2017 IEEE Holm Conference on Electrical Contacts最新文献_第2页

Multi-physics modeling and Au-Ni/Rh coating assessment for ITER ion cyclotron resonance heating radio-frequency sliding contacts ITER离子回旋共振加热射频滑动触点的多物理场建模和Au-Ni/Rh涂层评估

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088059

Z. Chen, J. Hillairet, V. Turq, Y. Song, R. Laloo, K. Vulliez, J. Bernard, Q. Yang, G. Lombard, C. Hernandez, L. Ferreira, F. Fesquet, P. Mollard, R. Volpe, F. Ferlay

{"title":"Multi-physics modeling and Au-Ni/Rh coating assessment for ITER ion cyclotron resonance heating radio-frequency sliding contacts","authors":"Z. Chen, J. Hillairet, V. Turq, Y. Song, R. Laloo, K. Vulliez, J. Bernard, Q. Yang, G. Lombard, C. Hernandez, L. Ferreira, F. Fesquet, P. Mollard, R. Volpe, F. Ferlay","doi":"10.1109/HOLM.2017.8088059","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088059","url":null,"abstract":"ITER is a large scale fusion experimental device under construction in Cadarache (France) intended to prove the viability of fusion as an energy source. Ion Cyclotron Resonance Heating (ICRH) system is one of the three heating systems which will supply total heating power of 20 MW (40-55 MHz) up to one hour of operation. Radio-Frequency (RF) contacts are integrated within the antennas for assembly and operation considerations, which will face extremely harsh service conditions, including neutron irradiation, heavy electrical loads (RF current reaches up to 2 kA with a linear current density of 4.8 kA/m) and high thermal loads. Based on the thermal analysis, the contact resistance is expected to be lower than 7 mΩ to keep the maximum temperature on the louvers lower than 250°C. Few weeks of vacuum (∼10−5 Pa) baking at 250°C for outgassing is expected before each plasma experimental campaign, under which the RF contact materials' mechanical properties change and diffusion phenomena between different materials are inevitable. CuCrZr and 316L are proper base materials for ITER RF contact louvers and conductors respectively. In order to improve the RF contact's wear and corrosion resistivity as well as to reduce the contact resistance, Au-Ni and Rh functional layers could be electroplated on CuCrZr and 316L accordingly. The application of the Au-Ni/Rh coating pairs is assessed through the thermal ageing and diffusion tests. Wear and electrical contact performances of the Au-Ni/Rh pairs are deeply studied on a dedicated tribometer operated at ITER relevant conditions.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127115458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

A series arc fault location algorithm based on an impedance method for a domestic AC system 一种基于阻抗法的串联电弧故障定位算法

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088105

E. Calderon, P. Schweitzer, S. Weber

引用次数: 3

Measuring arc temperature distribution and its time-evolution based on relative intensity method 基于相对强度法测量电弧温度分布及其时间演化

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088068

Xue Zhou, Yong Zhang, G. Zhai

引用次数: 0

The impact of short circuits on contact elements in high power applications 大功率应用中短路对接触元件的影响

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088061

T. Israel, M. Gatzsche, Stephan Schlegel, S. Grossmann, Tom Kufner, G. Freudiger

{"title":"The impact of short circuits on contact elements in high power applications","authors":"T. Israel, M. Gatzsche, Stephan Schlegel, S. Grossmann, Tom Kufner, G. Freudiger","doi":"10.1109/HOLM.2017.8088061","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088061","url":null,"abstract":"Electrical equipment has to carry the rated normal current and short time withstand current. As shown in previous publications, the voltage-temperature relation allows calculating the temperature of contact elements and connectors for steady- state operating points. In the case of transient electric-thermal load, a finite-element analysis (FEA) is required to calculate the time-dependent distribution of the temperature. This FEA has to be verified for transient load. Therefore a test-environment has been built in which contact elements can be loaded with AC short- circuits. The temperature of the contact system can be measured via infrared thermography during the transient event, so the calculation can be validated quantitatively. Additionally, the benchmark parameters joint resistance and contact force before and after short circuit are discussed. Measurements show that the contact materials soften due to the transient heating. This reduces the electric and thermal contact resistances and affects heat generation as well as heat distribution. Hence, the softening of contact materials was implemented in the FEA. This publication describes the enhanced and validated FEA for transient thermal stress of a high power contact system with contact elements. The performance of the contact elements during and after short circuits are discussed theoretically, via calculation and compared to measurements.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129774226","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Glowing connections in DC circuits 直流电路中的发光连接

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088098

J. Shea

引用次数: 3

Influences of external magnetic field application and increased contact opening speeds on break arc duration characteristics of AgSnO2 contacts in DC inductive load conditions 外加磁场和增加触点开断速度对直流电感负载条件下AgSnO2触点断弧持续时间特性的影响

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088086

M. Hasegawa, S. Tokumitsu

引用次数: 4

The role of the arc flux and joule heating in the erosion of electrical contacts 电弧通量和焦耳加热在电触点腐蚀中的作用

