IEEE 2011 10th International Conference on Electronic Measurement & Instruments最新文献

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Analog circuit fault diagnosis approach using optimized SVMs based on MST algorithm 基于MST算法的优化svm模拟电路故障诊断方法
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037986
Guoming Song, Shuyan Jiang, Houjun Wang, Liu Hong
{"title":"Analog circuit fault diagnosis approach using optimized SVMs based on MST algorithm","authors":"Guoming Song, Shuyan Jiang, Houjun Wang, Liu Hong","doi":"10.1109/ICEMI.2011.6037986","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037986","url":null,"abstract":"The classification accuracy and efficiency of multiclass SVMs are largely dependent on the SVM combination strategy in analog circuits fault diagnosis. An optimized SVM extension strategy is presented in this paper, which uses minimum spanning tree (MST) algorithm to simplify the SVM structure and decrease the classification errors. By taking the separability measure of fault classes as edge weight of undirected graph extracted from feature space, the tree nodes are generated by bottom-top method, which represents sub-class partition with clustering characteristic. Finally, hierarchical multiclass SVMs are constructed according to the structure of MST obtained. The MST-SVM classifier is expected to improve the diagnosis accuracy because the fault classes with larger margin are preferentially separated. The experimental results on a high-pass filter circuit prove that the MST-SVM method outperforms other conventional SVM approaches in veracity and efficiency of fault diagnosis.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126686930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A new proposal for monitoring oil-temperature and oil-level 一种监测油温和油位的新方案
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6038013
Lu Guirong, Zheng Xianshan, Chen Shuyue
{"title":"A new proposal for monitoring oil-temperature and oil-level","authors":"Lu Guirong, Zheng Xianshan, Chen Shuyue","doi":"10.1109/ICEMI.2011.6038013","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6038013","url":null,"abstract":"A novel approach for monitoring oil-temperature and oil-level in a single tank is presented. A multifunctional sensor has been developed that is suitable to determine the oil-temperature and oil-level. This proposal can realize two sensing functions, namely, resistance and capacitance sensing functions. To achieve this multi-sensing function, the designed sensor employs two coils wound on a plastic pipe. The oil-temperature and the oil-level can be estimated simultaneously, according to the relationships between oil-temperature and resistance produced by a coil connected using the two coils, oil-level and capacitance measured from two coils.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123878587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Power law noise identification using the LAG 1 autocorrelation by overlapping samples 利用重叠样本的lag1自相关进行幂律噪声识别
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037776
Zhou Chunlei, Zhang Qi, Yang Shuhua
{"title":"Power law noise identification using the LAG 1 autocorrelation by overlapping samples","authors":"Zhou Chunlei, Zhang Qi, Yang Shuhua","doi":"10.1109/ICEMI.2011.6037776","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037776","url":null,"abstract":"There are various random errors in the fiber optical gyroscope (FOG) output signal. At the aim of improving its accuracy, it is need to identify the kinds of errors. The most common method for power law noise identification is simply to observe the slope of a log-log plot of the Allan or modified Allan deviation versus averaging time, either manually or by fitting a line to it. The lag 1 autocorrelation method is a new method for power law noise identification that can determine the dominant noise type for all common noise processes, from phase or frequency data, for all averaging factors, in a consistent and analytic manner. This paper describes an improvement of it by overlapping samples, which improves the confidence of the resulting stability estimate at the expense of greater computational time.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124056082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Weighted test generator in built-in self-test design based on genetic algorithm and cellular automata 基于遗传算法和元胞自动机的内置自检设计中的加权测试生成器
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037782
Tan Enmin, Song Shengdong, Zhan Yan
