18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)最新文献

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Applications of C-AFM analysis techniques at advanced IC on ATPG/Scan failure C-AFM分析技术在高级集成电路上对ATPG/Scan故障的应用

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 1900-01-01 DOI: 10.1109/ipfa.2011.5992735

C. H. Chong, W. Hoe, R. Lin, Hong Bo Zhang

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引用次数: 2

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