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088102

S. Kharin, M. Sarsengeldin

引用次数: 0

New LITESURF plating for the mitigation of whisker risks in press-fit applications 新型LITESURF电镀，用于减轻压合应用中的晶须风险

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088075

E. R. Crandall, F. Schabert, H. Schmidt, M. Bleicher, Thomas Fili, Walter Fischer, Claus Borhauer, S. Thoss, J. Villarreal, Bart Kerckhof

{"title":"New LITESURF plating for the mitigation of whisker risks in press-fit applications","authors":"E. R. Crandall, F. Schabert, H. Schmidt, M. Bleicher, Thomas Fili, Walter Fischer, Claus Borhauer, S. Thoss, J. Villarreal, Bart Kerckhof","doi":"10.1109/HOLM.2017.8088075","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088075","url":null,"abstract":"Due to restrictions on lead usage often resulting in the use of pure tin deposits, coupled with global miniaturization, the unpredictable risks of Sn whisker growth rises, especially in highly stressed coating applications. The ability to prevent whisker growth is particularly important for the growing implementations of solderless press-fit pin connections, where although very beneficial, produce high stress gradient conditions on the compliant pin's coating, leading to higher risks of whisker induced failures. Therefore, TE Connectivity has developed a new production level tin-whisker free technology through the application of an electroplated Bismuth (Bi) based deposit (LITESURF), tailored for reliable press-fit pin connections with the ability to accommodate for further miniaturization trends. In this work we discuss the properties of LITESURF plating and its universal use in various PCBs (iSn, iAg and OSP) along with how it is a promising tin alternative for press-fit applications, which can reduce the risk of whisker growth related failures by orders of magnitude.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"469 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122180686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Off line arc current detection and active control of pantograph-catenary system 受电弓-接触网系统的离线电弧电流检测与主动控制

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088085

Ziqi Nie, Zhiling Ren, D. Lin, G. Zhang

{"title":"Off line arc current detection and active control of pantograph-catenary system","authors":"Ziqi Nie, Zhiling Ren, D. Lin, G. Zhang","doi":"10.1109/HOLM.2017.8088085","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088085","url":null,"abstract":"The arc simulation test machine is developed, and the off-line experiments of pantograph-catenary system are carried out under different conditions. The total harmonic distortion rate of the contact current is used to characterize the transmission electromagnetic noise characteristics of the pantograph-catenary system, which concluded that the arc seriously affect the quality of the current, and the active control of the pantograph can ensure the pantograph-catenary system to maintain a relatively small wear rate and a high current carrying quality. The improved Hilbert-Huang transform(HHT) is used to analyzed the time-frequency characteristic of arc current. The results show that the arc is rich in harmonics, and as the change of current, there are different changes in amplitude and frequency. According to the two degree of freedom model of pantograph-catenary system, the feedback control law is designed by using back stepping control to solve the tracking problem of real-time contact force of pantograph-catenary system, and the virtual control stabilization function is analyzed. Simulation results show that the proposed control strategy can effectively solve the tracking problem of optimal contact pressure, and the tracking error of the system is globally asymptotically stable.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127070402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

The effect of the axial magnetic field structure on the threshold welding current for closed axial magnetic field vacuum interrupter contacts 轴向磁场结构对闭合轴向磁场真空灭流器触头阈值焊接电流的影响

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088096

P. Slade, E. Taylor, A. Lawall

{"title":"The effect of the axial magnetic field structure on the threshold welding current for closed axial magnetic field vacuum interrupter contacts","authors":"P. Slade, E. Taylor, A. Lawall","doi":"10.1109/HOLM.2017.8088096","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088096","url":null,"abstract":"There are two designs of large area, vacuum interrupter contacts: the transverse magnetic field (TMF) contact and the axial magnetic field (AMF) contact. These contacts are required to perform a wide variety of roles within vacuum circuit breakers. One duty is to pass short-circuit currents with the vacuum interrupters' contacts closed for a period of time (1 to 4 seconds), after which the circuit breaker's mechanism must be able to open the contacts. Thus, the possibility of contact welding must be minimized. The flow of current through practical contacts generates a repulsive blow-off force, which has to be balanced by a closing force from the circuit breaker mechanism plus the force from atmospheric pressure acting on the vacuum interrupter's bellows. The axial magnetic field (AMF) vacuum interrupters have an additional attractive force because of the parallel currents flowing in the two AMF coils behind the contacts' faces. This force is calculated using three- dimensional finite element analysis (FEA) for three practical AMF designs using a contact diameter of 62 mm and a current of 31.5 kA (45.5 kA peak). The extra attractive forces are then combined with the other forces acting on the closed vacuum interrupter contacts to calculate the threshold welding current: the current above which the contacts will form a weld. Calculations of the total closing force compares the difference in the threshold welding current between the three AMF contact designs.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126652618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3