2010 11th Latin American Test Workshop最新文献

Performance testing of distributed block-oriented storage over IP networks IP网络上分布式面向块存储的性能测试

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550375

P. Martinez-Julia, A. Gómez-Skarmeta

引用次数: 0

An evaluation of free/open source static analysis tools applied to embedded software 对应用于嵌入式软件的免费/开源静态分析工具的评估

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550368

L. Torri, Guilherme Fachini, Leonardo Steinfeld, Vesmar Camara, L. Carro, É. Cota

引用次数: 11

A method for improving the radiation tolerance of PIN photodiodes by optimization of n− layer thickness and light wavelength 一种通过优化n -层厚度和波长来提高PIN光电二极管辐射容忍度的方法

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550341

A. Cédola, M. Cappelletti, E. Y. Blancá

引用次数: 1

Functional test generation for DMA controllers DMA控制器的功能测试生成

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550334

M. Grosso, H. WilsonJ.Pérez, D. Ravotto, E. Sánchez, M. Reorda, J. Velasco-Medina

{"title":"Functional test generation for DMA controllers","authors":"M. Grosso, H. WilsonJ.Pérez, D. Ravotto, E. Sánchez, M. Reorda, J. Velasco-Medina","doi":"10.1109/LATW.2010.5550334","DOIUrl":"https://doi.org/10.1109/LATW.2010.5550334","url":null,"abstract":"Today's SoCs are composed of a high variety of modules, such as microprocessor cores, memories, peripherals, and customized blocks directly related to the targeted application. Testing a peripheral core embedded in a SoC requires two correlated phases: module configuration and module operation. The first one prepares the peripheral on the different operation modes, whereas, the second one is in charge of exciting the whole device and observing its behavior. Different testing strategies based on the execution of assembly programs have been proposed by the research community to test the embedded blocks in a SoC, however, testing highly embedded peripherals (e.g., DMA controllers) is still a challenging task, since their observability and controllability are even more reduced compared to peripherals devoted to I/O communication. In this paper we describe an approach to develop functional tests for DMA controllers embedded in SoCs that can first be used for design validation, and then exploited for testing, adding observability features. Preliminary experimental results demonstrating the method suitability are finally reported.","PeriodicalId":358177,"journal":{"name":"2010 11th Latin American Test Workshop","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131449556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

RF and Microwave production test requirements for advanced mixed-signal devices 先进混合信号器件的射频和微波生产测试要求

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550381

M. Mabrouk

引用次数: 1

Reliability of on-board computer for ITASAT university satellite ITASAT大学卫星星载计算机可靠性研究

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550367

E. Vinci, O. Saotome

{"title":"Reliability of on-board computer for ITASAT university satellite","authors":"E. Vinci, O. Saotome","doi":"10.1109/LATW.2010.5550367","DOIUrl":"https://doi.org/10.1109/LATW.2010.5550367","url":null,"abstract":"This paper presents a case study that aims to develop a hardware architecture for the computer to the ITASAT university satellite, based on fault-tolerant architecture and calculations of reliability. The on-board computer of a satellite, inserted into the on Board Management Subsystem, has functions of receiving, processing and distribution of commands to the subsystems and payload of the satellite; and acquiring, formatting, storage and transmission of telemetry from subsystems and payload. The main requirements of an on-board computer are high reliability, capability of real time processing, resistance to radiation, and minimizing power consumption, volume and mass. Increased reliability can be achieved by the fault tolerance technique, which is based on adding redundancy to the system, or the use of components with high value of individual reliability. In this work, hardware redundancy techniques are considered. First, a computer is designed and its reliability is calculated, for a mission of twenty-four months duration. Mission reliability goal is not attained in this calculation. In order to increase reliability, two types of fault tolerant redundant architectures are analyzed, with their respective reliabilities calculated for the same period of the mission.","PeriodicalId":358177,"journal":{"name":"2010 11th Latin American Test Workshop","volume":"27 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134543971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Embedded test and control of analogue/RF circuits using intelligent resources 嵌入式测试和控制模拟/射频电路使用智能资源

