2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena最新文献_第4页

Heat sink effects in thermal stability tests of ZnO arresters ZnO避雷器热稳定性试验中的热沉效应

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254895

Z. Zheng, S. A. Boggs

引用次数: 2

Endurance behavior of the SF/sub 6//N/sub 2/ mixtures experiment under AC and impulse voltages SF/sub - 6//N/sub - 2/混合材料在交流电压和冲击电压下的耐久性能

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254921

D. Zheng, C.T. Chen, H.W. Liu, J. Yang

引用次数: 1

Activation energies and electron transport in LDPE LDPE中的活化能和电子输运

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254786

K. Bambery, R. Fleming

引用次数: 10

Instability analysis of the charged liquid interface 带电液界面的不稳定性分析

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254830

Chuntian Chen, Ying Zhang, Z. Luan, Jing Li

引用次数: 0

A Raman spectroscopic study of bulk and surface ageing phenomena in polyethylene 聚乙烯体老化和表面老化现象的拉曼光谱研究

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254815

X.S. Liu, A. Vaughan, G. Chen

引用次数: 7

Effects of electrical pulses on the dielectric properties of biological cells 电脉冲对生物细胞介电特性的影响

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254792

A. Garner, J. Yang, N. Chen, J. Kolb, K. Loftin, R. J. Swanson, S. Beebe, R. Joshi, K. Schoenbach

{"title":"Effects of electrical pulses on the dielectric properties of biological cells","authors":"A. Garner, J. Yang, N. Chen, J. Kolb, K. Loftin, R. J. Swanson, S. Beebe, R. Joshi, K. Schoenbach","doi":"10.1109/CEIDP.2003.1254792","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254792","url":null,"abstract":"Despite a basic knowledge of cells' biochemical processes, their electrical properties, particularly the changes in membrane properties upon the application of pulsed electric fields (PEF's), have not yet been fully characterized. Microsecond pulses above a certain threshold cause electroporation of the cell membrane while nanosecond pulses of higher voltage additionally porate the inner organelles. We used Time Domain Dielectric Spectroscopy to measure the conductivity of HL-60 (human leukemia) cell suspensions as a function of time after 10 ns, 78.5 kV/cm pulses and 50 /spl mu/s, 1.1 kV/cm pulses, which have the same energy. The conductivity increased immediately after the 50 /spl mu/s pulse, indicating that ion channels in the HL-60 membranes initially opened. However, the conductivity decreased immediately after the ultrashort pulse, indicating that ion channels initially closed. The conductivity decreases significantly approximately 40 minutes after both pulses. This suggests that not only do the pores or channels opened close, but pores or channels open in the membrane prior to the pulse may close as well. These measurements were an intermediate step in determining the electrical properties of HL-60 cells using a two-shell model. Once determined, these electrical parameters will be used in electroporation models developed at Old Dominion University.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"382 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129137103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Detection of temporary faults during impulse tests using wavelets 用小波检测脉冲试验中的临时故障

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254896

S.N. Fernando, M. Raghuveer, W. Ziomek

引用次数: 4

Charge transport in weakly conducting liquids; wire-plane configuration 弱导电液体中的电荷输运;wire-plane配置

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254945

K. Adamiak

引用次数: 1

Leakage current analysis and electric field calculation in salt fog ageing test on polymer insulation material 聚合物绝缘材料盐雾老化试验泄漏电流分析及电场计算

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254802

Y. Zhu, S. Yamashita, N. Anami, M. Otsubo, C. Honda, S. Hashimoto, Y. Hashimot

引用次数: 8

Development of model specimen for evaluating insulation properties and partial discharge phenomena of polymeric solid-solid internal interface 聚合物固-固内部界面绝缘性能及局部放电现象模型试样的研制

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2003-10-19 DOI: 10.1109/CEIDP.2003.1254934

M. Nagao, N. Hozumi, K. Kawakami, K. Nagahama, T. Iwasaki, Y. Muramoto, T. Tanaka

{"title":"Development of model specimen for evaluating insulation properties and partial discharge phenomena of polymeric solid-solid internal interface","authors":"M. Nagao, N. Hozumi, K. Kawakami, K. Nagahama, T. Iwasaki, Y. Muramoto, T. Tanaka","doi":"10.1109/CEIDP.2003.1254934","DOIUrl":"https://doi.org/10.1109/CEIDP.2003.1254934","url":null,"abstract":"We have been developing a standard specimen to evaluate electrical insulation properties at polymeric solid-solid internal interface, especially modeling the interface in EHV extruded cable splices. The degradation at polymeric solid internal interface in cable splices is considered to be initiated by the partial discharge (PD) phenomena. This paper describes the partial discharge (PD) behavior of the developed specimen when a tungsten fine wire is introduced at the interface as a conductive foreign substance. Under the voltage application the maximum PD magnitude (Qmax) and PD number (n) decreased with time and PD tended to disappear. This phenomenon is not a swarming pulsive microdischarge one, since the PD inception voltage (Vi) increased with the voltage application time. When voltage application is stopped for a long time, Vi decreased to the initial value and the values of both Qmax and n recovered. The recovery of PD characteristic became faster when the pause of voltage application became shorter. The surface resistance between two tungsten wires installed at the interface decreased after suffering the PD and then recovered with the pause of voltage application with similar time variation of PD characteristic. These PD behaviors are to be related to the electric field relaxation at the tungsten wire tip.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114008662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1