{"title":"Fretting possibility in slip rings: A review","authors":"G. Dorsey","doi":"10.1109/HOLM.2017.8088070","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088070","url":null,"abstract":"A transverse vibration and/or low amplitude oscillation (dither) environment subjects sliding electrical contacts to a unique fretting environment that traditionally has not been considered in the literature. The latest advancements in nanotribology and single asperity contact has opened some interesting lines of consideration that should be reviewed in sliding contact applications with transverse vibration loading or low amplitude oscillation movement.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121051513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Haoyue Yang, T. Stegeman, Rui Ji, Michael Hamilton, Jinchun Gao, G. Flowers
{"title":"High frequency signal transmission across contact interface subjected to vibration induced fretting corrosion","authors":"Haoyue Yang, T. Stegeman, Rui Ji, Michael Hamilton, Jinchun Gao, G. Flowers","doi":"10.1109/HOLM.2017.8088069","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088069","url":null,"abstract":"Fretting corrosion is considered to be one of the most common failure mechanisms in electrical contacts for many applications. Micro-scale motion at the contact surface is the major driver of fretting degradation and produces material displacement and transfer. As a result, the buildup of an insulating oxide layer at the contact interface leads to a rapid substantial increase in contact resistance, which is the most common measure for contact performance. However, with regard to the high frequency applications, impedance rather than simply resistance is a more comprehensive and descriptive measure of contact performance. Prior work by the authors has investigated the capacitive characteristics of impedance in degraded contacts, with the observed behavior modeled as resistor capacitor network in parallel. Correlation of the experimental results with simulation studies demonstrated a decreasing level of the contact capacitance as fretting degradation proceeds. In the present work, an experimental study was performed using a simplified connector configuration in order to investigate the impact of contact degradation on high frequency signal integrity. A network model incorporating transmission line and capacitive coupling parameters was developed which relates the contact impedance to the signal loss and distortion. The results are presented and discussed. A high level of consistency between this model and the experimental data was demonstrated.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125420673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Buffo, J. Martin, S. Saadate, J. Andrea, N. Dumoulin, E. Guillard
{"title":"Study of the electric arc in DC contactors: Modeling, simulation and experimental validation","authors":"M. Buffo, J. Martin, S. Saadate, J. Andrea, N. Dumoulin, E. Guillard","doi":"10.1109/HOLM.2017.8088057","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088057","url":null,"abstract":"This paper presents a method to simulate the current and voltage of an electric arc initiated at the contact's opening in a contactor. Based on a simplified model of the electric arc and also on the dynamics of the contacts during the opening, this method allows to simulate the arc ignition as well as the arc extinction. This study is based on the hypothesis that the arc dynamic is much faster than the opening speed. This hypothesis allows us to use a static arc equation. The arc is described as a nonlinear resistance, which is dependant of the gap between the contacts. The parameters of the gap's equation are approximated by an analysis of the video obtained with a high speed camera during the opening of the contactor. The parameters of this arc's model are approximated by experimental tests on a DC contactor with AgSnO2 contacts. A fitting method is developed to minimize the error introduced due to the non-linearity when the static arc parameters are fitted to the static arc equation. Simulation results are compared with experimental data to demonstrate the validity of the suggested method.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130876115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of a New Ag/SnO2 contact material in AC-contactors","authors":"H. Cinaroglu, V. Behrens, T. Honig","doi":"10.1109/HOLM.2017.8088089","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088089","url":null,"abstract":"This paper reports about the physical and application properties of a new silver/tin oxide contact material with 14 wt. % oxides. The investigations presented comprise tests carried out in several types of commercially available contactors under conditions representing utilization category AC3 (250 kW (380-400V) and 400 kW (380-400V)) as well as AC4 (75 kW (380- 400V)). The focus of these tests is on electrical service life and over temperature behavior. Reference material is a conventional commercially used silver/tin oxide contact material containing 14 wt. % oxides (standard material). While AC3 and AC4 service life results show a certain increase the resistance against welding under short circuit conditions is substantially improved. These improvements in switching performance observed are discussed on the basis of physical and metallurgical processes caused by the switching arc in the contact material.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"81 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133383166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Applications of laser arc image system on imaging the arcing behavior of electrical contacts","authors":"Hai-Ching Chen","doi":"10.1109/HOLM.2017.8088066","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088066","url":null,"abstract":"The Laser Arc Image System (LAIS) provides unprecedented real-time, frame by frame visualization into the micro-second dynamic arc processes consisting of the heat and mass transfer between the electric contacts. These resulting high-speed images and data from the LAIS experiments serve as the empirical analytical tools for understanding the instantaneous arcing behavior, a phenomenon that have only thus far been described and predicted in mathematical models. The experiments in this study showcase the various phases of the arcing behavior that occur inside a molded case circuit breaker (MCCB) to attain the following objectives of the characteristic arc behavior during the contact opening in air, arc process within gaseous pressure, and re-ignition development.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"3 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133293505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effects of lubricant oil on sliding contact phenomena in carbon brush-slip ring system","authors":"Yuki Amada, K. Sawa, T. Ueno","doi":"10.1109/HOLM.2017.8088083","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088083","url":null,"abstract":"Sliding contact systems are widely used as a method of exchanging electrical power and/or signal between static and moving components. Considerable challenges remain regarding the need for improving the service life and reliability of these systems. The sliding characteristics of C-brushes and Cu-rings have been thoroughly investigated; however, lubricated C-brush and Cu- sliding contact systems have received comparatively little attention. In this work lubricants are shown to influence contact resistance of slip ring-brush system.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129310646","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Meyyappan, Qifeng Wu, M. Vujosevic, C. Hill, Ryan Parrott
