带电液界面的不稳定性分析

Chuntian Chen, Ying Zhang, Z. Luan, Jing Li
{"title":"带电液界面的不稳定性分析","authors":"Chuntian Chen, Ying Zhang, Z. Luan, Jing Li","doi":"10.1109/CEIDP.2003.1254830","DOIUrl":null,"url":null,"abstract":"Employed non-dimensional analysis of the differential equation for the charged liquid interfacial wave, rationality and instability of the interface between two layers of immiscible fluids were investigated under the gravitational field. The results show that Huygens-Fresnel instability and Rayleigh-Taylor instability decrease, and the attenuation rate of the aperiodic fluctuation ratio increases with the increase in the viscosity ratio and the density ratio of the fluids. Furthermore, it is discussed that the interface endures the electric stress when existed electric field.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Instability analysis of the charged liquid interface\",\"authors\":\"Chuntian Chen, Ying Zhang, Z. Luan, Jing Li\",\"doi\":\"10.1109/CEIDP.2003.1254830\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Employed non-dimensional analysis of the differential equation for the charged liquid interfacial wave, rationality and instability of the interface between two layers of immiscible fluids were investigated under the gravitational field. The results show that Huygens-Fresnel instability and Rayleigh-Taylor instability decrease, and the attenuation rate of the aperiodic fluctuation ratio increases with the increase in the viscosity ratio and the density ratio of the fluids. Furthermore, it is discussed that the interface endures the electric stress when existed electric field.\",\"PeriodicalId\":306575,\"journal\":{\"name\":\"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2003.1254830\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2003.1254830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

通过对带电液体界面波微分方程的无因次分析,研究了引力场作用下两层非混相流体界面的合理性和不稳定性。结果表明:随着流体粘度比和密度比的增大,惠更斯-菲涅耳不稳定性和瑞利-泰勒不稳定性减小,非周期波动比的衰减速率增大;进一步讨论了在存在电场的情况下,界面所承受的电应力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Instability analysis of the charged liquid interface
Employed non-dimensional analysis of the differential equation for the charged liquid interfacial wave, rationality and instability of the interface between two layers of immiscible fluids were investigated under the gravitational field. The results show that Huygens-Fresnel instability and Rayleigh-Taylor instability decrease, and the attenuation rate of the aperiodic fluctuation ratio increases with the increase in the viscosity ratio and the density ratio of the fluids. Furthermore, it is discussed that the interface endures the electric stress when existed electric field.
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