2017 IEEE Holm Conference on Electrical Contacts最新文献_第3页

Thermo-mechanical stresses within switching contact systems after arcing events 电弧事件后开关接触系统内的热机械应力

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088077

Timo Mützel, D. Ma, F. Roters, D. Raabe

引用次数: 0

Failure dependent progression of contact resistance in thermal-shock testing of spring-clip contacts 弹簧夹触头热冲击试验中接触电阻的失效相关进展

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088081

M. Friedlein, M. Spahr, R. Suess-Wolf, J. Franke

{"title":"Failure dependent progression of contact resistance in thermal-shock testing of spring-clip contacts","authors":"M. Friedlein, M. Spahr, R. Suess-Wolf, J. Franke","doi":"10.1109/HOLM.2017.8088081","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088081","url":null,"abstract":"Through ever changing terms and regulations on fuel consumption and emissions, weight becomes the number one concern of car manufacturers. Meeting those new regulations and the customer's desire for more options and variations is only possible without adding more weight by changing the wiring harnesses' technology. One solution to face this problem can be found by the application of flexible flat cables (FFCs) instead of common round cable wire systems. For a holistic approach, it is important not only to establish automated ways of cable installation, but also methods of automatically contacting components. Therefore, a new direct contacting method was developed at the Institute for Factory Automation and Production Systems (FAPS). The innovative contacting method enables to contact an automatically mounted one side accessible FFC with kinematic systems of industrial robots in an automated way. However, before new technologies can be applied to serial production, car manufacturers demand standardized climatic tests. In this paper, a correlation was discovered between the progression of contact resistance and failure mechanisms during thermal shock testing. Furthermore, an influence of different peak temperatures and materials was identified and the results were verified via SEM micrographs.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124731355","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Influence of contact materials and opening velocity on various characteristics of DC high voltage arc 触点材料和开弧速度对直流高压电弧各项特性的影响

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088088

Kiyoshi Yoshida, K. Sawa, Kenji Suzuki, K. Takaya

引用次数: 8

Experimental verification/comparison between standard sphere against flat and a new wave structured contact surface topography developed using a numerical contact model; as applied to an existing MQS contact design 采用数值接触模型建立的一种新的波状结构接触表面形貌与标准球面对平面的实验验证/比较适用于现有的MQS触点设计

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088101

M. Leidner, M. Brunner, S. Stotz, M. Myers, H. Schmidt, S. Thoss

{"title":"Experimental verification/comparison between standard sphere against flat and a new wave structured contact surface topography developed using a numerical contact model; as applied to an existing MQS contact design","authors":"M. Leidner, M. Brunner, S. Stotz, M. Myers, H. Schmidt, S. Thoss","doi":"10.1109/HOLM.2017.8088101","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088101","url":null,"abstract":"By using a Papkovich Neuber potential based 3D numerical contact modeling method [1], it has been shown that using a wave structured contact surface topography can reduce contact interface resistance by a factor of 2 at a given normal load. It has been proposed that a wave structured topography can be used to reduce contact normal force as a method to reduce connector mating forces. Since there is more and more pressure to manage/minimize connector engagement forces as advancing technology calls for greater connector circuit/pin counts, using these wave structured topographies represents a way that these demands could be met. A comparative study will show that contacts with wave structured contact surface topographies can meet and exceed the mechanical and electrical performance of similar standard sphere against flat contact interfaces. By applying a wave structure to an existing standard ‘sphere on flat' contact interface design and subsequently reducing the contact normal force by 50% to cut the contact engagement force in half; the current carrying capability of a contact design still increased by 16% and the specified vibration stability requirement for the contacts was still met. If this is done with no normal force reduction, a 22% increase in interface current carrying capacity can be achieved with a vibration stability superior to the standard sphere against flat surfaced contact design. The functionally evaluated electrical characteristics of such wave structured and standard contact interfaces are in agreement with the numerical predictions.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"410 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124363182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Research on delamination detection sensitivity of ultrasonic non-destructive testing technology for electrical contact 电触点超声无损检测技术分层检测灵敏度研究

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088079

Ye Lianhui, Wang Yuanzhong, Liu Benlu, L. Nan, Qiu Kui

引用次数: 0

Investigation on RF connector degradation using time domain reflectometry 时域反射法研究射频连接器退化