{"title":"Reliability test induced failures vs field performance: Contact fretting perspective","authors":"K. Meyyappan, Qifeng Wu, M. Vujosevic, C. Hill, Ryan Parrott","doi":"10.1109/HOLM.2017.8088071","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088071","url":null,"abstract":"Connectors, based on the applications, can be exposed to a wide variety of reliability risks. To ensure products meet reliability requirements, qualifications tests are performed in laboratory settings. These tests are accelerated to meet the time-to-market requirements. Incorrect accelerated reliability models can lead to inaccurate field reliability risk assessment. Additionally, a chosen test can generate different failure modes, which are unlikely to be accelerated the same amount in the laboratory settings. In this paper, the authors evaluate some of the existing test methods and requirements vs. actual field vibration data for vibration induced contact fretting. The reliability model for contact fretting is based on a multiscale finite element approach. This model is used to evaluate contact micromotion from the standards based test methods that cover operational vibration in automotive electronics and non- operational packaged shipping vibration. The same model is then used to study contact micromotion in actual use condition. Intent of this exercise is to validate the appropriateness of standards based test in reflecting field reliability risks from a contact fretting perspective.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122349552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Alexander Ramonat, Stephan Schlegel, S. Grossmann, M. Kudoke
{"title":"Press- and shrink-fit connections with cylindrical aluminum conductors for high-current applications — Contact- and long-term behavior depending on mechanical parameters","authors":"Alexander Ramonat, Stephan Schlegel, S. Grossmann, M. Kudoke","doi":"10.1109/HOLM.2017.8088099","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088099","url":null,"abstract":"In Gas Insulated Switchgears and Gas Insulated Lines, cylindrical aluminum conductors are used for transportation of energy. To connect the conductors with other parts of the system, separable connections with contact elements are the common and most used solution. In many cases, the separable connections can be replaced with permanent connections in order to reduce costs, operating power losses and increase the reliability, especially if short circuit currents occur. To set up these permanent connections, technologies like the press- and shrink-fit are investigated. Based on the preliminary investigations presented in 2015 a broad variety of connections were established with different interferences, grooved and knurled as well as silver-plated contact surfaces to allow for statistic evaluations. The contact and long-term behavior of the connections are investigated with oven-experiments as well as under current load for a period of more than 10,000 h. Mechanical finite element models of the press- and shrink-fit connections are set up to investigate the resulting contact force as well as the mechanical stress distribution in the contact area. Findings are compared to other common connections, e.g. joints with busbars. As a result, specific recommendations for construction are described and the joining technologies are compared with conventional plug-in connections.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125150597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Temperature characteristics of sliding friction pair under high-speed and strong-current conditions","authors":"Zhiyong Wang, Fengyi Guo, Shuai Liu, Bilguun Baatar, Yuting Wang, Haihong Liang","doi":"10.1109/HOLM.2017.8088084","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088084","url":null,"abstract":"To reduce the influence of temperature distribution of pantograph-catenary system on the electrical contact characteristics, a temperature field simulation model was established with COMSOL Multiphysics software. The validity of the model was verified with temperature experiments. Both thermal time constant and steady temperature rise of contact wire were simulated under flexible contact pressure conditions. The thermal time constant decreases gradually and the steady temperature rise firstly decreases then increases with the increase of sliding speed. The thermal time constant are kept constant and steady temperature rise changes slightly with the increase of contact current. When sliding speed and contact current are kept constant, both the thermal time constant and steady temperature rise under flexible contact pressure conditions are smaller than that of under rigid contact pressure conditions. The transient temperature field was also analyzed and the high temperature trailing phenomenon was found and discussed. The conclusions can be used to further research the temperature characteristics of pantograph-catenary system.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124191702","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Kubota, K. Nakaya, T. Tamagawa, H. Mori, T. Nishimura, T. Isobe, Y. Ito, T. Shimada, T. Kondo
{"title":"The effect of the nickel underplate on the heat resisting properties of silver plated copper alloy contacts","authors":"K. Kubota, K. Nakaya, T. Tamagawa, H. Mori, T. Nishimura, T. Isobe, Y. Ito, T. Shimada, T. Kondo","doi":"10.1109/HOLM.2017.8088076","DOIUrl":"https://doi.org/10.1109/HOLM.2017.8088076","url":null,"abstract":"Heat resisting properties of Ag plated copper alloy contacts with Ni underplate were investigated by electron backscatter diffraction (EBSD), scanning transmission electron microscope (STEM), X-ray photoelectron spectroscopy (XPS) and contact resistance measurements. Ni underplate effectively prevented copper diffusion to the Ag surface from the substrate during 200°C heating, and the prevention effect saturated in 0.25 μm or more of the thickness. Ni was not detected in the Ag surface after heating at 200°C for 500 h. From the observation with STEM, it was found that Cu mainly diffused through grain boundaries of Ni and to the Ag surface. Decreasing the density of grain boundaries in Ni is possible to prevent diffusion of Cu, even the thickness of the Ni underplate is 0.1 μm.","PeriodicalId":354484,"journal":{"name":"2017 IEEE Holm Conference on Electrical Contacts","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121207871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}