27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.最新文献

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Quality management and workflow control in printed circuit board production at the TU Budapest 布达佩斯工业大学印刷电路板生产的质量管理和工作流程控制
P. Martinek
{"title":"Quality management and workflow control in printed circuit board production at the TU Budapest","authors":"P. Martinek","doi":"10.1109/ISSE.2004.1490433","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490433","url":null,"abstract":"Production of printed circuit boards (PCBs) is a very complicated process. There are many checkpoints and phases during the whole production, where application of quality management functions is necessary and the occurrence of faults is rather high. Following the path of a faultless work piece can be easy, but it is more difficult if a defect occurs at a given checkpoint. The appropriate action should be determined: the piece can be discarded or repaired. Investigating how repairing influences the quality of the final product is also required. Modeling of the process helps in making these decisions and gives the solution for the given worker, who is not even aware of printed circuit production technology and its planning. This paper presents a multi-leveled process model of printed circuit production. The model is created with the Architecture of Integrated Systems (ARIS) tool.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130546188","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Electronic packing for control and management of air traffic 空中交通管制和管理用电子包装
P. Stoyanov, M. Mihov, G. Georgiev
{"title":"Electronic packing for control and management of air traffic","authors":"P. Stoyanov, M. Mihov, G. Georgiev","doi":"10.1109/ISSE.2004.1490881","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490881","url":null,"abstract":"The paper describes results from research and development of the system for integration of civil and military flight data plans. This system is designed for the Air Sovereignty Operational Center of Bulgaria. In the paper the aim and main tasks of the system are described. The structural diagram of the system is presented. It is proposed were to place its peripheral and central modules at the territory of Bulgaria. The laboratory model of the system is developed. The preliminary tests are successful.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130068474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PCB integrated waveguides - launching light into highly multi mode structures PCB集成波导-将光发射到高度多模结构中
M. Duzynski, R. Rieske, K. Wolter, S. Patela
{"title":"PCB integrated waveguides - launching light into highly multi mode structures","authors":"M. Duzynski, R. Rieske, K. Wolter, S. Patela","doi":"10.1109/ISSE.2004.1490400","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490400","url":null,"abstract":"One future solution for overcoming the growing gap between the internal and external clock rates of today's integrated circuits lies undoubtedly in using optical interconnection technology on the PCB level. The requirements for PCB integration call for structural dimensions which enable multi mode transmission only. Up to now, the theoretical basis for the simulation of highly multi mode waveguides is still developing. However, the launching condition strongly influences the mode distribution. This is the reason why an empiric attempt to characterize the waveguide's light guiding properties was performed. For quality assessment of integrated waveguides, a computer controlled set-up for attenuation measurement was realized. The evaluation was carried out on an example of the \"waveguide-in-copper\" technology, The respective technology yields PCB integrated polymer waveguides. The paper analyzes the particularities of highly multi-mode structures in principle. By means of preliminary measurements, the effect of different coupling conditions on the mode distribution is discussed. Furthermore, the influence of changes in mode distribution on power transmission is presented.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"6 11","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120969838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Thin metal oxide films for application in nanoscale devices 纳米级器件中应用的金属氧化物薄膜
P. Vitanov, A. Harizanova, T. Ivanova
{"title":"Thin metal oxide films for application in nanoscale devices","authors":"P. Vitanov, A. Harizanova, T. Ivanova","doi":"10.1109/ISSE.2004.1490429","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490429","url":null,"abstract":"To scale MOS transistors beyond 100 nm, it is imperative to find a dielectric of high permittivity (high-k dielectric) to replace the current SiO/sub 2/ as a gate insulator. In principle, a high dielectric can deliver an equivalent SiO/sub 2/ thickness of 1 nm with a greater physical thickness (20 nm if k=80) and, hence lower leakage current. Realizing the promise of high-k dielectrics in the ULSI technology is an enormously challenging task. There are several classes of dielectric, such as oxides and fluorides. The simplest such oxides have one metallic element, e.g. HfO/sub 2/, ZrO/sub 2/, Y/sub 2/O/sub 3/ with rare earth metals. Their dielectric constant range is from 10-30. More complex such oxides have two different metallic elements such as BaTiO/sub 3/ and SrTiO/sub 3/. They can form solid-state solutions with each other at all ratios, because of their identical crystal structures. That is why thin films of barium titanate (BTO) and barium strontium titanate (BSTO) of a permittivity in the range of 100-400 and greater specific capacitance, have emerged as a leading contender as a gate dielectric for sub - 0.1 mm MOS transistors. In this study results are reported of the structural and dielectric properties of several thin films prepared by the sol-gel method. The electrical properties are investigated on MIS structures and the results are related to the effect of reaction with the silicon substrate upon thermal annealing.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127078519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Finite state machines and their applications in software for industrial control 有限状态机及其在工业控制软件中的应用
A. Drumea, C. Popescu
{"title":"Finite state machines and their applications in software for industrial control","authors":"A. Drumea, C. Popescu","doi":"10.1109/ISSE.2004.1490370","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490370","url":null,"abstract":"Finite state machines (FSMs) are a common presence in digital circuit design. However, they can be very useful also for the software developer. Actual operating systems and application software are event-based and communication issues play a big role; these fields can be more easily handled with software based on finite state machines - software that is simpler and easier to understand, debug and modify. Embedded systems' software can also benefit from state machines because of their efficient way of using the limited resources of the system. The paper presents some basic concepts of finite state machines, some typical applications, with focus on Web technologies (modem control, FTP - File Transfer Protocol, remote access via Telnet console) and some implementation issues - programming finite state machines in Delphi for Windows, in microcontroller assembly language and C. Latest trends are also analyzed - the hardware implementation of state machines in silicon, like the new Texas Instruments MSP430 series of low power microcontrollers. These electronic packages offer some features like reduced power consumption, a single chip solution for complex applications and high functional flexibility.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123999147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