{"title":"Weighted test generator in built-in self-test design based on genetic algorithm and cellular automata","authors":"Tan Enmin, Song Shengdong, Zhan Yan","doi":"10.1109/ICEMI.2011.6037782","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037782","url":null,"abstract":"Weighted pattern generation is an effective method for cutting down the test length of pseudorandom test pattern set in a built-in self-test (BIST) design. For its natural weighting structure without additional hardware overhead, cellular automata (CA) was applied as test pattern generator of BIST in this paper. Furthermore, optimizing schemes based on genetic algorithm (GA) were also adopted so as to approach the desired weight of circuit under test (CUT) more efficaciously. Preparative programs consists of encoding the rules of a CA, constructing chromosome, calculating fitness of the chromosome, and selecting an individual for performing genetic operations, etc‥ Then, the characteristic of the individual is evaluated by judging whether the obtained weight is an approximate value to the desired weight or not. Finally, an optimized rule value set was searched and therefore an actual weight set and corresponding test set are also achieved. Experimental results based on some ISCAS'85 benchmark circuits show that this weighted pattern generation structure with CA based on GA is efficient in diagnosing some difficultly-detected faults and improving fault coverage.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127745806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis of temperature adaptability for frequency control loop for silicon micromechanical gyroscope 硅微机械陀螺仪频率控制回路温度适应性分析
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6038012
Fan Yongzhen, Bing Luo, Ancheng Wang
{"title":"Analysis of temperature adaptability for frequency control loop for silicon micromechanical gyroscope","authors":"Fan Yongzhen, Bing Luo, Ancheng Wang","doi":"10.1109/ICEMI.2011.6038012","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6038012","url":null,"abstract":"It's generally agreed that using a PLL-based frequency control loop for a silicon micromechanical gyroscope the drive frequency can track the natural frequency precisely in any condition. To verify it, an analysis of its frequency tracking ability in varying temperature condition is presented. Firstly the dynamical analysis of the drive mode is presented and its phase-frequency relation is obtained. By analyzing the PLL-based frequency control loop the phase condition for frequency tracking is established. Then the simulation for the relation between the phase drift with temperature of the displacement readout circuit and the drive frequency of the gyroscope is carried out under the fixed phase condition. It shows that the frequency error will increase when the phase drift of the displacement readout circuit is increasing. Finally an experiment is carried out with a digital-analog mixed PCB based on FPGA, which is designed to simultaneously measure the drive frequency, natural frequency and phase drift of displacement readout circuit in temperature ranging from 5°C to 50°C. The results show that the phase of the displacement readout circuit drifts with temperature, and the error between natural frequency and drive frequency is proportional with the phase drift. Thus in order to keep the frequency tracking accuracy in different temperature the compensation for the phase condition must be employed.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126271957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Review on Verification and Validation technology in integrated health management system 综合健康管理系统中的验证与验证技术综述
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037780
Liu Hao, Yu Jinsong, Zhang Ping, L. Xingshan
{"title":"Review on Verification and Validation technology in integrated health management system","authors":"Liu Hao, Yu Jinsong, Zhang Ping, L. Xingshan","doi":"10.1109/ICEMI.2011.6037780","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037780","url":null,"abstract":"Verification and Validation (V&V) technology has been identified as a key step in quantifying and building confidence before integrated health management (IHM) system deployment to inform about equipment or component's health status and to support operational and maintenance decisions. However, due to generally no rigorously universal methods and no statistically adequate data available, V&V technology remains a challenging open problem. The recent developments appeared in academic journals, conference proceedings and technical reports for V&V technology in IHM field are systematically reviewed in this paper, focusing on V&V definitions and standards, V&V metrics, and V&V methods as well as the future development trends and challenges of V&V technology.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126510714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Automatic cloud and cloud shadow removal method for landsat TM images 陆地卫星TM图像的云和云影自动去除方法
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037860
Gui Zhengke, Chen Fu, Yang Jin, Liu Xinpeng, Liao FangJun, Zhao Jing
