of the ESB bus should however be optimized accordingly. In this paper we present a strategy for the definition of an energy optimal netlist for the ESB bus. An initial floorplanning stage provides information about the eventual lengths of the interconnect wires and a subsequent exploration step defines the optimal topology for the communication architecture. We motivate that a star topology generated using wire length prediction can be up to a factor 4 more energy efficient compared to standard linear bus topologies.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114682201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Bao Liu, A. Kahng, Xu Xu, Jiang Hu, G. Venkataraman
{"title":"A Global Minimum Clock Distribution Network Augmentation Algorithm for Guaranteed Clock Skew Yield","authors":"Bao Liu, A. Kahng, Xu Xu, Jiang Hu, G. Venkataraman","doi":"10.1109/ASPDAC.2007.357787","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.357787","url":null,"abstract":"Nanometer VLSI systems demand robust clock distribution network design for increased process and operating condition variabilities. In this paper, we propose minimum clock distribution network augmentation for guaranteed skew yield. We present theoretical analysis results on an inserted link in a clock network, which scales down local skew and skew variation, but may not guarantee global skew and skew variation reduction in general. We propose a global minimum clock network augmentation algorithm, which inserts links simultaneously between all nearest sink pairs, apply rule-based link removal, and perform link consolidation by Steiner minimum tree construction for wire-length reduction with guaranteed clock skew yield. Our experimental results show that our proposed algorithm achieves dominant clock network augmentation solutions, e.g., an average of 16% clock skew yield improvement, 9% maximum skew reduction, and 25% reduction of clock skew variation standard deviation with identical wirelength compared with previous best clock network link insertion methods (Venkataraman et al., 2005).","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128312850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Pantonial, Md. Ashfaquzzaman Khan, N. Miyamoto, K. Kotani, S. Sugawa, T. Ohmi
{"title":"Improving Execution Speed of FPGA using Dynamically Reconfigurable Technique","authors":"R. Pantonial, Md. Ashfaquzzaman Khan, N. Miyamoto, K. Kotani, S. Sugawa, T. Ohmi","doi":"10.1109/ASPDAC.2007.357964","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.357964","url":null,"abstract":"This paper studies issues concerning dynamically reconfigurable FPGA (DRFPGA). It reports the architecture and performance of Flexible Processor III (FP3), a newly proposed DRFPGA. The FP3 employs a new shift register-type temporal interconnect to reduce operation delay. Designed and fabricated in 0.35mum 2P3M CMOS technology, FP3 works correctly as a multi-context FPGA. Our experimental results show that there exist cases where the best user circuit speed was achieved when 2 contexts were in use for a benchmark circuit. This is because of the reduction of buffers in the critical path by temporal partitioning.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128739361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Hase, Kazushi Akie, Masaki Nobori, Keisuke Matsumoto
{"title":"Development of Low-power and Real-time VC-1/H.264/MPEG-4 Video Processing Hardware","authors":"M. Hase, Kazushi Akie, Masaki Nobori, Keisuke Matsumoto","doi":"10.1109/ASPDAC.2007.358058","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.358058","url":null,"abstract":"This paper covers a multi-functional hardware intellectual property (IP) for the encoding and decoding of digital moving pictures with low power consumption. The IP is mainly intended for mobile products such as cellular phones, digital still cameras (DSCs), and digital video cameras (DVCs). It includes VC-1 functionality for Internet content plus AVC (H.264) functionality for digital television broadcasting and MPEG-4 functionality for TV telephony, and is capable of processing D1-sized moving pictures (720 pixels by 480 lines) in real time at an operating frequency of 54 MHz. In addition, original algorithms employed in the IP reduce power consumption by up to 22%.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134546367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xianfeng Li, Abhik Roychoudhury, T. Mitra, P. Mishra, Xu Cheng
{"title":"A Retargetable Software Timing Analyzer Using Architecture Description Language","authors":"Xianfeng Li, Abhik Roychoudhury, T. Mitra, P. Mishra, Xu Cheng","doi":"10.1109/ASPDAC.2007.358018","DOIUrl":"https://doi.org/10.1109/ASPDAC.2007.358018","url":null,"abstract":"Worst case execution time (WCET) is an essential input for performance and schedulability analysis of real-time systems. Static WCET analysis requires program path analysis and microarchitecture modeling. Despite almost two decades of research, WCET analysis has not enjoyed wide acceptance in industry. This is in part due to the difficulty in microarchitecture modeling of modern processors. Given the large number of embedded processors available in the market, retargetability of the WCET analysis framework is a serious issue. In this paper, we address it using architecture description language (ADL). Starting with the ADL of a target processor, the proposed framework automatically generates graph-based execution models to capture timing effects of instructions in the pipeline. This pipeline model coupled with parameterized models of cache and branch prediction lead to a WCET framework that is safe, accurate and retargetable.","PeriodicalId":362373,"journal":{"name":"2007 Asia and South Pacific Design Automation Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133707233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}