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ICM 2001 Proceedings. The 13th International Conference on Microelectronics.最新文献

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Fault location in distribution networks using clustering techniques 基于聚类技术的配电网故障定位
ICM 2001 Proceedings. The 13th International Conference on Microelectronics. Pub Date : 1900-01-01 DOI: 10.1109/ICM.2001.997521
M. Manar, S. Foda
{"title":"Fault location in distribution networks using clustering techniques","authors":"M. Manar, S. Foda","doi":"10.1109/ICM.2001.997521","DOIUrl":"https://doi.org/10.1109/ICM.2001.997521","url":null,"abstract":"This paper studies an existing 13.8 kilovolt distribution network which serves an oil production field spread over an area of approximately sixty kilometers square, in order to locate any fault that may occur anywhere in the network using fuzzy c-mean classification techniques. In addition, the paper introduces several methods for normalizing data and selecting the optimum number of clusters in order to classify data. Results and conclusions are given to indicate the feasibility of the suggested fault location method.","PeriodicalId":360389,"journal":{"name":"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126946793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
An accurate method for extracting the critical field in short channel NMOS devices 一种精确提取短信道NMOS器件临界场的方法
ICM 2001 Proceedings. The 13th International Conference on Microelectronics. Pub Date : 1900-01-01 DOI: 10.1109/ICM.2001.997488
Y. Amhouche, A. El abbassi, K. Rais, R. Rmaily
{"title":"An accurate method for extracting the critical field in short channel NMOS devices","authors":"Y. Amhouche, A. El abbassi, K. Rais, R. Rmaily","doi":"10.1109/ICM.2001.997488","DOIUrl":"https://doi.org/10.1109/ICM.2001.997488","url":null,"abstract":"In this paper, an accurate method for extracting the critical field Ec in short channel MOSFET's is presented. The principle of this method is based on the comparison between two models which give drain saturation voltage evolution against gate voltage Vd/sub sat/(Vg) continuously. The results obtained by this technique have shown better agreement with measurement data and have allow at the same time to determine the validity domain of Sodini's law.","PeriodicalId":360389,"journal":{"name":"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.","volume":"192 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120978405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fault diagnosis and fault localisation in integrated circuit by thermal method 热方法在集成电路故障诊断与定位中的应用
ICM 2001 Proceedings. The 13th International Conference on Microelectronics. Pub Date : 1900-01-01 DOI: 10.1109/ICM.2001.997652
P. Bratek, A. Kos
{"title":"Fault diagnosis and fault localisation in integrated circuit by thermal method","authors":"P. Bratek, A. Kos","doi":"10.1109/ICM.2001.997652","DOIUrl":"https://doi.org/10.1109/ICM.2001.997652","url":null,"abstract":"In the paper, a thermal testing method for integrated circuits (ICs) is presented. This method compares the real temperature field with the standard field, suitable for the specified energy state of the system. A method of temperature sensor placement strategy is presented as well. This placement method is proposed for fault diagnosis and fault localisation in ICs. An algorithm based on mutual dependencies of average temperatures of selected sub-areas of the IC in order to locate failure is described. Simulation results of the sensor placement strategy and fault diagnosis and localisation are presented. Statistical analyses of the yield of the testing method are shown.","PeriodicalId":360389,"journal":{"name":"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132182116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A fast hardware co-specification and co-simulation methodology integrated in a H/S co-design platform 一种集成在H/S协同设计平台中的快速硬件协同规范和协同仿真方法
ICM 2001 Proceedings. The 13th International Conference on Microelectronics. Pub Date : 1900-01-01 DOI: 10.1109/ICM.2001.997658
Y. Heneault, L. Filion, G. Bois, E. Aboulhamid
{"title":"A fast hardware co-specification and co-simulation methodology integrated in a H/S co-design platform","authors":"Y. Heneault, L. Filion, G. Bois, E. Aboulhamid","doi":"10.1109/ICM.2001.997658","DOIUrl":"https://doi.org/10.1109/ICM.2001.997658","url":null,"abstract":"This paper presents an approach to mix hardware models based on C++ library and HDL components (e.g. VHDL or Verilog) in the same design. The C++ software library is based on Cynlib from CynApps. The developing environment is integrated on a co-design tool called Picasso. The C foreign language interface of the well-known Modelsim simulator is used as a unified platform integration.","PeriodicalId":360389,"journal":{"name":"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122282349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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