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550354

E. Simeu

{"title":"Embedded test and control of analogue/RF circuits using intelligent resources","authors":"E. Simeu","doi":"10.1109/LATW.2010.5550354","DOIUrl":"https://doi.org/10.1109/LATW.2010.5550354","url":null,"abstract":"The emergence and the fast development of distributed sensor networks associated with the popularisation of cellular phone handset portable has supported an explosive growth of wireless applications in the portable devices. Consequently radio frequency (RF) system and their increasing functional densities have progressed remarkably. Wireless integrated network sensors combine sensing, signal processing, decision capability, and wireless networking capability in a compact, low power system. Despite the rapid proliferation of sensor network applications and other devices incorporating wireless communication networks, there is no generic method for testing analogue and mixed signal (AMS) blocks (including analogue circuits, MEMS and RF) which are included in these devises. On the other hand, it is obvious that energy efficiency of RF transceivers is critical paramount for longer life in portable devices. Therefore, efficient energy consumption of RF power amplifiers (PAs) and RF low noise amplifiers (LNAs) are key components in wireless mobile battery – operated systems determine the total power consumption since they dominate the power consumption of the other component of the RF transceivers [1]. In this study, we propose a new approach of alternate test and adaptive control of power supply of AMS blocks based on the identification of some parameters of a behavioural model. A complete behavioural model of AMS block is built, including a model structure and a set of parameters. Using a population of circuits obtained by Monte Carlo simulation, a regression relationship is then built to link the system performance to the parameters of its behavioural model. A virtual performance measurement can thus be obtained from the identified parameters of the behavioural model of the current system. The estimated performances are then used either to make the pass / fail decision for test purpose or as virtual measurements for performance control of in order to optimize energy consumption. Figure 1 gives an overview of our approach.","PeriodicalId":358177,"journal":{"name":"2010 11th Latin American Test Workshop","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129847597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Reliability analysis of small delay defects in vias located in signal paths 信号通路上过孔小延迟缺陷的可靠性分析

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550366

Hector Villacorta, V. Champac, C. Hawkins, J. Segura

引用次数: 2

Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization 片上松弛振荡器在EMC标准测试或RFI敏感性表征下基于射频的故障注入分析的测试模式方法和策略

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550382

A. Olmos, A. V. Boas, Eduardo Ribeiro da Silva, José Carlos da Silva, R. Maltione

{"title":"Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization","authors":"A. Olmos, A. V. Boas, Eduardo Ribeiro da Silva, José Carlos da Silva, R. Maltione","doi":"10.1109/LATW.2010.5550382","DOIUrl":"https://doi.org/10.1109/LATW.2010.5550382","url":null,"abstract":"Nowadays some microcontroller clock circuits have been implemented using relaxation oscillators instead of quartz type approach to attend cost effective designs. The oscillator is compensated over temperature and power supply and trimming during device test phase adjusts the oscillation frequency on target to overcome process variations. In that way, the relaxation oscillator becomes competitive with regard to ceramic resonator options. However, robust applications as industrial, automotive and aero spatial, requires aggressive EMC tests reproducing the behavior in these environments. High levels of RF interference introduce frequency deviation, jitter or clock corruption causing severe faults on the application. This work discusses the impact of RF interference in relaxation oscillators proposing a strategy to implement test mode in microcontrollers and other complex SOCs, allowing yet characterization and fault debug. Theoretical analysis and experimental results with a silicon implementation are presented and discussed.","PeriodicalId":358177,"journal":{"name":"2010 11th Latin American Test Workshop","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121573008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Procedures and lab setup developed to test MIFARE based transportation devices compliance 为测试基于MIFARE的运输设备的合规性而开发的程序和实验室设置

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550335

F. Haim, Andrés Bergeret, A. González, Ignacio Benavente

引用次数: 0