{"title":"Instability analysis of the charged liquid interface","authors":"Chuntian Chen, Ying Zhang, Z. Luan, Jing Li","doi":"10.1109/CEIDP.2003.1254830","DOIUrl":null,"url":null,"abstract":"Employed non-dimensional analysis of the differential equation for the charged liquid interfacial wave, rationality and instability of the interface between two layers of immiscible fluids were investigated under the gravitational field. The results show that Huygens-Fresnel instability and Rayleigh-Taylor instability decrease, and the attenuation rate of the aperiodic fluctuation ratio increases with the increase in the viscosity ratio and the density ratio of the fluids. Furthermore, it is discussed that the interface endures the electric stress when existed electric field.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2003.1254830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Employed non-dimensional analysis of the differential equation for the charged liquid interfacial wave, rationality and instability of the interface between two layers of immiscible fluids were investigated under the gravitational field. The results show that Huygens-Fresnel instability and Rayleigh-Taylor instability decrease, and the attenuation rate of the aperiodic fluctuation ratio increases with the increase in the viscosity ratio and the density ratio of the fluids. Furthermore, it is discussed that the interface endures the electric stress when existed electric field.