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088078

Qingya Li, Rui Ji, Jinchun Gao, G. Flowers, G. Xie, Weibin Ye

{"title":"Investigation on RF connector degradation using time domain reflectometry","authors":"Qingya Li, Rui Ji, Jinchun Gao, G. Flowers, G. Xie, Weibin Ye","doi":"10.1109/HOLM.2017.8088078","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088078","url":null,"abstract":"Radio Frequency (RF) connectors play an important part in electronic and communication systems. They are generally subjected to degradation in the contact interface during their service life, which affects signal integrity and communication quality of the systems. In the present work, the characteristics of RF connector degradation were theoretically analyzed and experimentally investigated using Time Domain Reflectometry (TDR). An accelerated test was designed to obtain the degraded connector samples. A series of experiments were conducted to measure the reflected voltages using a Network Analyzer for time domain analysis. Then, the reflection coefficients and load impedance were determined and the location of the degraded contact interface was identified. Based on classical electrical contact theory, transmission lines theory, and experimental results, an equivalent circuit model was developed and the degradation mechanism analyzed. The results showed that inductive characteristics increase with increase of the degradation. As the degradation increases beyond a certain level, the connector exhibits a more capacitive characteristic.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"149 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129096728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Development of an arcless DC circuit break using a mechanical contact and a semiconductor device 采用机械触点和半导体器件的无弧直流断路器的研制

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088095

S. Zen, Tatsuya Hayakawa, K. Nakayama, K. Yasuoka

{"title":"Development of an arcless DC circuit break using a mechanical contact and a semiconductor device","authors":"S. Zen, Tatsuya Hayakawa, K. Nakayama, K. Yasuoka","doi":"10.1109/HOLM.2017.8088095","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088095","url":null,"abstract":"Direct current circuit breakers (DCCBs) have receive considerable attention due to their increasing demand in DC power transmission and distributed generation. A hybrid DCCB comprising a mechanical contact, semiconductor device (SiC- MOSFET), and metal oxide varistor offers a small contact resistance when the mechanical contact is closed. After opening the mechanical contact, the contact voltage increases because a molten metal -bridge is formed between the contacts as a result of joule heating. This molten-bridge voltage promotes the current commutation from the mechanical contact to the SiC-MOSFET. After the current commutation is completed, a fast current interruption can be achieved by turning off the SiC-MOSFET. Therefore, the hybrid DCCB can achieve both a small contact resistance and a fast current interruption. In our previous papers, an arcless commutation was reported at the initial stage of the hybrid DCCB opening under a special condition. In this report, higher molten-bridge voltage was obtained using 2-pole contacts connected in series and using high-boiling metals. The higher molten-bridge voltage enabled the hybrid DCCB to interrupt larger current without any arc discharge. Finally, we performed DC current (300 V-150 A) interruption experiment, and succeeded in obtaining arcless current interruption with a probability of 100%.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133699101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Temperature rise of canted spring contacts during fault current 故障电流时倾斜弹簧触点的温升

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088100

B. Novák, L. Szabó

引用次数: 1

Feature analysis in time-domain and fault diagnosis of series arc fault 串联电弧故障的时域特征分析与故障诊断

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088104

Yanli Liu, Fengyi Guo, Zhiling Ren, Peilong Wang, Tuannghia Nguyen, Jia Zheng, Xirui Zhang

引用次数: 7

Effect of fretting wear of connectors regarding phase noise of RF signal: Influence of sliding amplitude and gold coating thickness 连接器微动磨损对射频信号相位噪声的影响:滑动幅值和金镀层厚度的影响

2017 IEEE Holm Conference on Electrical Contacts Pub Date : 2017-09-01 DOI: 10.1109/HOLM.2017.8088058

R. Enquebecq, O. Graton, S. Fouvry, E. Rubiola, J. Legrand, L. Petit

{"title":"Effect of fretting wear of connectors regarding phase noise of RF signal: Influence of sliding amplitude and gold coating thickness","authors":"R. Enquebecq, O. Graton, S. Fouvry, E. Rubiola, J. Legrand, L. Petit","doi":"10.1109/HOLM.2017.8088058","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088058","url":null,"abstract":"High technology domains such as aerospace, aviation and defense require a reliable transmission of RF signals. In these applications, RF connectors are exposed to severe environmental vibrations and are subjected to fretting wear damages. Former investigations on real connectors have shown that fretting wear leads to a dramatic increase of the DC electrical contact resistance (ECR), degrades RF microwave transmission and generates a significant additive phase noise. The present study aims to formalize the correlation between wear mechanisms of top gold layers and the evolution of electrical properties in DC and RF. An original fretting test bench was specifically developed to study a homogeneous double sphere-plan contact under gross-slip regime for different fretting loadings and different conductive films thickness. During the test DC ECR and phase noise are measured simultaneously. To quantify the fretting RF lifetime of the contact, a dedicated phase noise endurance criterion is used (Lm, th = −120 dBC/Hz). This phase noise threshold is shown to correspond to a ΔRth = 0.4 Ω DC contact resistance variation and was related to a quasi-full elimination of gold layer from the fretted interfaces. This experimental investigation suggests that fretting cycle endurance Nc (RF and DC) decreases asymptotically as a function of the sliding amplitude őg∗ but increases exponentially with the coating thickness e. Elemental analysis and 3d profile measurement demonstrate that the evolution of the electrical properties of the contact is driven by the top gold layer wear rate and the trapping of subsurface oxide debris in the interface induced by the fretting wear of NiP interlayer and CuSn4 substrate.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130753760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1