{"title":"Automatic cloud and cloud shadow removal method for landsat TM images","authors":"Gui Zhengke, Chen Fu, Yang Jin, Liu Xinpeng, Liao FangJun, Zhao Jing","doi":"10.1109/ICEMI.2011.6037860","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037860","url":null,"abstract":"Optical Remote Sensing Images are often interfered by clouds and their shadows. In this research, a scheme is proposed to automatically detect and remove clouds and their shadows by integrating complementary information from multitemporal images to generate the cloud-free composite images. Firstly, image classification is used to separate cloud regions and shadows regions of input images, and shadow regions can be revised by watershed detection method based on NDVI. Secondly, vegetation phenology characteristics of base image are applied to that of reference images where the complementary information is extracted from. Thirdly, fusion method based on multi-resolution pyramid is adopted for smoothing the mosaic artifacts. Finally, evaluation of pixels reliability is proposed to distinguish various sources of the composite image.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"136 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131951231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A design method for automatic calibration system based on dynamic loading and dynamic scheduling 一种基于动态加载和动态调度的自动标定系统设计方法
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037789
Fang Hong, Bian Xin, Zhou Xin, Liu Ke, Zhao Haining
{"title":"A design method for automatic calibration system based on dynamic loading and dynamic scheduling","authors":"Fang Hong, Bian Xin, Zhou Xin, Liu Ke, Zhao Haining","doi":"10.1109/ICEMI.2011.6037789","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037789","url":null,"abstract":"For efficient calibration of electronic instruments, we need to improve the general accepted approaches by introducing an automatic system with a properly defined calibration procedure, thus freeing people from tedious, time consuming calibration process. This paper present a design method for automatic calibration system based on dynamic loading testing subroutines and dynamic scheduling hardware. Dynamic loading technology is seriously depending on uniform interface definition, and which can make the system more open and easier to maintenance and update. Dynamic scheduling technology can improve the calibration efficiency greatly in the case of more than one device under test (DUTs). In the last of paper, a system developed for some type of RF instruments is shown as a development example.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129978303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sine wave algorithm based on 2nd offset and its implementation in FPGA 基于二次偏置的正弦波算法及其FPGA实现
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037881
Xie Bao-zhong, Chen Tiequn
{"title":"Sine wave algorithm based on 2nd offset and its implementation in FPGA","authors":"Xie Bao-zhong, Chen Tiequn","doi":"10.1109/ICEMI.2011.6037881","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037881","url":null,"abstract":"Sine function is widely used in many modern application fields. Many schemes were proposed to generate sine wave. Among the methods Look-Up Table is the simplest and fastest one. Many efforts have been carried out to reduce the memory size of the LUT. In this paper comparison among offsets of 1st, 2nd, 3rd and 4th is executed to search the best one. A Direct Digital Frequency Synthesizer (DDFS) was designed to verify the proposed 2nd offset sine algorithm using Field Programmable Gates Array (FPGA), Digital to Analog Converter and low pass filter. The experiment demonstrates that 2nd offset sine algorithm can reduce the memory size greatly.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126594429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study on electrode potential of capacitance proximity fuze 电容式接近引信电极电位的研究
IEEE 2011 10th International Conference on Electronic Measurement & Instruments Pub Date : 2011-10-10 DOI: 10.1109/ICEMI.2011.6037726
Z. Xin, Zhanzhong Cui, Lixin Xu
{"title":"Study on electrode potential of capacitance proximity fuze","authors":"Z. Xin, Zhanzhong Cui, Lixin Xu","doi":"10.1109/ICEMI.2011.6037726","DOIUrl":"https://doi.org/10.1109/ICEMI.2011.6037726","url":null,"abstract":"Detection mechanism of capacitance proximity fuze is the base of fuze design work. Electric field and circuit methods are used to calculate the potential proportional relationship between the two electrodes. The potential of electrode I is obtained through experiment. Thus we can get the potential of electrode II. Pispce software is used to simulate the whole circuit, and get the simulation result of potential of electrode II. The experiment comes to the conclusions as following: the potential of electrode II decreases when fuze gets close to the target; and the potential proportional relationship between the two electrodes based on the two methods are nearly same; potential of electrode II based on theory and experiment fits the result of simulation.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130769085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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