Interval Raus criterion for stability analysis of linear systems with dependent coefficients in the characteristic polynomial 特征多项式中有相关系数的线性系统稳定性分析的区间Raus准则
L. Kolev, S. Petrakieva
{"title":"Interval Raus criterion for stability analysis of linear systems with dependent coefficients in the characteristic polynomial","authors":"L. Kolev, S. Petrakieva","doi":"10.1109/ISSE.2004.1490392","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490392","url":null,"abstract":"This paper addresses the stability analysis of linear continuous systems under interval uncertainties. An interval generalization of the known Raus criterion is suggested to estimate the stability of the system considered. It is based on obtaining the interval extensions of the elements of the Raus matrix which are nonlinear functions of independent system parameters. The case when these elements are independent intervals is considered. The interval extensions are also determined by using modified affine arithmetic. Two sufficient conditions on stability and instability of the linear system considered are obtained. A numerical example illustrating the applicability of the method suggested is solved at the end of the paper.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117045062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Evaluation of students' knowledge in theoretical basis of optoelectronics 学生光电子学理论基础知识的评估
T. Pencheva, T. Yankova
{"title":"Evaluation of students' knowledge in theoretical basis of optoelectronics","authors":"T. Pencheva, T. Yankova","doi":"10.1109/ISSE.2004.1490452","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490452","url":null,"abstract":"The investigation deals with some important problems connected with evaluation and rating of student's knowledge using computer-aided tests which may be used both for regular education and for e-learning. Two alternative approaches for test organization are applied. Their potentialities are compared by means of tests in the 'theoretical basis of optoelectronics', with alternative arrangements. A test rating of students' knowledge is carried out using a specialized software application. The experiments are carried out with 5 control groups of students from the electrical engineering faculties of the University of Rousse. The presented results are summarised and discussed. The results may be used for optimisation and improvement of such tests. They are necessary for further development of the student's logical thinking, for their future professional realisation in the area of electronics.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131177927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Developing powerline carrier applications on embedded systems 开发嵌入式系统上的电力线载波应用
C. Gabriel, H. Horia, O. Pop
{"title":"Developing powerline carrier applications on embedded systems","authors":"C. Gabriel, H. Horia, O. Pop","doi":"10.1109/ISSE.2004.1490397","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490397","url":null,"abstract":"Powerline carrier (PLC) is a popular communication technique that uses the existing power wiring (120 V, 240 V, etc) to carry information. It is a kind of \"wireless\" means of communication, because technology can supersede the installation of dedicated wiring in some applications. Although the powerline environment is a hard environment for any communication (switch mode power supplies use high frequency components, and usually a lot of tonal noise is generated) and everything (attenuation, phase response and noise level) can change over the frequency range, the transmission can be performed with amplitude shift keying, frequency shift keying or phase shift keying (for inexpensive but limited performance devices) or based on spread spectrum with a correlator for better performance devices. The paper proposes a modem solution for integrating powerline carrier capabilities inside microcontroller embedded systems in order to increase the communication capabilities of such devices. Extending network abilities and including powerline carrier resources in embedded systems are the main benefits.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128220468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
On the highest order moment closure problem [semiconductor device modelling applications] 关于最高阶矩闭合问题[半导体器件建模应用]
R. Kosik, T. Grasser, R. Entner, K. Dragosits
{"title":"On the highest order moment closure problem [semiconductor device modelling applications]","authors":"R. Kosik, T. Grasser, R. Entner, K. Dragosits","doi":"10.1109/ISSE.2004.1490389","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490389","url":null,"abstract":"Macroscopic transport models, based on the first six moments of Boltzmann's equation are a natural extension to the drift-diffusion model (two moments) and the various energy-transport models (three or four moments). To close the system of equations, the sixth moment has to be expressed as a function of the lower order moments. We investigate the influence of the applied closure relation on the numerical properties of the six moments model, comparing three different methods, and propose a new solution to the closure problem. We present results of numerical solutions of six moments models and compare them to self-consistent Monte Carlo data.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127616981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The quality problem as a problem of Bulgarian Society 质量问题是保加利亚社会的一个问题
B. Sandalski, M. Vicheva, S. Todorov
{"title":"The quality problem as a problem of Bulgarian Society","authors":"B. Sandalski, M. Vicheva, S. Todorov","doi":"10.1109/ISSE.2004.1490863","DOIUrl":"https://doi.org/10.1109/ISSE.2004.1490863","url":null,"abstract":"The quality problem of products is fundamental for countries in a transition from a planned to market economy like Bulgaria. In the conditions of coming European integration it turns into a problem for small and middle enterprises' survival due to the lack of a complete and well functioning Bulgarian National system for normative support, assessment and proving of quality (NS-NSAPQ). The basic parameters of a project on a strategy for building the Bulgarian NS-NAPQ are considered. This strategy is developed by the Bulgarian Council for voluntary certification. The model of NS-NAPQ and the essential characteristics of its 5 subsystems, such as; standardization, certification, accreditation, market surveillance and coordination, are described. The conditions of their functioning and interaction are specified, realizing the idea for simultaneous necessity and voluntarily action in solving the quality problem by each producer.","PeriodicalId":342004,"journal":{"name":"27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115291711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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