{"title":"RF and Microwave production test requirements for advanced mixed-signal devices","authors":"M. Mabrouk","doi":"10.1109/LATW.2010.5550381","DOIUrl":null,"url":null,"abstract":"Basic requirements and rules of Test and Measurement in RF and Microwaves, as well for characterization on benches as for high volume production using Automatic Test Equipments are described for helping today's test engineers to develop their own customized “turn-key” test solutions. Some examples of RF and microwave tests for Low Noise Amplifier and Mixer that are the devices largely used in Wireless applications are showed. The devices were characterized on benches and automatically tested using ATE testers.","PeriodicalId":358177,"journal":{"name":"2010 11th Latin American Test Workshop","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th Latin American Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2010.5550381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Basic requirements and rules of Test and Measurement in RF and Microwaves, as well for characterization on benches as for high volume production using Automatic Test Equipments are described for helping today's test engineers to develop their own customized “turn-key” test solutions. Some examples of RF and microwave tests for Low Noise Amplifier and Mixer that are the devices largely used in Wireless applications are showed. The devices were characterized on benches and automatically tested using ATE testers.